Method of extracting ions with a low M/Z ratio from an ion trap

US9431230B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9431230-B2
Application numberUS-201214367261-A
CountryUS
Kind codeB2
Filing dateNov 28, 2012
Priority dateDec 27, 2011
Publication dateAug 30, 2016
Grant dateAug 30, 2016

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

In a mass spectrometer, a method for trapping ions includes providing at least first and second multipole rod sets positioned in tandem, introducing a plurality of ions into the first rod set, applying an RF potential to at least one of said rod sets to generate a radial trapping potential within said rod sets, applying a radial DC potential to said first rod set so as to modulate said radial trapping potential set as a function of m/z of said ions, and applying a DC potential between said two rod sets to provide an axial bias potential between said two rod sets. The method can further comprise selecting an axial barrier potential to selectively extract ions having an m/z ratio less than a threshold from said first rod set into said second rod set.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for trapping ions in a mass spectrometer, comprising: providing at least first and second multipole rod sets positioned in tandem, applying a radial RF potential to at least one of said rod sets to generate an RF radial trapping potential within at least said first rod set, applying a radial dipolar DC potential to said first rod set so as to modulate said radial trapping potential as a function of m/z of said ions, applying an axial bias DC potential between said two rod sets to provide an axial bias potential between said two rod sets, and introducing a plurality of ions into said first rod set. 2. The method of claim 1 , wherein said radial RF potential generates an RF linear quadrupole field and said radial dipolar DC potential generates a DC dipole field. 3. The method of claim 1 , wherein said radial RF potential generates an RF linear hexapole field and said radial dipolar DC potential generates a DC dipole field. 4. The method of claim 1 , wherein said radial dipolar DC potential modulates the RF radial trapping potential within said first rod set such that ions within said first rod set having an m/z less than a selected threshold are capable of entering said second rod set under influence of said axial bias DC potential. 5. The method of claim 4 , wherein said radial dipolar DC potential modulates the RF radial trapping potential within said first rod set such that ions within said first rod set having an m/z greater than said threshold are trapped within said first rod set. 6. The method of claim 1 , wherein said radial dipolar DC potential causes an m/z dependent shift in radial confinement of said ions. 7. The method of claim 1 , wherein said radial dipolar DC potential causes an m/z dependent shift in a depth of a radial potential well experience by each of said ions. 8. The method of claim 1 , further comprising selecting said axial DC bias potential to selectively extract ions having an m/z ratio less than a threshold from said first rod set into said second rod set. 9. The method of claim 1 , wherein said mass selective extraction of ions having an m/z ratio less than the threshold from said first rod set is achieved without using resonant excitation. 10. The method of claim 1 , further comprising selectively extracting ions having an m/z higher than a threshold from said first rod set. 11. The method of claim 1 , further comprising selectively extracting ions having an m/z ratio lower than a first threshold and selectively extracting ions having an m/z ratio greater than a second threshold from said first rod set while retaining ions having an m/z ratio between said first and second thresholds within said first rod set. 12. The method of claim 1 , further comprising: trapping a first group of ions and a second group of ions within the first rod set so as to generate product ions from ion-ion reactions between ions of the first group and ions of the second group, the ions of the first group having an opposite polarity relative to ions of the second group; and selectively extracting from said first rod set at least a portion of the product ions having an m/z less than a first threshold under influence of said axial bias DC potential. 13. The method of claim 12 , further comprising selectively extracting from said first rod set at least a portion of the product ions having an m/z greater than a second threshold. 14. A mass spectrometer, comprising: an ion trap comprising at least one multipole rod set configured to trap a plurality of ions via a radial RF field and a radial dipolar DC field within said first rod set, a first voltage source for applying the radial RF potential to at least one of said rod sets to generate an RF radial trapping potential within at least said first rod set, a second voltage source for applying the radial dipolar DC potential to said first rod set so as to modulate said radial trapping potential as a function of m/z of said ions, and a third voltage source for applying an axial bias DC potential between said two rod sets to provide an axial bias potential between said two rod sets.

Assignees

Inventors

Classifications

  • H01J49/427Primary

    Ejection and selection methods · CPC title

  • Multipole linear ion traps, e.g. quadrupoles, hexapoles · CPC title

  • Storage methods · CPC title

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Frequently asked questions

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What does patent US9431230B2 cover?
In a mass spectrometer, a method for trapping ions includes providing at least first and second multipole rod sets positioned in tandem, introducing a plurality of ions into the first rod set, applying an RF potential to at least one of said rod sets to generate a radial trapping potential within said rod sets, applying a radial DC potential to said first rod set so as to modulate said radial t…
Who is the assignee on this patent?
Dh Technologies Dev Pte Ltd
What technology area does this patent fall under?
Primary CPC classification H01J49/427. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Aug 30 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).