High resolution time-of-flight mass spectrometer

Patent metadata

Field	Value
Publication number	US-9478404-B2
Application number	US-201214369912-A
Country	US
Kind code	B2
Filing date	Dec 4, 2012
Priority date	Dec 30, 2011
Publication date	Oct 25, 2016
Grant date	Oct 25, 2016

Abstract

Mass spectrometers and related methods of making and using the same are disclosed herein that generally involve positioning a blocking or masking element in the path of an ion beam passing through the mass spectrometer so as to selectively block at least a portion of the ions in the ion beam from entering an accelerator. Mass spectrometers and related methods are also disclosed in which an ion beam passing through the mass spectrometer is deflected or otherwise aimed so as to approach a TOF axis of an accelerator at a non-zero angle.

First claim

The invention claimed is:

1. A mass spectrometer, comprising:
an accelerator having an inlet aperture through which an ion beam can be directed; and
a masking element disposed upstream from the accelerator and configured to selectively block at least one of a central portion of the ion beam to block ions that share location but have different velocity independent of time wherein the blocking occurs without a pause and only one edge of the ion beam to block ions close to the accelerator exit, to improve peak shape, from entering the accelerator.

2. The mass spectrometer of claim 1 , wherein the masking element is disposed within the inlet aperture of the accelerator.

3. The mass spectrometer of claim 1 , wherein the masking element is disposed within beam-shaping optics disposed upstream from the accelerator.

4. The mass spectrometer of claim 1 , wherein the portion of the ion beam comprises a portion of the ion beam located closest to an exit of said accelerator.

5. The mass spectrometer of claim 1 , wherein the masking element comprises a wire electrode.

6. A method of directing an ion beam through a mass spectrometer, comprising:
directing the ion beam through a masking element disposed upstream of an accelerator, so as to selectively block at least one of a central portion of the ion beam to block ions that share location but have different velocity independent of time wherein the blocking occurs without a pause and only one edge of the ion beam to block ions close to the accelerator exit, to improve peak shape, from entering the accelerator.

7. The method of claim 6 , wherein the portion of the beam is only one edge of the ion beam and said only one edge is blocked by an edge of an entrance slit of the accelerator.

Assignees

• Dh Technologies Dev Pte Ltd

Inventors

• Thomson Bruce
• Haufler Robert E

Classifications

• H01J49/0031

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

• H01J49/067 Primary

  Ion lenses, apertures, skimmers · CPC title

• H01J49/401 Primary

  characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode · CPC title

• H01J49/40

  Time-of-flight spectrometers (H01J49/36 takes precedence) · CPC title