Fine particle measurement device, and laminar flow monitoring method and fine particle analysis method in fine particle measurement device
US-2015177113-A1 · Jun 25, 2015 · US
US9429508B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9429508-B2 |
| Application number | US-201314434404-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 30, 2013 |
| Priority date | Oct 15, 2012 |
| Publication date | Aug 30, 2016 |
| Grant date | Aug 30, 2016 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A microparticle measuring apparatus for highly accurately detecting the position of a microparticle flowing through a flow channel includes a light irradiation unit for irradiating a microparticle flowing through a flow channel with light, and a scattered light detection unit for detecting scattered light from the microparticle, including an objective lens for collecting light from the microparticle, a light splitting element for dividing the scattered light from the light collected by the objective lens, into first and second scattered light, a first scattered light detector for receiving an S-polarized light component, and an astigmatic element disposed between the light splitting element and the first scattered light detector, and making the first scattered light astigmatic. A relationship between a length L from a rear principal point of the objective lens to a front principal point of the astigmatic element, and a focal length f of the astigmatic element satisfies the following formula I. 1.5 f ≦L≦2.5 f (I)
Opening claim text (preview).
The invention claimed is: 1. A microparticle measuring apparatus comprising: a light irradiation unit configured to irradiate a microparticle flowing through a flow channel with light; and a scattered light detection unit configured to detect scattered light from the microparticle, the scattered light detection unit at least including: an objective lens configured to collect light emitted from the microparticle; a light splitting element configured to divide the scattered light from the light having been collected by the objective lens, into first scattered light and second scattered light; a first scattered light detector configured to receive the first scattered light; and an astigmatic element disposed between the light splitting element and the first scattered light detector, the astigmatic element configured to make the first scattered light astigmatic, wherein a relationship between a length L from a rear principal point of the objective lens to a front principal point of the astigmatic element, and a focal length f of the astigmatic element satisfies the following formula (I) 1.5 f≦L≦ 2.5 f (I). 2. The microparticle measuring apparatus according to claim 1 , wherein the light splitting element is a polarization element configured to diffracting the scattered light into an S-polarized light component and a P-polarized light component, and the first scattered light is the S-polarized light component. 3. The microparticle measuring apparatus according to claim 1 , wherein the astigmatic element is a cylindrical lens. 4. The microparticle measuring apparatus according to claim 3 , wherein when a light input direction to the microparticle is defined as the z-direction, a flowing direction of the microparticle is defined as the x-direction, and a direction perpendicular to the z- and x-directions is defined as the y-direction, the astigmatic element is disposed on a plane perpendicular to a y-direction to have an angle 0° to 5° between a generatrix of the astigmatic element and a line extending in an x-direction or a line extending in a z-direction. 5. The microparticle measuring apparatus according to claim 1 , wherein the first scattered light detector is a detector having a light receiving surface divided into a plurality of areas. 6. The microparticle measuring apparatus according to claim 5 , wherein the first scattered light detector is a quadrant photodiode. 7. The microparticle measuring apparatus according to claim 6 , wherein when the light input direction to the microparticle is defined as the z-direction, the flowing direction of the microparticle is defined as the x-direction, and the direction perpendicular to the z- and x-directions is defined as the y-direction, the first scattered light detector is disposed on a plane perpendicular to the y-direction to have an angle of 40° to 50° between a dividing line of the first scattered light detector and a line extending in the x-direction or a line extending in the z-direction. 8. The microparticle measuring apparatus according to claim 1 , wherein a flowing position of the microparticle is detected based on the change in light receiving position of the first scattered light. 9. The microparticle measuring apparatus according to claim 8 , wherein the light receiving surface of the first scattered light detector is divided into a lattice shape to have a first area, a second area, a third area, and a fourth area, and the first scattered light detector acquires the positional information of the microparticle based on a difference (A-C) between a detection value A of the first area and a detection value C of the third area not adjacent to the first area. 10. The microparticle measuring apparatus according to claim 8 , wherein the light receiving surface of the first scattered light detector is divided into a lattice shape to have a first area, a second area, a third area, and a fourth area, and the first scattered light detector acquires the positional information of the microparticle based on a difference ((A+C)−(B+D)) between the sum (A+C) of the detection value A of the first area and the detection value C of the third area not adjacent to the first area, and the sum (B+D) of a detection value B of the second area adjacent to the first area and a detection value D of the fourth area not adjacent to the second area. 11. The microparticle measuring apparatus according to claim 1 , wherein the light irradiation unit irradiates the microparticle flowing through an analysis chip including a microchannel, with light.
Optical arrangements · CPC title
within a flowing fluid, e.g. smoke · CPC title
the optical arrangement forming an integrated apparatus with the sample container, e.g. a flow cell · CPC title
within a body or fluid · CPC title
for cytology · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.