Segmented planar calibration for correction of errors in time of flight mass spectrometers

Patent metadata

Field	Value
Publication number	US-9455129-B2
Application number	US-201514796312-A
Country	US
Kind code	B2
Filing date	Jul 10, 2015
Priority date	May 16, 2011
Publication date	Sep 27, 2016
Grant date	Sep 27, 2016

Abstract

An ion detector system for a mass spectrometer is disclosed comprising an ion detector comprising an array of detector elements. The ion detector system is arranged to correct for tilt and non-linear aberrations in an isochronous plane of ions. The ion detector system generates separate first mass spectral data sets for each detector element and then applies a calibration coefficient to each of the first mass spectral data sets to produce a plurality of second calibrated mass spectral data sets. The plurality of second calibrated mass spectral data sets are then combined to form a composite mass spectral data set.

First claim

The invention claimed is:

1. An ion detector system for a mass spectrometer, wherein said ion detector system comprises an ion detector comprising a 1D or 2D array of detector elements; and wherein said ion detector system is arranged and adapted:
(i) to generate separate first mass spectral data sets for each detector element; and
(ii) to apply a calibration coefficient to each of said first mass spectral data sets to produce a plurality of calibrated mass spectral data sets;
wherein said calibration coefficient applied to each of said first mass spectral data sets includes a temporal offset term.

2. An ion detector system as claimed in claim 1 , wherein said ion detector system is arranged and adapted to correct for undesirable planar-position dependent time of flight measurements that adversely effect resolution.

3. An ion detector system as claimed in claim 1 , wherein said calibration coefficient relates to the transit time of signals through or within the ion detector and those associated with delay times associated with different acquisition channels.

4. An ion detector system as claimed in claim 1 , wherein said detector system is arranged and adapted to combine said plurality of calibrated mass spectral data sets to form a composite mass spectral data set and generate a final mass spectrum by combining multiple composite mass spectral data sets.

5. A Time of Flight mass analyser comprising an ion detector system as claimed in claim 1 .

6. A Time of Flight mass analyser as claimed in claim 5 , wherein said Time of Flight mass analyser comprises an axial acceleration Time of Flight mass analyser.

7. A Time of Flight mass analyser as claimed in claim 5 , wherein said Time of Flight mass analyser comprises an orthogonal acceleration Time of Flight mass analyser.

8. A Time of Flight mass analyser as claimed in claim 7 , further comprising:
a pusher or puller electrode and a first grid or other electrode with a first field free region arranged between said pusher or puller electrode and said first grid or other electrode;
a second grid or other electrode and a second field free region arranged between said first grid or other electrode and said second grid or other electrode; and
an orthogonal acceleration region arranged downstream of said second grid or other electrode.

9. A Time of Flight mass analyser as claimed in claim 8 , further comprising a device arranged upstream of said orthogonal acceleration region and adapted to introduce a first order spatial focusing term in order to improve spatial focusing of a beam of ions.

10. A Time of Flight mass analyser as claimed in claim 8 , further comprising a beam expander arranged upstream of said orthogonal acceleration region, said beam expander being arranged and adapted to reduce an initial spread of velocities of ions arriving at said orthogonal acceleration region.

11. A Time of Flight mass analyser as claimed in claim 8 , further comprising a gimbal comprising two inclined electrodes, wherein said gimbal is located in said first field free region, said second field free region or said orthogonal acceleration region.

12. A Time of Flight mass analyser as claimed in claim 11 , wherein said gimbal is arranged and adapted to correct for a linear or first order effect resulting from misalignment of one or more ion-optical components.

13. A mass spectrometer comprising a Time of Flight mass analyser as claimed in claim 5 .

14. A method of detecting ions with an ion detector system including an ion detector having a 1D or 2D array of detector elements, said method comprising:
(i) generating separate first mass spectral data sets for each detector element; and
(ii) applying a calibration coefficient to each of said first mass spectral data sets to produce a plurality of second calibrated mass spectral data sets;
wherein said calibration coefficient applied to each of said first mass spectral data sets includes a temporal offset term.

15. An ion detector system for a mass spectrometer, wherein said ion detector system comprises an ion detector comprising a 1D or 2D array of detector elements; and
wherein said ion detector system is arranged and adapted:
(i) to generate separate first mass spectral data sets for a plurality of said detector elements; and
(ii) to apply a calibration coefficient to said first mass spectral data sets to produce a plurality of second calibrated mass spectral data sets;
wherein said calibration coefficient applied to each of said first mass spectral data sets includes a temporal offset term.

16. A method of detecting ions, said method comprising providing an ion detector system comprising an ion detector comprising a 1D or 2D array of detector elements; and
wherein said method further comprises:
(i) generating separate first mass spectral data sets for a plurality of said detector elements; and
(ii) applying a calibration coefficient to said first mass spectral data sets to produce a plurality of second calibrated mass spectral data sets;
wherein said calibration coefficient applied to each of said first mass spectral data sets includes a temporal offset term.

Assignees

• Micromass Ltd

Inventors

• Langridge David J
• Wildgoose Jason Lee

Classifications

• H01J49/02

  Details · CPC title

• H01J49/401

  characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode · CPC title

• H01J49/0036 Primary

  Step by step routines describing the handling of the data generated during a measurement · CPC title

• H01J49/025 Primary

  Detectors specially adapted to particle spectrometers (data acquisition H01J49/0036; detectors per se G01T, e.g. G01T1/28, G01T1/29) · CPC title

• H01J49/40

  Time-of-flight spectrometers (H01J49/36 takes precedence) · CPC title