Semiconductor integrated circuit device
US-9142578-B2 · Sep 22, 2015 · US
US9437643B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9437643-B2 |
| Application number | US-201514840707-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 31, 2015 |
| Priority date | Jun 26, 2013 |
| Publication date | Sep 6, 2016 |
| Grant date | Sep 6, 2016 |
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Provided is a semiconductor integrated circuit device having pixel regions in a photodiode array region and having, in each of the pixel regions, a waveguide holding hole having a substantially perpendicular sidewall above the photodiode and embedded with a silicon oxide-based sidewall insulating film reaching the bottom surface of the hole and two or more silicon nitride-based insulating films having a higher refractive index on the inner side of the hole. This structure makes it possible to prevent deterioration of pixel characteristics of an imaging device, such as CMOS sensor, which is rapidly decreasing in size.
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What is claimed is: 1. A semiconductor integrated circuit device including a CMOS image sensor, comprising: a photodiode formed in a semiconductor substrate and configuring a part of the CMOS image sensor; an interlayer insulating film formed over the photodiode; a waveguide holding hole formed in the interlayer insulating film above the photodiode; a first silicon nitride-based insulating film formed over a side surface and a bottom surface of the waveguide holding hole;…
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Physics · mapped topic
Physics · mapped topic
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