Annealing for damage free laser processing for high efficiency solar cells
US-9214585-B2 · Dec 15, 2015 · US
US9466754B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9466754-B2 |
| Application number | US-201414447526-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 30, 2014 |
| Priority date | Jul 30, 2014 |
| Publication date | Oct 11, 2016 |
| Grant date | Oct 11, 2016 |
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A solar cell can include a silicon layer formed over a silicon substrate. The silicon layer can have a P-type doped region and an N-type doped region. Portions of the silicon layer can have a grain size larger than other portions of the silicon layer. For example, larger grains of the silicon layer formed within a depletion region between P-type and N-type doped regions can minimize recombination loss at the P-type and N-type doped region boundaries and improve solar cell efficiency.
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What is claimed is: 1. A method of fabricating a solar cell, the method comprising: forming upper regions, angled regions and lower regions of a silicon substrate, wherein the upper regions and the lower regions are substantially coplanar; forming a silicon layer over the silicon substrate; applying a laser to the silicon layer resulting in portions of the silicon layer over the upper regions and lower regions having a larger grain size than other portions of the silicon layer over angled regions of the silicon substrate; and driving dopants into the silicon layer resulting in P-type doped regions and N-type doped regions, the P-type doped regions and N-type doped regions abutting in a contiguous portion of the silicon layer. 2. The method of claim 1 , wherein forming upper regions, angled regions and lower regions comprises performing an etching process on the silicon substrate. 3. The method of claim 2 , wherein performing the etching process comprises etching with potassium hydroxide (KOH). 4. The method of claim 1 , further comprising forming a dielectric region between the silicon layer and the silicon substrate. 5. The method of claim 1 , wherein applying a laser comprises applying a pulsed laser or a continuous wave laser. 6. The method of claim 1 , wherein applying a laser comprises melting portions of the silicon layer. 7. The method of claim 1 , wherein applying a laser comprises applying a laser with a top-hat profile on the on the silicon layer. 8. The method of claim 1 , wherein forming a silicon layer comprises forming an amorphous silicon layer or a polysilicon layer. 9. A method of fabricating a solar cell, the method comprising: forming upper regions, angled regions and lower regions of a silicon substrate, wherein the upper regions and the lower regions are substantially coplanar; forming a silicon layer over the silicon substrate; and applying a laser to the silicon layer resulting in P-type doped regions and N-type doped regions and portions of the silicon layer over the upper regions and lower regions having a larger grain size than other portions of the silicon layer over angled regions of the silicon substrate, the larger grain size formed in a contiguous portion of the silicon layer where the P-type doped regions and N-type doped regions abut. 10. The method of claim 9 , wherein forming upper regions, angled regions and lower regions comprises performing an etching process on the silicon substrate. 11. The method of claim 10 , wherein performing the etching process comprises etching with potassium hydroxide (KOH). 12. The method of claim 9 , further comprising forming a dielectric between the silicon layer and the silicon substrate. 13. The method of claim 9 , wherein applying a laser comprises applying a pulsed laser or a continuous wave laser. 14. The method of claim 9 , wherein applying a laser comprises: driving dopants into the silicon layer using a laser resulting in P-type doped regions and N-type doped regions; and melting the portions of the silicon layer using the laser in a single step as the driving, the melting resulting in portions of the silicon layer over the upper regions and lower regions having a larger grain size than other portions of the silicon layer and the larger grain size formed in a contiguous portion of the silicon layer where the P-type doped regions and N-type doped regions abut. 15. The method of claim 9 , wherein applying a laser comprises applying a laser with a top-hat profile on the on the silicon layer. 16. The method of claim 9 , wherein forming a silicon layer comprises forming an amorphous silicon layer or a polysilicon layer.
including only Group IV materials · CPC title
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Recrystallisation; Crystallization of amorphous or microcrystalline semiconductors · CPC title
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The active layers comprising only Group IV materials · CPC title
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