Broadband or mid-infrared fiber light sources

US9400215B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9400215-B2
Application numberUS-201514715960-A
CountryUS
Kind codeB2
Filing dateMay 19, 2015
Priority dateNov 18, 2005
Publication dateJul 26, 2016
Grant dateJul 26, 2016

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A diagnostic system includes a semiconductor light emitter(s) configured to generate an input beam having a wavelength shorter than about 2.5 microns. An optical amplifier(s) configured to receive a portion of the input beam communicates an intermediate beam to an output end of the optical amplifier. An optical fiber(s) configured to receive a portion of the intermediate beam forms an output beam with an associated wavelength. A subsystem having lenses or mirrors receives a received portion of the output beam and delivers a delivered portion of the output beam to a sample. The delivered portion has a temporal duration greater than approximately 30 picoseconds and a repetition rate between continuous wave and Megahertz or higher. A time averaged intensity of the delivered portion is less than approximately 50 MW/cm 2 . A light detection system collects and analyzes a fraction of the delivered portion that reflects or transmits from the sample.

First claim

Opening claim text (preview).

What is claimed is: 1. A diagnostic system comprising: one or more semiconductor light emitters configured to generate an input beam, wherein at least a portion of the input beam comprises a wavelength shorter than about 2.5 microns; one or more optical amplifiers configured to receive at least the portion of the input beam and to communicate an intermediate beam to an output end of the one or more optical amplifiers; and one or more optical fibers configured to receive at least a portion of the intermediate beam and to form an output beam with an output beam wavelength; a subsystem comprising one or more lenses or mirrors configured to receive a received portion of the output beam and to deliver a delivered portion of the output beam to a sample, wherein the delivered portion of the output beam has a temporal duration greater than approximately 30 picoseconds, wherein the delivered portion of the output beam has a repetition rate between continuous wave and Megahertz or higher, and wherein a time averaged intensity of the delivered portion of the output beam is less than approximately 50 MW/cm 2 ; and a light detection system capable of collecting and analyzing at least a fraction of the delivered portion of the output beam that reflects or transmits from the sample. 2. The diagnostic system of claim 1 , wherein at least one of the one or more optical amplifiers comprises a cladding-pumped fiber amplifier or laser. 3. The diagnostic system of claim 1 , wherein the light detection system further comprises lock-in or phase locked techniques synchronous with a pulsed mode signal. 4. The diagnostic system of claim 1 , wherein the light detection system further comprises a grating and a linear array of semiconductor detectors or a multi-spectral detector. 5. The diagnostic system of claim 1 , wherein the light detection system further comprises a slit, a grating, and a MEMS-based device followed by a detector. 6. The diagnostic system of claim 1 , wherein the light detection system further comprises Fourier Transform Infrared spectroscopy. 7. The diagnostic system of claim 1 , wherein the light detection system performs spectral fingerprinting, wherein several wavelengths of absorption or reflection are measured either substantially simultaneously or in a time sequential fashion. 8. A diagnostic system comprising: a plurality of semiconductor light emitters, each of the light emitters configured to generate an optical beam; a beam combiner configured to receive at least a portion of the optical beams from the plurality of semiconductor light emitters and to generate a multiplexed optical beam; and an optical fiber or waveguide configured to receive at least a portion of the multiplexed optical beam and to communicate the at least a portion of the multiplexed optical beam to form an output beam having at least one wavelength; a subsystem comprising one or more lenses or mirrors configured to receive a received portion of the output beam and to deliver a delivered portion of the output beam to a sample comprising skin or tissue, wherein the delivered portion of the output beam has a temporal duration greater than approximately 30 picoseconds, wherein the delivered portion of the output beam has a repetition rate between continuous wave and Megahertz or higher, and wherein a time averaged intensity of the delivered portion of the output beam is less than approximately 50 MW/cm 2 ; and a light detection system capable of collecting and analyzing at least a fraction of the delivered portion of the output beam that reflects or transmits from the sample. 9. The diagnostic system of claim 8 , wherein the light detection system further comprises lock-in or phase locked techniques synchronous with a pulsed mode signal. 10. The diagnostic system of claim 8 , wherein the light detection system further comprises a grating and a linear array of semiconductor detectors or a multi-spectral detector. 11. The diagnostic system of claim 8 , wherein the light detection system further comprises a slit, a grating, and a MEMS-based device followed by a detector. 12. The diagnostic system of claim 8 , wherein the light detection system further comprises Fourier Transform Infrared spectroscopy. 13. The diagnostic system of claim 8 , wherein the light detection system analyzes overtone and combinational bands of chemical species within the sample. 14. The diagnostic system of claim 8 , wherein the light detection system performs spectral fingerprinting, wherein several wavelengths of absorption or reflection are measured either substantially simultaneously or in a time sequential fashion, and wherein the spectral fingerprinting examines a spectral pattern of absorption or reflection to identify a chemical composition. 15. A diagnostic system comprising: one or more semiconductor light emitters configured to generate an optical beam, wherein at least a portion of the optical beam comprises a wavelength shorter than about 2.5 microns; an optical fiber or waveguide configured to receive at least a portion of the optical beam and to communicate the at least a portion of the optical beam to form an output beam having at least one wavelength; a subsystem comprising one or more lenses or mirrors configured to receive a received portion of the output beam and to deliver a delivered portion of the output beam to a sample comprising skin or tissue, wherein the delivered portion of the output beam has a temporal duration greater than approximately 30 picoseconds, wherein the delivered portion of the output beam has a repetition rate between continuous wave and Megahertz or higher, and wherein a time averaged intensity of the delivered portion of the output beam is less than approximately 50 MW/cm 2 ; and a light detection system collecting and analyzing at least a fraction of the delivered portion of the output beam that reflects or transmits from the sample, wherein the light detection system further comprises lock-in or phase locked techniques synchronous with a pulsed mode signal. 16. The diagnostic system of claim 15 , wherein the pulsed mode signal is related to a pulse repetition rate of the one or more semiconductor light emitters. 17. The diagnostic system of claim 15 , wherein the light detection system further comprises a slit, a grating, and a MEMS-based device followed by a detector. 18. The diagnostic system of claim 15 , wherein the light detection system further comprises a Fourier Transform Infrared spectroscopy or a grating with a linear array of semiconductor detectors or a multi-spectral detector. 19. The diagnostic system of claim 15 , wherein the light detection system analyzes overtone and combinational bands of chemical species within the sample. 20. The diagnostic system of claim 15 , wherein the light detection system performs spectral fingerprinting, wherein several wavelengths of absorption or reflection are measured either substantially simultaneously or in a time sequential fashion, and wherein the spectral fingerprinting examines a spectral pattern of absorption or reflection to identify a chemical composition.

Assignees

Inventors

Classifications

  • Fibre characterized by a specific dispersion, e.g. for pulse shaping in soliton lasers or for dispersion compensating [DCF] · CPC title

  • Multi-wavelength lasing · CPC title

  • Plural sources · CPC title

  • for nonlinear frequency conversion, e.g. second harmonic generation [SHG] or sum- or difference-frequency generation outside the laser cavity · CPC title

  • Multi-mode pumping · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US9400215B2 cover?
A diagnostic system includes a semiconductor light emitter(s) configured to generate an input beam having a wavelength shorter than about 2.5 microns. An optical amplifier(s) configured to receive a portion of the input beam communicates an intermediate beam to an output end of the optical amplifier. An optical fiber(s) configured to receive a portion of the intermediate beam forms an output be…
Who is the assignee on this patent?
Omni Medsci Inc
What technology area does this patent fall under?
Primary CPC classification G01J3/42. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 26 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).