Electrical test platform with organized electrical wiring
US-9222960-B2 · Dec 29, 2015 · US
US9470735B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9470735-B2 |
| Application number | US-201414301509-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 11, 2014 |
| Priority date | Jun 14, 2013 |
| Publication date | Oct 18, 2016 |
| Grant date | Oct 18, 2016 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A noise signal for a malfunction test is inputted to a ground terminal, and a frequency property of the magnitude of the power at which a designated electric circuit causes a malfunction is found. A detection reference ground of a detection part for detecting malfunctions of the designated electric circuit is connected at high impedance to a ground of the targeted circuit. Differential input parts are provided to the detection part, a to-be-detected part of the designated electric circuit is connected to one differential input part, and the ground of the targeted circuit is connected to the other differential input part. A ground of a noise source is isolated from a ground of a power source circuit for supplying a power source to the designated electric circuit. The ground of the noise source is galvanically isolated from the ground of the designated electric circuit.
Opening claim text (preview).
The invention claimed is: 1. An electric circuit evaluation method comprising the following step: a step of inputting a noise signal for a malfunction test to a ground terminal of a designated electric circuit and finding a frequency property of the magnitude of the power at which the designated electric circuit causes a malfunction; wherein a detection reference ground of a detection part for detecting whether or not the designated electric circuit causes a malfunction is connected at high impedance to a ground of the designated electric circuit. 2. The electric circuit evaluation method of claim 1 ; the ground of the detection part and the ground of the targeted circuit being connected via a resistor. 3. The electric circuit evaluation method of claim 1 ; the ground of the detection part and the ground of the targeted circuit being connected via a coil. 4. The electric circuit evaluation method of claim 1 ; the ground of the detection part and the ground of the targeted circuit being connected via a ferrite bead. 5. The electric circuit evaluation method of claim 1 ; the evaluation method for inputting the noise signal for a malfunction test to the designated electric circuit and finding the frequency property of the magnitude of the power at which the designated electric circuit causes a malfunction being compliant with DPI testing. 6. The electric circuit evaluation method of claim 1 ; a ground of a noise source for inputting the noise signal for a malfunction test to the designated electric circuit being isolated from a ground of a power source circuit for supplying a power source to the designated electric circuit. 7. The electric circuit evaluation method of claim 1 ; a ground of a noise source for inputting the noise signal for a malfunction test to the designated electric circuit being galvanically isolated from a ground of the designated electric circuit. 8. An electric circuit provided together with data pertaining to the frequency property obtained by the evaluation method of claim 1 . 9. An electric circuit evaluation method comprising the following step: a step of inputting a noise signal for a malfunction test to a ground terminal of a designated electric circuit and finding a frequency property of the magnitude of the power at which the designated electric circuit causes a malfunction; wherein a ground of a noise source for inputting the noise signal for a malfunction test to the designated electric circuit is galvanically isolated from a ground of the designated electric circuit. 10. An electric circuit evaluation method comprising the following step: a step of inputting a noise signal for a malfunction test to a ground terminal of a designated electric circuit and finding a frequency property of the magnitude of the power at which the designated electric circuit causes a malfunction; wherein a detection part for detecting whether or not the designated electric circuit causes a malfunction has differential input parts, a to-be-detected part of the designated electric circuit is connected to one differential input, and a ground of the targeted circuit is connected to the other differential input. 11. An electric circuit evaluation method comprising the following step: a step of inputting a noise signal for a malfunction test to a ground terminal of a designated electric circuit and finding a frequency property of the magnitude of the power at which the designated electric circuit causes a malfunction; wherein a ground of a noise source for inputting the noise signal for a malfunction test to the designated electric circuit is isolated from a ground of a power source circuit for supplying a power source to the designated electric circuit.
using signal generators, power supplies or circuit analysers (G01R31/2879 takes precedence; multimeters G01R15/12, network analysers G01R27/28) · CPC title
where the device under test is an electronic circuit · CPC title
for measuring frequency response characteristics, e.g. cut-off frequency thereof · CPC title
Bare printed circuit boards · CPC title
Testing of electronic circuits specially adapted for particular applications not provided for elsewhere (G01R31/2801 and G01R31/2851 take precedence) · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.