Electrospray ionization interface to high pressure mass spectrometry and related methods

Patent metadata

Field	Value
Publication number	US-9406492-B1
Application number	US-201514710344-A
Country	US
Kind code	B1
Filing date	May 12, 2015
Priority date	May 12, 2015
Publication date	Aug 2, 2016
Grant date	Aug 2, 2016

Abstract

An electrospray ionization (ESI)-mass spectrometer analysis systems include an ESI device with at least one emitter configured to electrospray ions and a mass spectrometer in fluid communication with the at least one emitter of the ESI device. The mass spectrometer includes a mass analyzer held in a vacuum chamber. The vacuum chamber is configured to have a high (background/gas) pressure of about 50 mTorr or greater during operation. During operation, the ESI device is configured to either; (a) electrospray ions into a spatial region external to the vacuum chamber and at atmospheric pressure, the spatial extent being adjacent to an inlet device attached to the vacuum chamber, the inlet device intakes the electrosprayed ions external to the vacuum chamber with the mass analyzer and discharges the ions into the vacuum chamber with the mass analyzer; or (b) electrospray ions directly into the vacuum chamber with the mass analyzer.

First claim

That which is claimed:

1. An electrospray ionization (ESI)-mass spectrometer analysis system, comprising:
an ESI device with at least one emitter configured to electrospray ions; and
a mass spectrometer in fluid communication with the at least one emitter of the ESI device comprising:
a mass analyzer held in a vacuum chamber, wherein the vacuum chamber is configured to have a pressure of between about 50 mTorr and about 2000 Torr during operation; and
a detector in communication with the mass analyzer;
an inlet device with an internal end in the vacuum chamber with the mass analyzer and with an external end outside the vacuum chamber in a spatial region in which a gas pressure corresponds to atmospheric pressure, wherein the external end of the inlet device is spaced apart from the at least one emitter; and
a direct current (DC) power supply connected to the inlet device at a location that is external to the vacuum chamber, wherein, during operation;

the ESI device is configured to
electrospray ions into the spatial region; the inlet device intakes the electrosprayed ions from the spatial region and discharges the ions directly into the vacuum chamber; and the DC power supply applies a non-zero voltage to the inlet device.

2. The system of claim 1 , wherein the detector is held in the vacuum chamber with the mass analyzer.

3. The system of claim 2 , wherein the detector is spaced apart from the mass analyzer in the vacuum chamber by a distance of about 1 mm to about 10 mm, and wherein the pressure in the vacuum chamber with the detector and mass analyzer is between 50 mTorr and 100 Torr.

4. The system of claim 1 , wherein the external end of the inlet device is spaced apart from the ESI device a distance of between about 1 mm and about 50 mm, and wherein the internal end of the inlet device is spaced apart from an ion entrance of the mass analyzer by a distance that is between 1-50 mm.

5. The system of claim 4 , wherein the inlet device is tubular with at least one inlet aperture that is in fluid communication with at least one longitudinally extending channel extending therethrough.

6. The system of claim 1 , wherein: the inlet device includes at least one inlet aperture, and the external end is spaced apart from the ESI device by between about 1 mm and about 50 mm; and the inlet device is planar and conductive, and has a thickness that is between about 0.100 mm and about 5 mm.

7. The system of claim 4 , further comprising a compartment that holds the ESI device spaced apart from and in an orientation aligned with the external end of the inlet device, wherein the compartment comprises a buffer gas inlet, so that, during operation, buffer gas is introduced into the compartment, and then transmitted into the vacuum chamber with the mass analyzer via the inlet device.

8. The system of claim 1 , wherein the internal end of the inlet device is positioned inside an aperture of an electrode in the vacuum chamber.

9. The system of claim 1 , further comprising a second power supply configured to apply inputs to the ESI device during operation, and a vacuum pump in communication with the vacuum chamber.

10. The system of claim 1 , wherein the mass analyzer comprises an ion trap comprising an injector endcap electrode, a ring electrode and an ejector endcap electrode.

11. The system of claim 4 , wherein the inlet device has a conical shaped tip with at least one inlet aperture at the external end.

12. The system of claim 4 , wherein the at least one emitter is spaced apart from an entrance aperture of the mass analyzer by a distance of between 1 cm and 15 cm.

13. The system of claim 1 , further comprising a tube or ion funnel electrode assembly in the vacuum chamber with the mass analyzer.

14. The system of claim 1 , wherein the mass analyzer is an ion trap mass analyzer that is either:
(a) a cylindrical ion trap (CIT) with at least one of dimensions r 0 or z 0 less than about 1 mm; or
(b) a Stretched Length Ion Trap (SLIT) with a central electrode having an aperture which extends along a longitudinal direction and the central electrode that surrounds the aperture in a lateral plane perpendicular to the longitudinal direction to define a transverse cavity for trapping charged particles, wherein the aperture in the central electrode is elongated in a lateral plane, having a ratio of a major dimension to a minor dimension that is greater than 1.5.

15. The system of claim 1 , wherein the mass analyzer is a cylindrical ion trap (CIT) with dimensions r o between about 500 μm and about 100 μm.

16. The system of claim 1 , further comprising a focusing electrode in the vacuum chamber.

17. The system of claim 1 , wherein the external end of the inlet device is spaced apart from the ESI device a distance of between about 1 mm and about 50 mm.

18. The system of claim 1 , wherein an external end of the inlet device is spaced apart from the ESI device a distance of between about 5 mm and about 10 mm.

19. The system of claim 1 , further comprising a barrier member spaced apart from, and extending between, the ESI device and the external end of the inlet device.

20. The system of claim 19 , wherein the barrier member is a single sided copper clad circuit board.

21. The system of claim 1 , wherein the ESI device is a microfluidic chip, and wherein a segment of the microfluidic chip with the at least one emitter extends through a slot in a barrier member toward the inlet device.

22. The system of claim 1 , wherein the inlet device is planar and conductive and has a thickness that is between about 0.100 mm and about 5 mm, and wherein an axial length of an inlet channel of the inlet device is not more than about 50% greater in size relative to a diameter of the inlet channel.

23. A method of analyzing a sample, comprising:
electrospraying ions from an electrospray ionization (ESI) device into a spatial region external to a vacuum chamber enclosing a mass analyzer, the spatial region being at atmospheric pressure;
applying a voltage to an external portion of an inlet device having an external end positioned in the spatial region and an internal end positioned inside the vacuum chamber;
transporting the ions through the inlet device directly into the vacuum chamber, wherein a gas pressure in the mass analyzer is between 50 mTorr and 100 Torr;
trapping the ions in the mass analyzer;
selectively ejecting the ions from the mass analyzer,
detecting electrical signals corresponding to the ejected ions using at least one detector; and
generating mass spectral information based on the detected electrical signals to determine information about the sample.

24. The method of claim 23 , wherein the electrospraying is carried out from a tip of a microfluidic device having at least one electrospray emitter used to electrospray the ions, and wherein the at least one emitter is positioned between about 1 mm and 50 mm from the external end of the inlet device.

25. The method of claim 24 , wherein a barrier member resides between the ESI device and the external end of the inlet device.

26. The method of claim 23 , wherein the inlet device is attached to a wall of the vacuum chamber, and wherein the internal end is positioned between about 1 mm and about 50 mm from an entrance aperture of the mass analyzer.

27. The method of claim 23 , wherein the mass analyzer is a miniature cylindrical ion trap (CIT), and

Assignees

• Univ North Carolina Chapel Hill

Inventors

• Ramsey John Michael
• Gilliland Jr William Mckay

Classifications

• B01L3/502715

  characterised by interfacing components, e.g. fluidic, electrical, optical or mechanical interfaces · CPC title

• H01J49/165 Primary

  Electrospray ionisation · CPC title

• H01J49/24

  Vacuum systems, e.g. maintaining desired pressures · CPC title

• H01J49/0031

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

• H01J49/04

  Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components · CPC title