Method for predictively controlling the operation of an electronic component, electronic equipment and control device

Patent metadata

Field	Value
Publication number	US-9470734-B2
Application number	US-201213358138-A
Country	US
Kind code	B2
Filing date	Jan 25, 2012
Priority date	Jan 26, 2011
Publication date	Oct 18, 2016
Grant date	Oct 18, 2016

Abstract

According to this method, an electromagnetic spectrum emitted by the electronic component during operation is measured and the measured electromagnetic spectrum is compared with a predetermined template defining at least one safe operating range in order to detect possible malfunction or risk of malfunction of the electronic component.

First claim

The invention claimed is:

1. A method for predictively controlling the operation of an electronic circuit, the method comprising:
repeatedly measuring, by at least one antenna, an electromagnetic spectrum emitted by each of a plurality of electronic components of the electronic circuit during operation of the electronic circuit; and
comparing, by at least one processing unit, the measured electromagnetic spectra with at least one predetermined template defining at least one safe operating range in order to predict possible malfunction or risk of malfunction of the electronic components or fast aging of the electronic components,
wherein at least one of the electronic components is configured to perform logical operations,
wherein the electronic components are positioned on a support of the electronic circuit, and
wherein the at least one antenna is integrated into the support.

2. The method according to claim 1 , wherein the operation of the electronic components is controlled from the amplitude and/or from the frequency of the electromagnetic spectra of the electronic components.

3. The method according to claim 1 , wherein the operation of the electronic components is controlled upon manufacturing completion.

4. The method according to claim 1 , wherein the operation of the electronic components is controlled during operation, in a planned and/or sporadic way.

5. The method according to claim 1 , wherein the predetermined template associated with at least one of the electronic components is determined from measurements of the electromagnetic spectra emitted by a set of electronic components of the same type during accelerated ageing tests.

6. The method of claim 1 , wherein the predetermined template varies as a function of the age of the electronic circuit.

7. The method of claim 1 , wherein the predetermined template comprises at least one limit defining the safe operating range and wherein the limit varies as a function of the age of the electronic circuit.

8. The method of claim 1 , wherein the electronic component is an on-board electrical component of a vehicle.

9. The method according to claim 1 , wherein the electronic components comprise at least one of: an Application-Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA), a microprocessor, a volatile memory, and a read-only memory (ROM).

10. A piece of electronic equipment comprising:
a support;
a plurality of electronic components positioned on the support, each of the electronic components is configured to emit an electromagnetic spectrum during operation of the piece of electronic equipment;
a control device comprising at least one antenna positioned on the support so as to repeatedly measure the electromagnetic spectra emitted by the electronic components during the operation of the piece of electronic equipment; and
at least one processing unit configured to compare the measured electromagnetic spectra with at least one predetermined template defining at least one safe operating range in order to predict possible malfunction or risk of malfunction of the electronic components,
wherein at least one of the electronic components is configured to perform logical operations, and
wherein the at least one antenna is integrated into the support.

11. The piece of electronic equipment according to claim 10 , wherein each antenna is integrated into the thickness of the support.

12. The piece of electronic equipment according to claim 11 , wherein the processing unit is positioned on the support.

13. The piece of electronic equipment according to claim 10 , wherein the processing unit is positioned on the support.

14. The piece of electronic equipment of claim 10 , further comprising an electronic card including the support, wherein the support comprises a supporting board, and wherein the at least one sensor is mounted: i) on the support board, or ii) within the thickness of the support board.

15. The piece of electronic equipment according to claim 10 , wherein the electronic components comprise at least one of: an Application-Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA), a microprocessor, a volatile memory, and a read-only memory (ROM).

16. A device for controlling the operation of a piece of electronic equipment, comprising:
at least one antenna configured to measure electromagnetic spectra emitted by a plurality of electronic components during the operation of the piece of electronic equipment integrating the electronic components; and
at least one processing unit configured to compare the measured electromagnetic spectra with a predetermined template defining at least one safe operating range according to the method of claim 1 in order to predict possible malfunction or risk of malfunction of the electronic component.

17. A system for controlling the operation of a piece of electronic equipment, comprising:
means for controlling the logical operation of the piece of electronic equipment allowing measurement of the electric signals at the input and/or at the output of electronic components of the piece of electronic equipment; and
a control device according to claim 16 allowing measurement of the electromagnetic spectrum emitted by the electronic components.

Assignees

• Regis Didier
• Gatti Marc
• Jugie Damien
• Thomas Sebastien
• Thales Sa

Inventors

• Regis Didier
• Gatti Marc
• Jugie Damien
• Thomas Sebastien

Classifications

• G01R31/002 Primary

  where the device under test is an electronic circuit · CPC title

• G01R31/2817

  Environmental-, stress-, or burn-in tests (of IC's G01R31/2855; of individual semiconductors G01R31/2642; of other circuits G01R31/2849) · CPC title

• G01R29/0892

  Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value · CPC title

• G01R29/0814

  Field measurements related to measuring influence on or from apparatus, components or humans (EMC, EMI and similar testing in general G01R31/001), e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning · CPC title