System and method for quantum efficiency measurement employing diffusive device

US9435733B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9435733-B2
Application numberUS-201414282999-A
CountryUS
Kind codeB2
Filing dateMay 20, 2014
Priority dateMay 19, 2009
Publication dateSep 6, 2016
Grant dateSep 6, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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Abstract

Official abstract text for this publication.

A system for measuring a characteristic of a solar cell is disclosed and includes a light source irradiating an optical signal having a spectral range from about 100 nm to about 3000 nm, a wavelength selector configured to selectively narrow the spectral range of the optical signal, a beam splitter, a reference detector in optical communication with the beam splitter and configured to measure a characteristic of the optical signal, a specimen irradiated with the optical signal, a reflectance detector in optical communication with the specimen via the beam splitter and configured to measure an optical characteristic of the optical signal reflected by the specimen, a multiplexer in communication with at least one of the reference detector, specimen, and reflectance detector, and a processor in communication with at least one of the reference detector, specimen, and reflectance detector via the multiplexer and configured to calculate at least one characteristic of the specimen.

First claim

Opening claim text (preview).

What is claimed is: 1. A system for measuring a characteristic of a solar cell, comprising: at least one light source irradiating at least one optical signal having a spectral range from about 100 nm to about 3000 nm; at least one wavelength selector configured to selectively narrow the spectral range of the optical signal; at least one beam splitter; at least one reference detector in optical communication with the beam splitter and configured to measure at least one characteristic of the optical signal; at least one specimen irradiated with the optical signal from the beam splitter; at least one diffusive device optically coupled between the beam splitter and the specimen; at least one diffusive detector in communication with the diffusive device and configured to measure at least one optical characteristic of light scattered by the specimen when irradiated with the optical signal; at least one reflectance detector in optical communication with the specimen via the diffusive device and the beam splitter, the reflectance detector configured to measure at least one optical characteristic of the optical signal reflected by the specimen; at least one multiplexer in communication with at least one of the reference detector, specimen, the diffusive device, the diffusive detector, and reflectance detector; and at least one processor in communication with at least one of the reference detector, specimen, the diffusive device, the diffusive detector, and reflectance detector via the multiplexer, the processor configured to calculate at least one characteristic including a quantum efficiency of the specimen based on data received from the reference detector and at least one of the specimen, the diffusive device, the diffusive detector, and reflectance detector. 2. The system of claim 1 further comprising at least one wavelength filter positioned proximate to the light source and configured to spectrally narrow a broad spectrum optical signal irradiated by the light source. 3. The system of claim 1 further comprising at least one modulator positioned proximate to the light source and configured to selectively modulate the optical signal emitted by the light source. 4. The system of claim 1 wherein the processor is configured to calculate the internal quantum efficiency of the specimen based on the calculated quantum efficiency and data received from least one of the reference detector, the specimen, the diffusive device, the diffusive detector, and the reflectance detector. 5. The system of claim 1 further comprising a transmission detector positioned proximate to the specimen, the transmission detector configured to detect the optical signal irradiated by the light source and transmitted through the specimen. 6. The system of claim 5 wherein the transmission detector is in communication with the multiplexer. 7. The system of claim 1 further comprising a detector measuring device in communication with at least one of the multiplexer and the processor. 8. The system of claim 7 wherein the detector measuring device comprises a lock-in amplifier. 9. The system of claim 1 further comprising at least one light bias controller in communication with the processor and specimen. 10. The system of claim 1 further comprising at least one electrical bias controller in communication with the processor and the specimen. 11. The system of claim 1 , wherein the at least one diffusive device comprises an integrating sphere.

Assignees

Inventors

Classifications

  • comprising quantum structures · CPC title

  • PV systems with concentrators · CPC title

  • G01N21/31Primary

    Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry {(G01N21/72 takes precedence)} · CPC title

  • G01N21/33Primary

    using ultraviolet light (G01N21/39 takes precedence) · CPC title

  • H02S50/10Primary

    Testing of PV devices, e.g. of PV modules or single PV cells (testing of semiconductor devices during manufacturing {H10P74/00}) · CPC title

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What does patent US9435733B2 cover?
A system for measuring a characteristic of a solar cell is disclosed and includes a light source irradiating an optical signal having a spectral range from about 100 nm to about 3000 nm, a wavelength selector configured to selectively narrow the spectral range of the optical signal, a beam splitter, a reference detector in optical communication with the beam splitter and configured to measure a…
Who is the assignee on this patent?
Newport Corp
What technology area does this patent fall under?
Primary CPC classification G01N21/31. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Sep 06 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).