System and method for suppression of even-order photodiode distortions
US-9172471-B2 · Oct 27, 2015 · US
US9467223B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9467223-B2 |
| Application number | US-201514861757-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 22, 2015 |
| Priority date | Sep 23, 2014 |
| Publication date | Oct 11, 2016 |
| Grant date | Oct 11, 2016 |
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A system for measuring an RF input signal frequency includes a sampling optical pulse train with a frequency-dithered repetition-rate, and a sub-sampled analog link coupled to the optical pulse train whereby the RF input signal frequency is determined. This frequency dither imparts well-characterized modulation sidebands onto the input RF signal to be measured. By measuring the amplitude of these sidebands relative to the incoming aliased signal amplitude the frequency of the original signal is readily determined. The use of optical sampling dramatically increases the bandwidth over which the disambiguation technique is applied, and coarse disambiguation is achieved in a single acquisition.
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What is claimed as new and desired to be protected by Letters Patent of the United States is: 1. A system for measuring an RF input signal frequency, comprising: a sampling optical pulse train with a frequency-dithered repetition-rate; and a sub-sampled analog link coupled to the optical pulse train whereby the RF input signal frequency is determined, wherein the RF input signal frequency is determined by applying thereto the frequency-dithered repetition-rate and then measuring an amplitude of modulation sidebands relative to the RF input signal's aliased signal amplitude, wherein an alias band of the RF input signal is directly determined by measuring a sidelobe-to-peak ratio (SPR) and comparing with that computed from equation SPR sig = SPR comb = SPR = ( n 2 κ V j f j ) 2 where n is the index of the alias band, k is the FM sensitivity (kHz/V) of a synthesizer driving a comb source, V j is the amplitude of the FM control voltage, and ω j /2π=f j is the FM frequency. 2. A method for measuring an RF signal input frequency, comprising: optically sampling the RF signal; applying thereto a frequency-dithered repetition-rate; and measuring an amplitude of modulation sidebands relative to the RF input signal's aliased signal amplitude whereby the RF input signal frequency is determined, wherein the RF input signal frequency is determined by measuring the amplitude of modulation sidebands relative to the RF input signal's aliased signal amplitude, wherein an alias band of the RF input signal is directly determined by measuring a sidelobe-to-peak ratio (SPR) and comparing with that computed from equation SPR sig = SPR comb = SPR = ( n 2 kVj fj ) 2 where n is the index of the alias band, k is the FM sensitivity (kHz/V) of a synthesizer driving a comb source, V j is the amplitude of the FM control voltage, and ω j /2π=f j is the FM frequency. 3. The method of claim 2 wherein the optical sampling is conducted via a Mach-Zehnder intensity modulator and the RF signal is recovered by direct detection of the modulated optical pulse train with a photodiode. 4. The method of 2 , wherein the optical sampling is performed from a source selected from the group consisting of an optical comb, a tunable-rate actively-modelocked laser, and a mode-locked laser with a known timing jitter. 5. The method of claim 2 , wherein the phase-dither is a waveform selected from the group consisting of a simple sinusoidal phase-modulation, a chirped waveform, and a phase-encoded digital waveform.
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