Photoresist composition, compound, and production method thereof

US9477149B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9477149-B2
Application numberUS-201414491286-A
CountryUS
Kind codeB2
Filing dateSep 19, 2014
Priority dateMar 19, 2012
Publication dateOct 25, 2016
Grant dateOct 25, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A photoresist composition containing (A) a polymer having a structural unit (I) that includes an acid-labile group, and (I) a compound represented by the following formula (1). In the following formula (1), R 1 , R 2 , R 3 and R represent a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms. X represents a single bond, an oxygen atom or —NR a —. R a represents a hydrogen atom, a hydroxy group or a monovalent organic group having 1 to 20 carbon atoms, and optionally taken together represents a ring structure by binding with R each other. A − represents —SO 3 − or —CO 2 − . M + represents a monovalent onium cation.

First claim

Opening claim text (preview).

The invention claimed is: 1. A photoresist composition comprising: a polymer comprising a first structural unit that comprises an acid-labile group; and a first compound represented by formula (2): wherein, in the formula (2) represents a hydrogen atom, a hydroxy group or a monovalent organic group having 1 to 20 carbon atoms; A − represents —SO 3 − or —CO 2 − ; M + represents a monovalent onium cation; and n is an interger of 0 to 5. 2. The photoresist composition according to claim 1 , comprising an acid diffusion control agent, which comprises the first compound. 3. The photoresist composition according to claim 2 , wherein the acid-labile group in the first structural unit is polar, or the polymer further comprises a second structural unit represented by formula (3): wherein, in the formula (3), R 4 represents a hydrogen atom, a fluorine atom, a methyl group or a trifluoromethyl group; L represents a single bond, —CO—O— or —CO—NH—; and R 5 represents an acid-nonlabile group comprising a polar group. 4. The photoresist composition according to claim 2 , further comprising an acid generating agent, which differs from the first compound. 5. The photoresist composition according to claim 1 , comprising an acid generating agent, which comprises the first compound. 6. The photoresist composition according to claim 5 , further comprising an acid diffusion control agent, which differs from the first compound. 7. The photoresist composition according to claim 1 , wherein R a represents a monovalent alkyl group having 1 to 20 carbon atoms. 8. The photoresist composition according to claim 1 , wherein R a represents a monovalent alicyclic hydrocarbon group having 3 to 20 carbon atoms. 9. The photoresist composition according to claim 1 , wherein R a represents a monovalent aromatic hydrocarbon group having 6 to 20 carbon atoms. 10. The photoresist composition according to claim 1 , wherein M + represents a sulfonium cation represented by formula (M′) or an iodonium cation represented by formula (M″): wherein R d1 to R d5 each independently represent a hydrogen atom, an alkyl group, an alkoxy group, a hydroxyl group or halogen atom. 11. A compound represented by a formula (2): wherein, in the formula (2) represents a hydrogen atom, a hydroxy group or a monovalent organic group having 1 to 20 carbon atoms; A − represents —SO 3 − or —CO 2 − ; M + represents a monovalent onium cation; and n is an interger of 0 to 5. 12. The compound according to claim 11 , which is for use as an acid diffusion control agent or an acid generating agent. 13. The compound according to claim 11 , wherein R a represents a monovalent alkyl group having 1 to 20 carbon atoms. 14. The compound according to claim 11 , wherein R a represents a monovalent alicyclic hydrocarbon group having 3 to 20 carbon atoms. 15. The compound according to claim 11 , wherein R a represents a monovalent aromatic hydrocarbon group having 6 to 20 carbon atoms. 16. The compound according to claim 11 , wherein M + represents a sulfonium cation represented by formula (M′) or an iodonium cation represented by formula (M″): wherein R d1 to R d5 each independently represent a hydrogen atom, an alkyl group, an alkoxy group, a hydroxy group or a halogen atom. 17. A method for producing a compound represented by formula (6) comprising: allowing a compound represented by formula (4) to react with NaHSO 3 ; and allowing the resulting compound to react with a compound represented by formula (5): wherein, in the formulae (4) and (6), R 1 , R 2 , R 3 and R each independently represent a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms, wherein two of R 1 , R 2 , R 3 and R optionally taken together represent a ring structure by binding with each other; and X represents a single bond, an oxygen atom or —NR a —, wherein R a represents a hydrogen atom, a hydroxy group or a monovalent organic group having 1 to 20 carbon atoms, and optionally taken together represents a ring structure by binding with R each other: in the formulae (5) and (6), M + represents a monovalent onium cation: and in the formula (5), E − represents a monovalent anion.

Assignees

Inventors

Classifications

  • Benzo[b]pyrans, hydrogenated in the carbocyclic ring · CPC title

  • not condensed with other rings · CPC title

  • Spiro-condensed systems · CPC title

  • having a hydrogen atom as the second substituent in position 4 · CPC title

  • the ring being unsaturated · CPC title

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Frequently asked questions

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What does patent US9477149B2 cover?
A photoresist composition containing (A) a polymer having a structural unit (I) that includes an acid-labile group, and (I) a compound represented by the following formula (1). In the following formula (1), R 1 , R 2 , R 3 and R represent a hydrogen atom or a monovalent organic group having 1 to 20 carbon atoms. X represents a single bond, an oxygen atom or —NR a —. R a represents a hydrogen …
Who is the assignee on this patent?
Jsr Corp
What technology area does this patent fall under?
Primary CPC classification G03F7/0045. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 25 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).