Method and system for object reconstruction

Patent metadata

Field	Value
Publication number	US-9437006-B2
Application number	US-201514745438-A
Country	US
Kind code	B2
Filing date	Jun 21, 2015
Priority date	Mar 30, 2005
Publication date	Sep 6, 2016
Grant date	Sep 6, 2016

Abstract

A system and method are presented for use in the object reconstruction. The system comprises an illuminating unit, and an imaging unit (see FIG. 1 ). The illuminating unit comprises a coherent light source and a generator of a random speckle pattern accommodated in the optical path of illuminating light propagating from the light source towards an object, thereby projecting onto the object a coherent random speckle pattern. The imaging unit is configured for detecting a light response of an illuminated region and generating image data. The image data is indicative of the object with the projected speckles pattern and thus indicative of a shift of the pattern in the image of the object relative to a reference image of said pattern. This enables real-time reconstruction of a three-dimensional map of the object.

First claim

The invention claimed is:

1. A system for object reconstruction, comprising:
an illuminating unit, comprising a coherent light source and a generator of a non-periodic pattern comprising a diffractive optical element (DOE) in an optical path of illuminating light propagating from the light source toward an object, thereby projecting the non-periodic pattern onto an object;
an imaging unit configured to detect a light response of an illuminated region and generating image data indicative of the object within the projected pattern; and
a processor, configured to reconstruct a three-dimensional (3D) map of the object responsively to a shift of the pattern in the image data relative to a reference image of the pattern.

2. The system according to claim 1 , wherein the reference image is acquired at a reference plane oriented normally to the optical path of the illuminating light.

3. The system according to claim 2 , wherein the reference plane is at the same distance from the generator of the non-periodic pattern and from the imaging unit.

4. The system according to claim 1 , wherein the processor is configured to reconstruct the 3D map by determining a correlation between the image data and the reference image.

5. The system according to claim 1 , wherein the DOE is configured to adjust a brightness variation of the projected pattern between different regions in a field of view of the imaging unit.

6. The system according to claim 1 , wherein the projected pattern comprises a Fourier transform of the DOE.

7. The system according to claim 1 , wherein the imaging unit comprises a single light detector having a stationary field of view.

8. A method for object reconstruction, comprising:
projecting onto an object a non-periodic pattern formed by a coherent light source and a generator of the non-periodic pattern comprising a diffractive optical element (DOE) in an optical path of illuminating light propagating from the light source toward the object;
detecting a light response of an illuminated region and generating image data indicative of the object within the projected pattern; and
processing the image data so as to reconstruct a three-dimensional (3D) map of the object responsively to a shift of the pattern in the image data relative to a reference image of the pattern.

9. The method according to claim 8 , wherein the reference image is acquired at a reference plane oriented normally to the optical path of the illuminating light.

10. The method according to claim 9 , wherein the reference plane is at the same distance from the generator of the non-periodic pattern and from an imaging unit that detects the light response.

11. The method according to claim 8 , wherein processing the image data comprises reconstructing the 3D map by determining a correlation between the image data and the reference image.

12. The method according to claim 8 , wherein the DOE is configured to adjust a brightness variation of the projected pattern between different regions in a field of view of the imaging unit.

13. The method according to claim 8 , wherein the projected pattern comprises a Fourier transform of the DOE.

14. The method according to claim 8 , wherein detecting the light response comprises capturing an image using a single light detector having a stationary field of view.

Assignees

• Apple Inc

Inventors

• Zalevsky Zeev
• Shpunt Alexander
• Maizels Aviad
• Garcia Javier

Classifications

• H10W20/43

  Layouts of interconnections · CPC title

• H10W20/20

  Interconnections within wafers or substrates, e.g. through-silicon vias [TSV] · CPC title

• H04N13/254

  in combination with electromagnetic radiation sources for illuminating objects · CPC title

• G01B11/2513

  with several lines being projected in more than one direction, e.g. grids, patterns · CPC title

• H04N13/20

  Image signal generators · CPC title