Method for mapping an environment

US9412173B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9412173-B2
Application numberUS-201414783215-A
CountryUS
Kind codeB2
Filing dateApr 22, 2014
Priority dateJun 21, 2013
Publication dateAug 9, 2016
Grant dateAug 9, 2016

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Abstract

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A method for mapping an environment comprises moving a sensor along a path from a start location (P 0 ) through the environment, the sensor generating a sequence of images, each image associated with a respective estimated sensor location and comprising a point cloud having a plurality of vertices, each vertex comprising an (x,y,z)-tuple and image information for the tuple. The sequence of estimated sensor locations is sampled to provide a pose graph (P) comprising a linked sequence of nodes, each corresponding to a respective estimated sensor location. For each node of the pose graph (P), a respective cloud slice (C) comprising at least of portion of the point cloud for the sampled sensor location is acquired. A drift between an actual sensor location (P i+1 ) and an estimated sensor location (P i ) on the path is determined. A corrected pose graph (P′) indicating a required transformation for each node of the pose graph (P) between the actual sensor location (P i+1 ) and the start location (P 0 ) to compensate for the determined drift is provided. The sequence of estimated sensor locations is sampled to provide a deformation graph (N) comprising a linked sequence of nodes, each corresponding to respective estimated sensor locations along the path. For at least a plurality of the vertices in the cloud slices, a closest set of K deformation graph nodes is identified and a respective blending function based on the respective distances of the identified graph nodes to a vertex is determined. Transformation coefficients for each node of the deformation graph are determined as a function of the 20 required transformation for each node of the pose graph (P) to compensate for the determined drift. Tuple coordinates for a vertex are transformed to compensate for sensor drift as a function of the blending function and the transformation coefficients for the K deformation graph nodes closest to the vertex.

First claim

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The invention claimed is: 1. A method for mapping an environment comprising: moving a sensor along a path from a start location (P 0 ) through said environment, said sensor generating a sequence of images, each image associated with a respective estimated sensor location and comprising a point cloud having a plurality of vertices, each vertex comprising an (x,y,z)-tuple and image information for said tuple, sampling said sequence of estimated sensor locations to provide a pose graph (P) comprising a linked sequence of nodes, each corresponding to a respective estimated sensor location, for each node of the pose graph (P), acquiring a respective cloud slice (C) comprising at least of portion of said point cloud for said sampled sensor location; determining a drift between an actual sensor location (P i+1 ) and an estimated sensor location (P i ) on said path; providing a corrected pose graph (P′) indicating a required transformation for each node of the pose graph (P) between said actual sensor location (P i+1 ) and said start location (P 0 ) to compensate for said determined drift; sampling said sequence of estimated sensor locations to provide a deformation graph (N) comprising a linked sequence of nodes, each corresponding to respective estimated sensor locations along said path, for at least a plurality of said vertices in said cloud slices, identifying a closest set of K deformation graph nodes and determining a respective blending function based on the respective distances of said identified graph nodes to a vertex; determining transformation coefficients for each node of said deformation graph as a function of the required transformation for each node of the pose graph (P) to compensate for said determined drift; and transforming tuple coordinates for a vertex to compensate for sensor drift as a function of said blending function and said transformation coefficients for said K deformation graph nodes closest to said vertex. 2. A method according to claim 1 wherein said step of determining a drift comprises: for at least some images of said sequence of images, identifying at least one distinctive feature; responsive to identifying matching distinctive features in two images, a first one of which was acquired at said start location and a second one of which was acquired at an estimated sensor location (P i ) along said path, aligning said matched distinctive feature in said images to determine the drift between an actual sensor location (P i+1 ) and said estimated sensor location (P i ). 3. A method according to claim 1 wherein said transformation coefficients include coefficients defining at least: a translation, a rotation and a projection for a vertex. 4. A method according to claim 3 wherein said transformation coefficients further include coefficients defining: stretching, shearing, contraction or twisting for a vertex. 5. A method according to claim 1 wherein said image information includes at least intensity information for a vertex. 6. A method according to claim 5 wherein said image information includes colour information for a vertex. 7. A method according to claim 1 wherein said transformed vertex comprises a vertex of the point cloud. 8. A method according to claim 1 wherein said transformed vertex comprises a vertex comprising real-world tuple coordinates and further comprising retrieving image information from said point cloud based on a transformation of said real-world tuple coordinates based on an inversion of said transformation coefficients. 9. A method according to claim 1 wherein determining said transformation coefficients comprises iteratively: calculating a set of candidate transformation coefficients for said deformation graph nodes (N); calculating an error value (E) as a function of the projected transformations of said pose graph nodes (φ( )) based on said set of candidate deformation graph transformation coefficients; and choosing a set of deformation graph transformation coefficients when said error is minimized. 10. A method according to claim 9 wherein said error value E comprises: E=w rot E rot +w reg E reg +w con P E con P +w feat E feat where w rot , w reg , w con P and w feat are blending coefficients and where E rot is a function of the extent of rotation produced by a candidate set of deformation graph node coefficients; E feat is a function of a difference between the location of a distinctive feature in an image associated with a pose graph node induced by a candidate set of deformation node coefficients and the required transformation of the distinctive feature; E reg is a function of the variation in extent of translation and/or rotation produced by a candidate set of deformation graph node coefficients; and E con P is a function of a difference between the locations of pose graph nodes induced by a candidate set of deformation node coefficients and the required transformation of the pose graph nodes. 11. A method according to claim 10 wherein: w rot =1; w reg =10; w con P =100; w feat =100. 12. A method according to claim 10 wherein: E con P = ∑ i ⁢  ϕ ⁡ ( P i t ) - P i t ′  2 2 where, φ( ) is a translational mapping of a pose graph node (P i ) induced by a candidate set of deformation node coefficients and P′ i t is the required translation of the pose graph node (P i ). 13. A method according to claim 10 wherein: E feat = ∑ i ⁢  ϕ ⁡ ( ( P i R ⁢ V q

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What does patent US9412173B2 cover?
A method for mapping an environment comprises moving a sensor along a path from a start location (P 0 ) through the environment, the sensor generating a sequence of images, each image associated with a respective estimated sensor location and comprising a point cloud having a plurality of vertices, each vertex comprising an (x,y,z)-tuple and image information for the tuple. The sequence of esti…
Who is the assignee on this patent?
Nat Univ Of Ireland Maynooth, Massachusetts Inst Technology
What technology area does this patent fall under?
Primary CPC classification G06T7/0071. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 09 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).