Imaging system
US-12169175-B2 · Dec 17, 2024 · US
US9395301B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9395301-B2 |
| Application number | US-201414504917-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 2, 2014 |
| Priority date | Oct 2, 2014 |
| Publication date | Jul 19, 2016 |
| Grant date | Jul 19, 2016 |
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A method of monitoring a surface temperature of an environmental barrier coating (EBC) of a hot gas component includes directing an excitation beam having a first wavelength at a layer of a temperature indicator formed on the hot gas component. The method also includes measuring a fluorescent radiation emitted by the temperature indicator. The fluorescent radiation has a second wavelength and an intensity. In addition, the method includes determining a surface temperature of the EBC based on the intensity of the second wavelength of the fluorescent radiation.
Opening claim text (preview).
What is claimed is: 1. A method of monitoring at least one of a temperature and erosion of an environmental barrier coating (EBC) of a hot gas component, said method comprising: directing an excitation beam having an excitation wavelength at the EBC deposited on an outer surface of the hot gas component, the EBC including at least a bond coat layer and an outer layer, the hot gas component being fabricated from a ceramic matrix composite (CMC); measuring a first fluorescent radiation emitted by the bond coat layer and a second fluorescent radiation emitted by the outer layer of the EBC, wherein the first fluorescent radiation includes a first wavelength and a first intensity, and the second fluorescent radiation includes a second wavelength and a second intensity, the second wavelength different from the first wavelength; and determining at least one of a surface temperature and an erosion amount of the EBC based on at least one of the wavelength and intensity of the measured first and second fluorescent radiations. 2. The method in accordance with claim 1 further comprising producing at a point of impact of the excitation beam at least one of a frequency up-conversion first fluorescent radiation and a frequency up-conversion second fluorescent radiation. 3. The method in accordance with claim 2 , wherein the excitation beam has the excitation wavelength in the range between about 700 nanometers and about 1200 nanometers. 4. The method in accordance with claim 1 further comprising producing at a point of impact of the excitation beam at least one of a frequency down-conversion first fluorescent radiation and a frequency down-conversion second fluorescent radiation. 5. The method in accordance with claim 4 , wherein the excitation beam has the excitation wavelength in the range between about 200 nanometers and about 400 nanometers. 6. The method in accordance with claim 1 , wherein directing an excitation beam comprises directing the excitation beam having an excitation wavelength at the EBC deposited on the outer surface of the hot gas component, the EBC including at least a bond coat layer and an outer layer, the hot gas component being fabricated from a ceramic matrix composite (CMC), the bond coat layer including at least one of a silicon metal and a silicide, and at least one first rare earth element (REE). 7. The method in accordance with claim 6 , wherein the outer layer includes at least one of a rare earth mono silicate and a rare earth di silicate, and at least one second REE, wherein the at least one second REE is different from the at least one first REE. 8. The method in accordance with claim 7 , wherein the first and second REE is selected from the group consisting of scandium, yttrium, lanthanum, cerium, praseodymium, neodymium, promethium, samarium, europium, gadolinium, terbium, dysprosium, holmium, erbium, thulium, ytterbium, and lutetium. 9. The method in accordance with claim 1 , wherein directing an excitation beam comprises directing the excitation beam using a pulsed laser device including at least one of a pulsed neodymium-doped yttrium aluminum garnet (Nd:YAG) excitation laser and pulsed a xenon fluoride (XeF) excimer laser.
Coherent sources; lasers · CPC title
Fluorescence; Phosphorescence · CPC title
LED's · CPC title
using electric radiation detectors · CPC title
using a light source, e.g. for illuminating a surface · CPC title
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