Dual mode ferroelectric random access memory (FRAM) cell apparatus and methods with imprinted read-only (RO) data

US9401196B1 · US · B1

Patent metadata
FieldValue
Publication numberUS-9401196-B1
Application numberUS-201514737247-A
CountryUS
Kind codeB1
Filing dateJun 11, 2015
Priority dateJun 11, 2015
Publication dateJul 26, 2016
Grant dateJul 26, 2016

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Abstract

Official abstract text for this publication.

Read-only (“RO”) data to be permanently imprinted in storage cells of a memory array are written to the memory array. One or more over-stress conditions such as heat, over-voltage, over-current and/or mechanical stress are then applied to the memory array or to individual storage cells within the memory array. The over-stress condition(s) act upon one or more state-determining elements of the storage cells to imprint the RO data. The over-stress condition permanently alters a value of a state-determining property of the state-determining element without incapacitating normal operation of the storage cell. The altered value of the state-determining property biases the cell according to the state of the RO data bit. The bias is detectable in the cell read-out signal. A pre-written ferroelectric random-access memory (“FRAM”) array is baked. Baking traps electric dipoles oriented in a direction corresponding to a state of the pre-written data and forms am RO data imprint.

First claim

Opening claim text (preview).

What is claimed is: 1. A dual mode memory apparatus, comprising: an array of ferroelectric random access memory (FRAM) storage cells, each FRAM cell consisting of two half-cells (2T/2C); a switching matrix coupled to each FRAM storage cell to switch a bit line associated with each half-cell for write access to the FRAM cell and read access from the FRAM cell; and dual mode state control logic coupled to the switching matrix to control switches associated with the switching matrix to enable full cell read access and both full cell and half-cell write access and to sequence the switches according to a first sequence to perform read operations of read/write (“R/W”) data and to sequence the switches according to a second sequence to perform read operations of imprinted read-only (“RO”) data. 2. The dual mode memory apparatus of claim 1 , the switching matrix further comprising: a first write switch coupled to a first half-cell bit line of the FRAM storage cell; a second write switch coupled to a second half-cell bit line of the FRAM storage cell; a first read switch coupled to the first half-cell bit line; and a second read switch coupled to the second half-cell bit line. 3. The dual mode memory apparatus of claim 2 , further comprising: a non-negating write driver coupled to the first and second write switches; and a negating write driver coupled to the second write switch. 4. The dual mode memory apparatus of claim 2 , further comprising: a sense amplifier coupled to the first and second read switches to sense a voltage difference between the first and second half-cell bit lines. 5. The dual mode memory apparatus of claim 2 , further comprising: a second sense amplifier coupled to the first and second read switches, the second sense amplifier biased to sense an imprint voltage difference between the first and second half-cell bit lines of an imprinted FRAM cell during a read operation after writing both half-cells to a same state; and an output of the dual-mode state control logic to select the second sense amplifier when performing the read operation after writing both half-cells to the same state.

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Classifications

  • Electrical properties, e.g. testing or measuring of resistance, deep levels or capacitance-voltage characteristics · CPC title

  • G11C11/221Primary

    using ferroelectric capacitors · CPC title

  • Writing or programming circuits or methods · CPC title

  • Reading or sensing circuits or methods · CPC title

  • Memory devices with multiple cells per bit, e.g. twin-cells · CPC title

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What does patent US9401196B1 cover?
Read-only (“RO”) data to be permanently imprinted in storage cells of a memory array are written to the memory array. One or more over-stress conditions such as heat, over-voltage, over-current and/or mechanical stress are then applied to the memory array or to individual storage cells within the memory array. The over-stress condition(s) act upon one or more state-determining elements of the s…
Who is the assignee on this patent?
Texas Instruments Inc
What technology area does this patent fall under?
Primary CPC classification G11C11/221. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 26 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).