Semiconductor devices and methods of manufacturing
US-12166025-B2 · Dec 10, 2024 · US
US9431314B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9431314-B2 |
| Application number | US-201113040079-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 3, 2011 |
| Priority date | Oct 21, 2010 |
| Publication date | Aug 30, 2016 |
| Grant date | Aug 30, 2016 |
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A thermosetting resin composition for an underfilling of a semiconductor comprising, as essential components, a thermosetting resin, a curing agent, a flux agent and two or more inorganic fillers with different mean particle sizes, wherein the inorganic fillers include an inorganic filler with a mean particle size of no greater than 100 nm and an inorganic filler with a mean particle size of greater than 100 nm.
Opening claim text (preview).
What is claimed is: 1. A thermosetting resin composition for an underfilling of a semiconductor comprising, as essential components, a thermosetting resin, a curing agent, a flux agent and two or more inorganic fillers with different mean particle sizes, wherein the inorganic fillers include an inorganic filler with a mean particle size of no greater than 100 nm and an inorganic filler with a mean particle size of greater than 150 nm and no greater than 500 nm; wherein: said thermosetting resin and said flux agent are separate ingredients, said thermosetting resin composition is in the form of a film, said thermosetting resin contains an epoxy resin which is solid at 25° C. wherein the inorganic filler with a mean particle size of no greater than 100 nm is surface-treated, and wherein the inorganic filler with a mean particle size of greater than 150 nm and no greater than 500 nm is non-surface-treated. 2. A thermosetting resin composition for an underfilling of a semiconductor according to claim 1 , wherein the viscosity at 250° C. is no greater than 100 Pa·s. 3. A thermosetting resin composition for an underfilling of a semiconductor according to claim 1 , which has a transmittance of at least 10% for light with a wavelength of 555 nm. 4. A semiconductor device produced using a thermosetting resin composition for an underfilling of a semiconductor according to claim 1 . 5. The thermosetting resin composition for an underfilling of a semiconductor according to claim 1 , wherein the content of the inorganic filler with a mean particle size of no greater than 100 nm is 10-90 wt % of the total inorganic filler. 6. The thermosetting resin composition for an underfilling of a semiconductor according to claim 1 , wherein the inorganic fillers are selected from the group consisting of silica, alumina, mullite, silicon and titanium complex oxide, and boron nitride. 7. The thermosetting resin composition for an underfilling of a semiconductor according to claim 1 , wherein the flux agent is selected from the group consisting of alcohols, phenols and carboxylic acids.
on active surfaces of flip-chip devices, e.g. underfills · CPC title
between a chip and a stacked insulating package substrate, interposer or RDL · CPC title
between a chip and a stacked insulating package substrate, interposer or RDL · CPC title
of encapsulations on active surfaces of flip-chip devices, e.g. forming underfills · CPC title
characterised by their materials · CPC title
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