Information processing device and method
US-2024221282-A1 · Jul 4, 2024 · US
US9396755B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9396755-B2 |
| Application number | US-201313772143-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 20, 2013 |
| Priority date | Feb 20, 2013 |
| Publication date | Jul 19, 2016 |
| Grant date | Jul 19, 2016 |
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Data is stored in a hybrid drive that includes a magnetic storage medium and a non-volatile solid-state device using a temperature-defined data-storage policy. According to the temperature-defined data storage policy, the drive can perform operations for modulating the temperature of the drive, minimizing increased wear on memory cells in the non-volatile solid-state device, and/or preventing data stored in the non-volatile solid-state device from being lost.
Opening claim text (preview).
We claim: 1. A data storage device, comprising: a magnetic storage medium; a non-volatile solid-state device; and a controller configured to: detect a temperature of the data storage device that is greater than a predetermined temperature; determine a maximum allowable number and an actual number of dirty memory blocks in the non-volatile solid-state device, wherein each dirty memory block in the non-volatile solid-state device stores data that are not also stored on the magnetic storage medium; execute a write command by writing data associated with the write command to one of the non-volatile solid-state device and the magnetic storage medium, so that the actual number of dirty memory blocks in the non-volatile solid-state device is, after the writing, less than or equal to the maximum allowable number of memory blocks in the non-volatile solid-state device; and if the actual number of dirty memory blocks in the non-volatile solid-state device is greater than the maximum allowable number of dirty memory blocks in the non-volatile solid-state device, copy a number of dirty memory blocks in the non-volatile solid-state device to the magnetic storage medium to decrease the actual number of dirty memory blocks in the non-volatile solid-state device. 2. The data storage device of claim 1 , wherein the temperature of the data storage device comprises a temperature of the non-volatile solid-state device. 3. The data storage device of claim 1 , wherein the controller is further configured to execute the write command by changing a rate of data transfer to the non-volatile solid-state device by executing write commands to the non-volatile solid-state device at a lower rate of data transfer to the non-volatile solid-state device than a normal rate of data transfer to the non-volatile solid-state device. 4. The data storage device of claim 3 , wherein the controller is further configured to periodically pause execution of the write commands to the non-volatile solid-state device to achieve the lower rate of data transfer to the non-volatile solid-state device. 5. The data storage device of claim 1 , wherein the controller is further configured to, when the detected temperature is greater than the predetermined temperature, execute a write command to the magnetic storage medium at a lower rate of data transfer to the magnetic storage medium than a normal rate of data transfer to the magnetic storage medium. 6. The data storage device of claim 1 , wherein the maximum allowable number is a function of the temperature that is greater than the predetermined temperature. 7. The data storage device of claim 1 , wherein the controller is further configured to: receive a flush-cache command; in response to the flush-cache command, write to the magnetic storage medium substantially all data stored in the dirty memory blocks in the non-volatile solid-state device; and upon completion of writing to the magnetic storage medium substantially all data stored in the dirty memory blocks in the non-volatile solid-state device, signal completion of the flush-cache command. 8. The data storage device of claim 1 , wherein the controller carries out the copying until the actual number of dirty memory blocks in the non-volatile solid-state device is less than the maximum allowable number of dirty memory blocks in the non-volatile solid-state device.
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