X-ray fluorescence spectrometer comprising a gas blowing mechanism

US9400255B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9400255-B2
Application numberUS-201414219579-A
CountryUS
Kind codeB2
Filing dateMar 19, 2014
Priority dateMar 28, 2013
Publication dateJul 26, 2016
Grant dateJul 26, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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Abstract

Official abstract text for this publication.

An X-ray fluorescence spectrometer includes: a sample stage configured to place a sample thereon; an X-ray source configured to irradiate the sample with primary X-rays; a detector, which is configured to detect fluorescent X-rays produced from the sample irradiated with the primary X-rays, and which includes an X-ray incident window formed by a window material through which fluorescent X-rays is transmittable; and a gas blowing mechanism configured to blow a gas to at least one of an outer surface of the X-ray incident window and the sample stage.

First claim

Opening claim text (preview).

What is claimed is: 1. An X-ray fluorescence spectrometer comprising: a sample stage configured to place a sample thereon; an X-ray source configured to irradiate the sample with primary X-rays; a detector, which is configured to detect fluorescent X-rays produced from the sample irradiated with the primary X-rays, and which comprises an X-ray incident window formed by a window material through which fluorescent X-rays are transmittable; and a gas blowing mechanism comprising a passage extending along a periphery of the detector up to the X-ray incident window and configured to blow gas through the passage to an outer surface of the X-ray incident window. 2. The X-ray fluorescence spectrometer according to claim 1 , wherein the gas blowing mechanism comprises a mechanism which also blows the gas to the sample stage. 3. The X-ray fluorescence spectrometer according to claim 1 , wherein the gas comprises helium (He). 4. The X-ray fluorescence spectrometer according to claim 1 , wherein the detector comprises a collimator section, which is disposed in a periphery of the X-ray incident window, and which is configured to set an opening degree of the X-ray incident window, wherein the gas blowing mechanism comprises: a supply source of the gas; a gas pipe, a base end of which is connected to the supply source; and an internal gas flow passage, which is disposed in the collimator section, and in which a tip end of the gas pipe is connected to a base end of the internal gas flow passage, wherein the internal gas flow passage comprises a plurality of blow out holes for blowing out the gas at a tip end of the internal gas flow passage, and wherein the plurality of blow out holes are disposed in the periphery of the X-ray incident window so as to blow out the gas toward the outer surface of the X-ray incident window. 5. The X-ray fluorescence spectrometer according to claim 1 , wherein the detector comprises a collimator section, which is disposed in a periphery of the X-ray incident window, and which is configured to set an opening degree of the X-ray incident window, and wherein the gas blowing mechanism comprises an internal gas flow passage, which is disposed in the collimator section, and which is branched off to: a plurality of first holes disposed in the periphery of the X-ray incident window so as to blow out the gas toward the outer surface of the X-ray incident window; and a plurality of second holes opened in a tip end surface of the collimator section so as to blow out the gas toward the sample stage. 6. An X-ray fluorescence spectrometer comprising: a sample stage configured to place a sample thereon; an X-ray source configured to irradiate the sample with primary X-rays; a detector, which is configured to detect fluorescent X-rays produced from the sample irradiated with the primary X-rays, and which comprises an X-ray incident window formed by a window material through which fluorescent X-rays are transmittable; and a gas blowing mechanism configured to blow gas to an outer surface of the X-ray incident window, wherein the gas blowing mechanism comprises an internal gas flow passage, which is disposed around the periphery of the detector, and which is branched off to: a plurality of first holes disposed in the periphery of the X-ray incident window so as to blow out the gas toward the outer surface of the X-ray incident window; and a plurality of second holes opened spaced from the plurality of first holes in a direction further away from the periphery of the X-ray incident window so as to blow out the gas toward the sample stage. 7. The X-ray fluorescence spectrometer according to claim 6 , wherein the gas blowing mechanism comprises a passage extending along a periphery of the detector to the X-ray incident window. 8. The X-ray fluorescence spectrometer according to claim 6 , wherein the gas comprises helium (He).

Assignees

Inventors

Classifications

  • G01N23/223Primary

    by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence · CPC title

  • X-ray fluorescence · CPC title

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What does patent US9400255B2 cover?
An X-ray fluorescence spectrometer includes: a sample stage configured to place a sample thereon; an X-ray source configured to irradiate the sample with primary X-rays; a detector, which is configured to detect fluorescent X-rays produced from the sample irradiated with the primary X-rays, and which includes an X-ray incident window formed by a window material through which fluorescent X-rays …
Who is the assignee on this patent?
Hitachi High-Tech Science Corp
What technology area does this patent fall under?
Primary CPC classification G01N23/223. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 26 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).