Multi-channel up-conversion infrared spectrometer and method of detecting a spectral distribution of light

Patent metadata

Field	Value
Publication number	US-9410846-B2
Application number	US-201414900329-A
Country	US
Kind code	B2
Filing date	Jul 9, 2014
Priority date	Jul 9, 2013
Publication date	Aug 9, 2016
Grant date	Aug 9, 2016

Abstract

A multi-channel infrared spectrometer for detecting an infrared spectrum of light received from an object. The spectrometer comprises a wavelength converter system comprising a nonlinear material and having an input side and an output side. The wavelength converter system comprises at least a first up-conversion channel and a second up-conversion channel, and is arranged such that light traversing the wavelength converter system at different angles in the nonlinear material is imaged into different positions in an image plane. The first up-conversion channel is configurable for phase-matching infrared light in a first input wavelength range incident on the first side and light in a first output wavelength range output on the second side, and correspondingly, the second up-conversion channel is configurable for phase-matching infrared light in a second input wavelength range incident on the first side into light in a second output wavelength range output on the second side. The spectrometer further comprises a demultiplexer configured for demultiplexing light in the first up-conversion channel and light in the second up-conversion channel. The demultiplexer is located on the first side or the second side of the wavelength converter system. Finally, the spectrometer comprises a spatially resolved detector arranged in the image plane to detect light in the first output wavelength range and second output wavelength range output of the wavelength converter system.

First claim

The invention claimed is:

1. Infrared spectrometer for detecting an infrared spectrum of light received from an object, comprising:
a wavelength converter system comprising a nonlinear material and having an input side and an output side, the wavelength converter system comprising at least a first up-conversion channel and a second up-conversion channel, the wavelength converter system being arranged such that light traversing the wavelength converter system at different angles in the nonlinear material is imaged into different positions in an image plane,
the first up-conversion channel being configurable for phase-matching infrared light in a first input wavelength range incident on the first side and light in a first output wavelength range output on the second side, and concurrently,
the second up-conversion channel being configurable for phase-matching infrared light in a second input wavelength range incident on the first side into light in a second output wavelength range output on the second side,

a demultiplexer configured for demultiplexing light in the first up-conversion channel and light in the second up-conversion channel, the demultiplexer being located on the first side of the wavelength converter system, and
a spatially resolved detector arranged in the image plane to detect light in the first output wavelength range and second output wavelength range output of the wavelength converter system.

2. The spectrometer according to claim 1 , wherein the first input wavelength range is in the range of 1.5 μm-300 μm, 2 μm-5 μm, 5-10 μm, 10 μm-30 μm, or 30 μm-300 μm.

3. The spectrometer according to claim 1 , wherein the first output wavelength range is in the range of 0.3 μm-1.2 μm, 0.8 μm-2.2 μm, 0.4 μm-1.1 μm, 0.9 μm-2.0 μm, 0.45 μm-0.7 μm, or 1.0 μm-1.8 μm.

4. The spectrometer according to claim 1 , wherein the first output wavelength range and the second output wavelength range substantially coincide.

5. The spectrometer according to claim 1 , wherein the wavelength converter system is a continuous wave CW converter system.

6. The spectrometer according to claim 1 , wherein the wavelength up-conversion channels are arranged in parallel.

7. The spectrometer according to claim 1 , wherein the wavelength up-conversion channels are arranged in series.

8. The spectrometer according to claim 1 , wherein the wavelength converter system comprises a mixing laser configured for generating mixing laser light within the nonlinear material, the mixing laser light having a mixing laser wavelength, wherein the nonlinear material is configurable to phase-match the mixing laser wavelength, the first input wavelength range and the first output wavelength range, thereby forming the first wavelength up-conversion channel.

9. The spectrometer according to claim 8 , wherein the difference in phase-matching condition between the first and the second up-conversion channels are achieved by one or more of the following: a difference in propagation angle of the mixing laser relative to a crystal axis of the nonlinear crystal, a different state of polarization, or a different quasi-phase matching.

10. The spectrometer according to claim 1 , wherein the spatially resolved detector comprises a two-dimensional detector array.

11. The spectrometer according to claim 1 , wherein the spatially resolved detector comprises a linear detector array.

12. A method of detecting a spectral distribution of input light within an extended input wavelength range, the method comprising:
providing at least a first and a second wavelength up-conversion channel,
the first wavelength up-conversion channel being configured for phase-matching a first input wavelength range and enabling wavelength conversion of the first input wavelength range into a first output wavelength range, and
the second wavelength up-conversion channel being concurrently configured for phase-matching a second input wavelength range and enabling wavelength conversion of the second input wavelength range into a second output wavelength range,
converting light in a first sub-range of the extended input wavelength range comprising wavelengths in the first input wavelength range into a first output signal in the first wavelength up-conversion channel, and converting light in a second sub-range of the extended input wavelength range comprising wavelengths in the second input wavelength range into a second output signal in the second wavelength up-conversion channel,
detecting a spatial intensity distribution of the first output signal and the second output signal, respectively, with a spatially resolved detector, and
calculating the spectral distribution in the first sub-range from the detected spatial intensity distribution of the first output signal, and calculating the spectral distribution in the second sub-range from the detected spatial intensity distribution of the second output signal.

13. The method according to claim 12 , wherein the method further comprises demultiplexing light in the first sub-range and in the second sub-range so that light in the first sub-range is selectively coupled to the first wavelength up-conversion channel, and light in the second sub-range is selectively coupled to the second wavelength up-conversion channel.

14. The method according to claim 12 , wherein the method further comprises demultiplexing the first output signal and the second output signal so that the output signals are directed to separate detector regions.

Assignees

• Univ Danmarks Tekniske

Inventors

• Tidemand-Lichtenberg Peter
• Dam Jeppe Seidelin
• Pedersen Christian

Classifications

• G01J3/0294

  Multi-channel spectroscopy · CPC title

• G01J3/0297 Primary

  Constructional arrangements for removing other types of optical noise or for performing calibration · CPC title

• G01J3/2803

  using photoelectric array detector · CPC title

• G01J3/2823

  Imaging spectrometer · CPC title

• G01J3/08 Primary

  Beam switching arrangements · CPC title