Electrical connection assembly and testing method thereof

Patent metadata

Field	Value
Publication number	US-9395401-B2
Application number	US-201314019475-A
Country	US
Kind code	B2
Filing date	Sep 5, 2013
Priority date	Sep 6, 2012
Publication date	Jul 19, 2016
Grant date	Jul 19, 2016

Abstract

An electrical connection assembly is disclosed. The electrical connection assembly includes a first circuit board and a second circuit board. The first circuit board has a plurality of first signal electrodes and at least one first test electrode, wherein the first signal electrodes and the first test electrode are arranged in a spaced manner on the same side of the first circuit board. The second circuit board has a plurality of second signal electrodes and at least one second test electrode, wherein the second signal electrodes and the second test electrode are arranged in a spaced manner on the same side of the second circuit board, wherein the first signal electrodes are electrically connected to the second signal electrodes and the first test electrode is electrically connected to the second test electrode to form a testing loop.

First claim

What is claimed is:

1. An electrical connection device, comprising:
a first circuit board, having a plurality of first signal electrodes and at least one first test electrode, wherein the first signal electrodes and the first test electrode are arranged in a spaced manner on a same side of the first circuit board; and
a second circuit board, having a plurality of second signal electrodes and at least one second test electrode, wherein the second signal electrodes and the second test electrode are arranged in a spaced manner on a same side of the second circuit board, wherein the first signal electrodes are electrically connected to the second signal electrodes, and the first test electrode is electrically connected to the second test electrode to form a testing loop;
wherein the first test electrode and the second test electrode are configured to determine whether the first signal electrodes and the second signal electrodes are electrically connected to each other by detecting whether the testing loop is a short circuit or an open circuit.

2. The electrical connection device as claimed in claim 1 , wherein an amount of the first test electrodes is plural, an amount of the second test electrode is one, and the first test electrodes and the second test electrode are electrically connected to form the testing loop.

3. The electrical connection device as claimed in claim 1 , wherein an amount of the first test electrodes and the second test electrodes are both plural, the electrical connection device further comprises at least one second test wire, the second test electrodes are electrically connected to each other through the second test wire, and the second test electrodes are electrically connected to a corresponding one of the first test electrodes to form the testing loop.

4. The electrical connection device as claimed in claim 1 , wherein an amount of the first test electrodes and the second test electrodes are both plural, the first test electrodes and the first signal electrodes are alternatively disposed, an amount of the first test electrodes and an amount of the second test electrodes are equal and locations of the first test electrodes correspond to locations of the second test electrodes, and the second test electrodes and the second signal electrodes are alternatively disposed, wherein the first test electrodes are connected to a corresponding one of the second test electrodes to form a plurality of testing loops.

5. The electrical connection device as claimed in claim 2 , wherein the first circuit board further comprises a plurality of first test wires and a plurality of first test connection nodes, and the first test electrodes are electrically connected to a corresponding one of the first test connection nodes through a corresponding one of the first test wires.

6. The electrical connection device as claimed in claim 3 , wherein the first circuit board further comprises a plurality of first test wires and a plurality of first test connection nodes, and the first test electrodes are electrically connected to a corresponding one of the first test connection nodes through a corresponding one of the first test wires.

7. The electrical connection device as claimed in claim 4 , wherein the first circuit board further comprises a plurality of first test wires and a plurality of first test connection nodes, and the first test electrodes are electrically connected to a corresponding one of the first test connection nodes through a corresponding one of the first test wires, and the second circuit board further comprises a plurality of second test wires and a plurality of second test connection nodes, and the second test electrodes are electrically connected to a corresponding one of the second test connection nodes through a corresponding one of the second test wires.

8. The electrical connection device as claimed in claim 5 , wherein the first circuit board further comprises a first protection layer covering the first signal electrodes, the first test electrodes, the first test wires and the first test connection nodes.

9. The electrical connection device as claimed in claim 6 , wherein the first circuit board further comprises a first protection layer covering the first signal electrodes, the first test electrodes, the first test wires and the first test connection nodes.

10. The electrical connection device as claimed in claim 8 , wherein the first protection layer has a plurality of first openings located at locations corresponding to locations of the first test connection nodes.

11. The electrical connection device as claimed in claim 9 , wherein the first protection layer has a plurality of first openings located at locations corresponding to locations of the first test connection nodes.

12. The electrical connection device as claimed in claim 10 , wherein a diameter of each of the first openings is larger than 0.5 mm.

13. The electrical connection device as claimed in claim 11 , wherein a diameter of each of the first openings is larger than 0.5 mm.

14. The electrical connection device as claimed in claim 7 , wherein the first circuit board further comprises a first protection layer covering the first signal electrodes, the first test electrodes, the first test wires and the first test connection nodes, and the second circuit board further comprises a second protection layer covering the second signal electrodes, the second test electrodes, the second test wires and the second test connection nodes.

15. The electrical connection device as claimed in claim 14 , wherein the first protection layer has a plurality of first openings located at locations corresponding to locations of the first test connection nodes, and the second protection layer has a plurality of second openings located at locations corresponding to locations of the second test connection nodes.

16. The electrical connection device as claimed in claim 15 , wherein a diameter of each of the first openings and the second openings is larger than 0.5 mm.

17. The electrical connection device as claimed in claim 1 , further comprising an anisotropic conductive film disposed between the first circuit board and the second circuit board, wherein the anisotropic conductive film is configured to electrically connect the first signal electrodes to the second signal electrodes and electrically connect the first test electrode to the second test electrode.

18. The electrical connection device as claimed in claim 1 , wherein the first signal electrodes and the first test electrode have a same structure, and the second signal electrodes and the second test electrode have a same structure.

19. The electrical connection device as claimed in claim 1 , wherein the first circuit board is a flexible printed circuit board, and the second circuit board is a touch panel.

20. The electrical connection device as claimed in claim 1 , wherein the first circuit board further comprises at least one first dummy electrode, and the first dummy electrode and the first signal electrodes are arranged in a spaced manner on the same side of the first circuit board, and the second circuit board further comprises at least one second dummy electrode, and the second dummy electrode and the second signal electrodes are arranged in a spaced manner on the same side of the second circuit board, wherein locations of the first dummy electrode correspond to locations of the second dummy electrode.

21. A testing method of the electrical connection device as claimed in claim 1 , comprising the

Assignees

• Tpk Touch Solutions Xiamen Inc

Inventors

• Jiang Yau-Chen
• Wu Defa
• Yan Jianbin
• Lin Shaoting
• Wei Tsai-Kuei
• Bai Xiaoxin
• Ye Caijin

Classifications

• G01R31/54

  Testing for continuity · CPC title

• G01R31/66

  Testing of connections, e.g. of plugs or non-disconnectable joints (testing for incorrect line connections G01R31/55) · CPC title

• G01R31/2818 Primary

  using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors (G01R31/2805 takes precedence; printed circuits having, e.g. symbols, test patterns or visualisation means H05K1/0266) · CPC title

• G01R31/50

  Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections (testing of sparking plugs H01T13/58) · CPC title

• G01R31/2889

  Interfaces, e.g. between probe and tester (G01R31/31905 and G01R1/07364 take precedence) · CPC title