Electronic device with stacked metasurface lenses
US-12153233-B1 · Nov 26, 2024 · US
US9466739B1 · US · B1
| Field | Value |
|---|---|
| Publication number | US-9466739-B1 |
| Application number | US-201414213691-A |
| Country | US |
| Kind code | B1 |
| Filing date | Mar 14, 2014 |
| Priority date | Oct 21, 2009 |
| Publication date | Oct 11, 2016 |
| Grant date | Oct 11, 2016 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
The present disclosure relates to an electromagnetic energy detector. The detector can include a substrate having a first refractive index; a metal layer; an absorber layer having a second refractive index and disposed between the substrate and the metal layer; a coupling structure to convert incident radiation to a surface plasma wave; additional conducting layers to provide for electrical contact to the electromagnetic energy detector, each conducting layer characterized by a conductivity and a refractive index; and a surface plasma wave (“SPW”) mode-confining layer having a third refractive index that is higher than the second refractive index disposed between the substrate and the metal layer.
Opening claim text (preview).
What is claimed is: 1. An electromagnetic infrared (IR) energy detector, comprising: a substrate having a first refractive index; a metal layer; an absorber layer having a second refractive index and disposed between the substrate and the metal layer; a coupling structure to convert incident radiation to a surface plasma wave; additional conducting layers to provide for electrical contact to the electromagnetic energy detector, each conducting layer characterized by a conductivity and a refractive index; and a surface plasma wave (“SPW”) mode-confining layer having a third refractive index that is higher than the second refractive index at IR wavelengths disposed between the substrate and the metal layer. 2. The electromagnetic infrared energy detector of claim 1 , wherein the SPW mode-confining layer is disposed between the substrate and the absorber layer. 3. The electromagnetic infrared energy detector of claim 1 , wherein the SPW mode-confining layer is disposed between the absorber layer and the metal layer. 4. The electromagnetic infrared energy detector of claim 1 further comprising a top contact layer comprising a dielectric layer having a fourth refractive index that is lower than the second refractive index and disposed between the substrate and the metal layer. 5. The electromagnetic infrared energy detector of claim 4 further comprising a bottom contact layer comprising a dielectric layer having a fifth refractive index that is lower than the second refractive index and the fourth refractive index and disposed between the substrate and the metal layer. 6. The electromagnetic infrared energy detector of claim 1 further comprising a top contact layer. 7. The electromagnetic infrared energy detector of claim 6 further comprising a bottom contact layer. 8. The electromagnetic infrared energy detector of claim 1 , wherein the absorber layer comprises a strained layer super lattice (“SLS”). 9. The electromagnetic infrared energy detector of claim 8 , wherein the SLS comprises InAs: GaSb having a thickness ˜0.09 μm. 10. The electromagnetic infrared energy detector of claim 1 , wherein the absorber layer comprises a plurality of quantum dots. 11. The electromagnetic infrared energy detector of claim 1 , wherein the metal layer comprises Au or Ag. 12. The electromagnetic infrared energy detector of claim 1 , wherein the coupling structure comprises a hole array. 13. The electromagnetic infrared energy detector of claim 1 , wherein the coupling structure comprises a semiconductor layer with post structures etched or deposited therein and the metal layer comprises a continuous metal layer. 14. The electromagnetic infrared energy detector of claim 1 , wherein the coupling structure is patterned and the metal layer comprises a corrugated metal layer. 15. The electromagnetic infrared energy detector of claim 1 , further comprising at least one doped contact layer. 16. The electromagnetic infrared energy detector of claim 1 , further comprising at least one etch-stop layer. 17. The electromagnetic infrared energy detector of claim 1 , wherein the SPW mode-confining layer comprises Ge. 18. The electromagnetic infrared energy detector of claim 1 , wherein the substrate comprises GaSb.
having three or more elements, e.g. GaAlAs, InGaAs or InGaAsP · CPC title
comprising at least three elements, e.g. GaAlAs or InGaAsP · CPC title
Quantum dots · CPC title
of the semiconductor bodies, e.g. textured active layers · CPC title
directly associated or integrated with the devices, e.g. back reflectors (directly associated or integrated with photovoltaic cells H10F77/42) · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.