Analyzer and automatic analyzer

Patent metadata

Field	Value
Publication number	US-9459271-B2
Application number	US-201414775544-A
Country	US
Kind code	B2
Filing date	Mar 31, 2014
Priority date	Apr 2, 2013
Publication date	Oct 4, 2016
Grant date	Oct 4, 2016

Abstract

To reduce the influence of air bubbles and dust in measuring scattered light beams on an automatic analyzer. A light source emits a light beam with a first wavelength 18 a on a shorter wavelength side and a light beam with a second wavelength 18 b on a longer wavelength side, and then, transmitted light beams 19 a and 19 b and scattered light beams 21 a and 21 b are received. Noise is estimated from the ratio between the intensities of the transmitted light beams with the first wavelength and the second wavelength and a change in the amount of the scattered light beam with the second wavelength. Then, the estimated noise is subtracted from a change in the amount of the scattered light beam with the first wavelength, so that noise due to air bubbles and dust is reduced.

First claim

The invention claimed is:

1. An analyzer comprising:
a cell containing a reaction solution obtained by mixing of a sample with a reagent;
a light source unit configured to irradiate the cell with a light beam with a first wavelength and a light beam with a second wavelength on the same optical path, the second wavelength being longer than the first wavelength;
a light receiving unit configured to receive a scattered light beam with the first wavelength and a scattered light be…

Assignees

• Hitachi High Tech Corp

Inventors

• Yogi Takeshi
• Adachi Sakuichiro
• Yamazaki Hajime

Classifications

• G01N2201/12

  Physics · mapped topic

• G01N21/253 Primary

  Physics · mapped topic

• G01N2021/825

  Physics · mapped topic

• G01N21/49

  Physics · mapped topic

• G01N35/1002

  Physics · mapped topic