Test probe coated with conductive elastomer for testing of backdrilled plated through holes in printed circuit board assembly

Patent metadata

Field	Value
Publication number	US-9459285-B2
Application number	US-201313938688-A
Country	US
Kind code	B2
Filing date	Jul 10, 2013
Priority date	Jul 10, 2013
Publication date	Oct 4, 2016
Grant date	Oct 4, 2016

Abstract

A test probe is provided for probing signal information on a back-drilled plated through hole connector formed in a printed circuit board, where the test probe includes a conductive probe body with a distal tip region extending a predetermined minimum coverage length (L TIP ) that is longer than a recess depth dimension (D PL ) for a recessed plating layer formed in the back-drilled plated through hole connector with an elastomer test probe tip formed around the distal tip region and having a total tip width (W TIP ) which is compressed when inserted into the recessed plating layer formed in a back-drilled plated through hole connector, thereby establishing a conductive path between the conductive probe body and the recessed plating layer.

First claim

The invention claimed is:

1. An electrical device for probing signal information on a back-drilled plated through hole connector formed in a printed circuit board, the electrical device comprising:
a conductive probe body comprising a distal tip region extending a predetermined minimum coverage length (L TIP ) that is controlled to be longer than a recess depth dimension (D PL ) for a recessed plating layer formed in a back-drilled plated through hole connector to be probed; and
an elastomer test probe tip formed annularly around the distal tip region of the conductive probe body and having a total tip width (W TIP ) that is wider than a width of the conductive probe body and controlled to be compressed when the distal tip region of the conductive probe body is inserted into the recessed plating layer formed in a back-drilled plated through hole connector to be probed so as to establish a conductive path between the conductive probe body and the recessed plating layer.

2. The electrical device of claim 1 , the distal tip region of the conductive probe body having a surface finish that is disposed to promote adhesion of the elastomer test probe tip.

3. The electrical device of claim 1 , the total tip width (W TIP ) of the elastomer test probe tip being controlled to be smaller than a first width measure of a back-drilled plated through hole opening formed in the printed circuit board where the back-drilled plated through hole connector is located.

4. The electrical device of claim 1 , the elastomer test probe tip comprising a spray coated elastomer material comprising conductive particles dispersed throughout the spray coated elastomer material to provide a conductive path between the conductive probe body and the recessed plating layer when inserted and compressed into contact with the back-drilled plated through hole connector.

5. The electrical device of claim 1 , the elastomer test probe tip comprising a spray coated elastomer material comprising a mixture of melted rubber, metal particles, and a volatile solvent.

6. The electrical device of claim 1 , the elastomer test probe tip comprises a metal impregnated polymer formed to a uniform thickness around sides of the distal tip region such that the metal impregnated polymer is conductive when compressed by the recessed plating layer formed in a back-drilled plated through hole connector, and is not conductive when not compressed by the recessed plating layer formed in a back-drilled plated through hole connector.

7. The electrical device of claim 1 , where the elastomer test probe tip comprises an electrically conductive polymer film impregnated with carbon or silver.

Assignees

• Globalfoundries Inc

Inventors

• Ma Wai M

Classifications

• G01R1/06738

  related to tip portion · CPC title

• G01R1/06755 Primary

  Material aspects · CPC title

• G01R31/2808

  Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards (probe, multiprobe, probe manipulator or probe fixture G01R1/067) · CPC title