Photovoltaic module and production method for the same
US-2024204124-A1 · Jun 20, 2024 · US
US9419166B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9419166-B2 |
| Application number | US-201514975175-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 18, 2015 |
| Priority date | Sep 26, 2014 |
| Publication date | Aug 16, 2016 |
| Grant date | Aug 16, 2016 |
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A method of fabricating a solar cell can include forming a first dopant region over a silicon substrate and an oxide region over the first dopant region. In an embodiment, the oxide region can protect the first dopant region from a first etching process. In an embodiment, a second dopant region can be formed over the silicon substrate, where a mask can be formed to protect a first portion of the second dopant region from the first etching process. In an embodiment, the first etching process can be performed to expose portions of the silicon substrate and/or a silicon region. A second etching process can be performed to form a trench region to separate a first and second doped region of the solar cell. A third etching process can be performed to remove contaminants from the solar cell and remove any remaining portions of the oxide region.
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What is claimed is: 1. A method of fabricating a solar cell, the method comprising: forming a silicon region over the silicon substrate; forming a first dopant region on the silicon region; forming an oxide region on the first dopant region, wherein a first portion of the oxide region protects the first dopant region from a first etching process; forming a second dopant region on the silicon region; driving dopants from the first and second dopant regions to the silicon region, wherein the driving forms first and second doped regions in the silicon region; forming a mask on a first portion of the second dopant region, wherein the mask protects the first portion of the second dopant region from the first etching process; performing the first etching process to expose portions of the silicon region and remove a first portion of the oxide region and the mask; performing a texturing process to form a textured region on an exposed region of the silicon substrate; performing a second etching process to remove the oxide region and contaminants from the silicon substrate; and performing a drying process on the silicon substrate. 2. The method of claim 1 , wherein performing the first etching process to expose portions of the silicon substrate comprises etching with at least one of hydrofluoric acid and nitric acid. 3. The method of claim 1 , wherein performing the second etching process comprises etching with at least one of hydrofluoric acid, ozone or hydrochloric acid. 4. The method of claim 1 , wherein forming the second dopant region over the silicon substrate comprises forming the second dopant region over the first dopant region, oxide region and the silicon substrate.
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