Capacitor and method for manufacturing same
US-2024347278-A1 · Oct 17, 2024 · US
US9478358B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9478358-B2 |
| Application number | US-201514732849-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 8, 2015 |
| Priority date | Jun 12, 2014 |
| Publication date | Oct 25, 2016 |
| Grant date | Oct 25, 2016 |
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A multilayer ceramic capacitor that includes dielectric layers made mainly of a perovskite compound containing Ba and Ti and optionally Zr and Hf, and inner electrodes having an average thickness of approximately 0.5 μm or less. The Mg content of the dielectric layers is approximately in the range of 0≦Mg≦0.4 (parts by mole) based on a total of 100 parts by mole of Ti, Zr, and Hf. The proportion of Mg-containing defects in the inner electrodes is approximately 20% or more.
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What is claimed is: 1. A multilayer ceramic capacitor comprising: a plurality of dielectric layers containing a perovskite compound containing Ba and Ti; and a plurality of inner electrodes containing Ni as an electroconductive material and a common material, each inner electrode of the plurality of inner electrodes being located in a respective interface between adjacent dielectric layers of the plurality of dielectric layers, wherein an average thickness of the inner electrodes is 0.5 μm or less, a first Mg content of the dielectric layers is in a range of 0 parts by mole≦Mg≦0.4 parts by mole based on a total of 100 parts by mole of Ti in the dielectric layers, a second Mg content in the common material of the inner electrodes is in a range of 1 to 5 parts by mole based on a total of 100 parts by mole of Ti in the inner electrodes, and Mg is present in defects defined by regions where an inner electrode is discontinuous, a proportion thereof is expressed as follows: the number of the defects in which the Mg is present/the total number of the defects×100%≧approximately 20%. 2. The multilayer ceramic capacitor according to claim 1 , wherein the perovskite compound further contains Zr and Hf, and the Mg content of the dielectric layers is in a range of 0 parts by mole≦Mg≦0.4 parts by mole based on a total of 100 parts by mole of Ti, Zr, and Hf. 3. The multilayer ceramic capacitor according to claim 1 , wherein adjacent inner electrodes respectively extend to opposite end faces of the multilayer ceramic capacitor. 4. The multilayer ceramic capacitor according to claim 3 , further comprising an outer electrode on each end face of the multilayer ceramic capacitor and coupled to the inner electrodes extended thereto. 5. The multilayer ceramic capacitor according to claim 1 , wherein the Ti content of the common material is 3 parts by mole to 100 parts by mole of Ni in the inner electrodes.
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