Production failure analysis system

Patent metadata

Field	Value
Publication number	US-9417628-B2
Application number	US-201313802557-A
Country	US
Kind code	B2
Filing date	Mar 13, 2013
Priority date	Mar 13, 2013
Publication date	Aug 16, 2016
Grant date	Aug 16, 2016

Abstract

A production failure analysis system including a factory quality control unit configured to transmit a trigger signal when a production failure is detected, and an analytics unit. The analytics unit is configured to determine a root cause of the production failure by at least receiving the trigger signal from a factory quality control unit, extracting production data from a database when the trigger signal is received, wherein the production data includes process input variables, and identifying one or more potential root causes of the production failure based in part on an analysis of the process input variables.

First claim

What is claimed is:

1. A storage device production failure analysis system comprising:
a factory quality control unit configured to transmit a trigger signal when a storage device production failure is detected; and
an analytics unit configured to determine a root cause of the storage device production failure by at least:
receiving the trigger signal from a factory quality control unit;
extracting storage device production data from a database when the trigger signal is received, wherein the storage device production data comprises process input variables;
identifying one or more potential root causes of the storage device production failure based in part on an analysis of the process input variables; and
generating a report indicating the process input variables that correspond to the root cause of the storage device production failure, the report comprising at least one of a decision tree graph, a leaf report and a correlation data chart.

2. The system of claim 1 wherein the factory quality control unit is configured to generate the storage device production data.

3. The system of claim 2 wherein the storage device production data comprises a cumulative yield, and the factory quality control unit detects the storage device production failure based on the cumulative yield.

4. The system of claim 2 wherein the storage device production data comprises a station yield, and the factory quality control unit detects the storage device production failure based on the station yield.

5. The system of claim 1 wherein the analytics unit is further configured to determine a root cause of the storage device production failure by at least:
cleaning the storage device production data.

6. The system of claim 5 wherein the process input variables comprise one or more configuration data.

7. The system of claim 6 wherein the cleaning the storage device production data further comprises:
separating the process input variables for analysis based on an amount of the configuration data.

8. The system of claim 1 wherein the identifying one or more potential root causes of the storage device production failure based in part on an analysis of the process input variables further comprises:
determining, using sum squared errors, that the process input variables are the root causes of the storage device production failure; and
identifying the process input variables which are potential root causes of the storage device production failure based in part on the sum squared errors.

9. The system of claim 1 , wherein the report comprises correlation data indicating a correlation of the process input variables which correspond to the root cause of the storage device production failure and the root cause of the storage device production failure.

10. The system of claim 9 wherein the correlation data comprises logworth data.

11. The system of claim 9 wherein the correlation data comprises G2 data.

12. The system of claim 1 , wherein the report comprises storage device fail data and storage device pass data for the process input variables which correspond to the root cause of the storage device production failure.

13. The system of claim 1 wherein the identifying one or more potential root causes of the storage device production failure based in part on an analysis of the process input variables further comprises:
determining probabilities that the process input variables are the root causes of the storage device production failure; and
identifying the process input variables which are potential root causes of the storage device production failure based in part on the determined probabilities.

14. A production failure analysis system comprising:
a factory quality control unit configured to transmit a trigger signal when a production failure is detected; and
an analytics unit configured to determine a root cause of the production failure by at least:
receiving the trigger signal from a factory quality control unit;
extracting production data from a database when the trigger signal is received, wherein the production data comprises process input variables; and
identifying one or more potential root causes of the production failure based in part on an analysis of the process input variables by:
determining, using sum squared errors, that the process input variables are the root causes of the production failure; and
identifying the process input variables which are potential root causes of the production failure based in part on the sum squared errors.

15. The system of claim 14 wherein the analytics unit is further configured to determine a root cause of the production failure by at least:
generating a report indicating the process input variables which correspond to the root cause of the production failure.

16. The system of claim 14 wherein the identifying one or more potential root causes of the production failure based in part on an analysis of the process input variables further comprises:
determining probabilities that the process input variables are the root causes of the production failure; and
identifying the process input variables which are potential root causes of the production failure based in part on the determined probabilities.

17. A storage device production failure analysis system comprising:
a factory quality control unit configured to transmit a trigger signal when a storage device production failure is detected; and
an analytics unit configured to determine a root cause of the storage device production failure by at least:
receiving, the trigger signal from a factory quality control unit;
extracting storage device production data from a database when the trigger signal is received, wherein the storage device production data comprises process input variables; and
identifying one or more potential root causes of the storage device production failure based in part on an analysis of the process input variables by:
determining, using sum squared errors, that the process input variables are the root causes of the storage device production failure; and
identifying the process input variables that are potential root causes of the storage device production failure based in part on the sum squared errors.

18. A method for determining a root cause of a storage device production failure for a storage device production failure analysis system, the method comprising at least:
receiving a trigger signal from a factor quality control unit, the trigger signal generated when a storage device production failure is detected;
extracting storage device production data from a database when the trigger signal is received, wherein the storage device production data comprises process input variables; and
identifying, one or more potential root causes of the storage device production failure based in part on an analysis of the process input variables by:
determining, using sum squared errors, that the process input variables are the root causes of the storage device production failure; and
identifying the process input variables which are potential root causes of the storage device production failure based in art on the sum squared errors.

19. The method of claim 18 wherein the factory quality control unit, is configured to generate a storage device production data.

20. The method of claim 19 wherein the storage device production data comprises a cumulative yield, and the factory quality control unit detects the storage device production failure based on the cumulative yield.

Assignees

• Western Digital Tech Inc

Inventors

• Sim Kiam Hwee
• Kojarunchitt Nattaphat
• Boonseng Apisit
• Ng Meng Seng

Classifications

• G05B23/0275

  Fault isolation and identification, e.g. classify fault; estimate cause or root of failure · CPC title

• G05B23/0281 Primary

  Quantitative, e.g. mathematical distance; Clustering; Neural networks; Statistical analysis · CPC title