Multi-layered thin film piezoelectric devices and methods of making the same

US9437802B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9437802-B2
Application numberUS-201313972814-A
CountryUS
Kind codeB2
Filing dateAug 21, 2013
Priority dateAug 21, 2013
Publication dateSep 6, 2016
Grant dateSep 6, 2016

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  1. Title

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  5. First independent claim

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Abstract

Official abstract text for this publication.

Multi-layered thin film piezoelectric material stacks and devices incorporating such stacks. In embodiments, an intervening material layer is disposed between two successive piezoelectric material layers in at least a portion of the area of a substrate over which the multi-layered piezoelectric material stack is disposed. The intervening material may serve one or more function within the stack including, but not limited to, inducing an electric field across one or both of the successive piezoelectric material layers, inducing a discontinuity in the microstructure between the two successive piezoelectric materials, modulating a cumulative stress of the piezoelectric material stack, and serving as a basis for varying the strength of an electric field as a function of location over the substrate.

First claim

Opening claim text (preview).

What is claimed is: 1. A thin film piezoelectric device, comprising: a piezoelectric element including: a lower electrode disposed over a first region of a substrate; a first piezoelectric layer having a first polarization disposed over the lower electrode; a second piezoelectric layer having the first polarization disposed over the first piezoelectric layer; an intervening layer disposed between the first and second piezoelectric layers in at least a portion of the first region, wherein the intervening layer is of a different composition than that of the first and second piezoelectric layers; and an upper electrode disposed over the second piezoelectric layer; wherein the piezoelectric element is in fluid communication with a pumping chamber, or wherein the piezoelectric element is disposed over a sealed cavity of an ultrasonic transducer. 2. The device of claim 1 , wherein the intervening layer is an inner electrode comprising conductive material capable of sustaining a voltage different than that of either the lower or upper electrode. 3. The device of claim 1 , wherein the intervening layer includes at least one of Pt, Ir, an alloy thereof, or an oxide thereof in direct contact with both the first and second piezoelectric layers. 4. The device of claim 3 , wherein each of the first and second piezoelectric layers comprise PZT, and wherein both of the lower electrode and intervening layer further comprises a Pt or Ir containing layer disposed in direct contact with a piezoelectric layer. 5. The device of claim 1 , wherein the first and second piezoelectric layers comprise PZT of 2-8 μm in thickness. 6. The device of claim 1 , wherein the first and second piezoelectric layers comprise PZT of 2-4 μm in thickness. 7. The device of claim 1 , wherein the intervening layer is one of a plurality of intervening layers separated by an intervening piezoelectric layer. 8. The device of claim 1 , wherein the intervening layer spans a smaller area than does at least one of the upper and lower electrodes, and wherein the second piezoelectric layer is disposed directly on the first piezoelectric layer in a portion of the first region where the intervening layer is absent. 9. A piezoelectric apparatus, comprising a substrate; an array of piezoelectric elements disposed over the substrate, wherein each piezoelectric element comprises: a first electrode disposed over a first region of a substrate; a first piezoelectric layer having a first polarization disposed over the first electrode; a second piezoelectric layer having the first polarization disposed over the first piezoelectric layer; and an intervening layer disposed between the first and second piezoelectric layers in at least a portion of the first region, wherein the intervening layer is of a different composition than that of the first and second piezoelectric layers; and a second electrode disposed over the second piezoelectric layer; wherein each piezoelectric element is in fluid communication with a pumping chamber of a respective microfluidic device, or each piezoelectric element is disposed over a sealed cavity of a respective ultrasonic transducer. 10. The apparatus of claim 9 , wherein the intervening layer spans a smaller area than does the first electrode, and wherein the second piezoelectric layer is disposed directly on the first piezoelectric layer in a portion of the first region where the intervening layer is absent. 11. The apparatus of claim 10 , wherein at least one of the first and second electrode is patterned to be disposed in an area where the intervening layer is absent. 12. A method comprising: operating a piezoelectric element of a thin film piezoelectric device, the piezoelectric element including: a lower electrode disposed over a first region of a substrate; a first piezoelectric layer having a first polarization disposed over the lower electrode; a second piezoelectric layer having the first polarization disposed over the first piezoelectric layer; an intervening layer disposed between the first and second piezoelectric layers in at least a portion of the first region, wherein the intervening layer is of a different composition than that of the first and second piezoelectric layers; and an upper electrode disposed over the second piezoelectric layer; wherein operating the piezoelectric element includes: driving a time varying voltage across the upper electrode and the lower electrode to place an electric field across the first piezoelectric layer and the second piezoelectric layer; and biasing the inner electrode; wherein the piezoelectric element is in fluid communication with a pumping chamber, or wherein the piezoelectric element is disposed over a sealed cavity of an ultrasonic transducer. 13. The device of claim 12 , wherein the lower, inner, and upper electrodes are driven to place substantially equal electric fields oriented in a same direction across each of the first and second piezoelectric layers. 14. The device of claim 12 , wherein each of the upper and lower electrodes are driven with a time varying voltage source having a peak-to-peak voltage, and wherein the inner electrode is maintained at a voltage intermediate of the time varying voltage over an entire phase of the time varying voltage.

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What does patent US9437802B2 cover?
Multi-layered thin film piezoelectric material stacks and devices incorporating such stacks. In embodiments, an intervening material layer is disposed between two successive piezoelectric material layers in at least a portion of the area of a substrate over which the multi-layered piezoelectric material stack is disposed. The intervening material may serve one or more function within the stack …
Who is the assignee on this patent?
Li Youming, Fujifilm Dimatix Inc
What technology area does this patent fall under?
Primary CPC classification H01L41/0471. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Sep 06 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).