Apparatus and methods for testing of acoustic devices and systems

Patent metadata

Field	Value
Publication number	US-9392387-B2
Application number	US-201414340638-A
Country	US
Kind code	B2
Filing date	Jul 25, 2014
Priority date	Apr 6, 2011
Publication date	Jul 12, 2016
Grant date	Jul 12, 2016

Abstract

Methods and devices are disclosed for testing an acoustic probe having transducing elements for converting between acoustic and electrical signals. An electrical signal is generated at a frequency with a testing device capable of generating electrical signals over a range of frequencies. The electrical signal is transmitted to at least some of the transducing elements to measure a complex impedance and thereby evaluate a performance of the transducing elements.

First claim

What is claimed is:

1. A method of testing an acoustic probe having a plurality of transducing elements for converting between acoustic and electrical signals, the method comprising:
generating a first electrical signal at a first frequency with a direct digital synthesizer;
routing the first electrical signal via a switch matrix to a subset of the plurality of transducing elements;
measuring a first respective electrical complex impedance of an electrical structure of the subset of the plurality of transducing elements with a testing device in response to the first electrical signal; and
evaluating a performance of the subset of the plurality of transducing elements from the first respective complex electrical impedance of the electrical structure of the subset of the plurality of transducing elements.

2. The method recited in claim 1 , wherein evaluating the performance of the subset of the plurality of transducing elements comprises determining a capacitive part associated with the first respective electrical complex impedance with the testing device.

3. The method recited in claim 1 , wherein evaluating the performance of the subset of the plurality of transducing elements comprises determining a resistive component associated with the first respective electrical complex impedance with the testing device.

4. The method recited in claim 1 , further comprising:
receiving an identification of the acoustic probe; and
retrieving a specification of a resonant frequency in accordance with the identification of the acoustic probe to define the first frequency.

5. The method recited in claim 1 , wherein evaluating the performance of the subset of the plurality of transducing elements comprises:
determining a capacitance part of the first respective electrical complex impedance with the testing device; and
determining a resistive component associated with the first respective electrical complex impedance with the testing device.

6. The method recited in claim 1 , further comprising:
generating a second electrical signal at a second frequency different from the first frequency with the testing device;
transmitting the second electrical signal to the subset of the plurality of transducing elements; and
measuring a second respective electrical complex impedance of the electrical structure of the subset ones of the plurality of transducing elements with the testing device in response to the second electrical signal, wherein evaluating the performance of the selected ones of the plurality of transducing elements is based on the first and second respective electrical complex impedances.

7. The method recited in claim 6 , wherein:
the first frequency is not a resonant frequency of the subset of the plurality of transducing elements; and
the second frequency is substantially the resonant frequency of the subset of the plurality of transducing elements.

8. A testing device for testing an acoustic probe having a cable connected to a plurality of transducing elements for converting between acoustic and electrical signals, the testing device comprising:
a direct digital synthesizer that generates a first electrical signal at a first frequency and transmits the first electrical signal;
a switch matrix connected to route the first electrical signal from the direct digital synthesizer to a subset of the plurality of transducer elements; and
an impedance circuitry connected to allow the testing device to measure a first respective electrical complex impedance of the subset of the plurality of transducing elements in response the first electrical signal, wherein at least one of the direct digital synthesizer, the switch matrix, or the impedance circuitry evaluates a performance of the subset of the plurality of transducing elements using the measure of the first respective electrical complex impedance by the impedance circuitry.

9. The testing device recited in claim 8 , further comprising an adapter configured to couple the acoustic probe to the switch matrix of the testing device.

10. The testing device recited in claim 8 , further comprising a body that the impedance circuitry is internal to, the body configured to be portable.

11. The testing device recited in claim 8 , wherein at least one of the direct digital synthesizer, the switch matrix, or the impedance circuitry evaluates the performance of the subset of the plurality of transducing elements based on a measure of a capacitive part associated with the first respective electrical complex impedance.

12. The testing device recited in claim 11 , wherein at least one of the direct digital synthesizer, the switch matrix, or the impedance circuitry evaluates the performance of the subset of the transducer elements of the acoustic probe based on the measure of the capacitive part associated with the first respective electrical complex impedance relative to a capacitive part expected for a properly functioning probe to determine an occurrence of a defect with the cable of the acoustic probe connected to the testing device.

13. The testing device recited in claim 8 , wherein at least one of the direct digital synthesizer, the switch matrix, or the impedance circuitry evaluates the performance of the subset of the plurality of transducing elements based on a measure of a resistive component associated with the first respective electrical complex impedance.

14. The testing device recited in claim 13 , wherein at least one of the direct digital synthesizer, the switch matrix, or the impedance circuitry evaluates the performance of the subset of the transducer elements of the acoustic probe based on a comparison of the measure of the resistive component of the first respective complex impedance relative to an acceptable range in determining a defect in the subset of the transducer elements.

15. The testing device recited in claim 8 , wherein at least one of the direct digital synthesizer, the switch matrix, or the impedance circuitry evaluates the performance of the each of the selected ones of the plurality of transducing elements by:
determining a capacitive part associated with the first respective electrical complex impedance; and
determining a resistive component associated with the first respective electrical complex impedance.

16. The testing device recited in claim 8 , wherein the direct digital synthesizer:
generates a second electrical signal at a second frequency different from the first frequency;
transmits the second electrical signal via the switch matrix to the selected ones of the plurality of transducing elements;
measures a second respective electrical complex impedance of the subset of the plurality of transducing elements using the impedance circuitry in response to the second electrical signal, wherein at least one of the direct digital synthesizer, the switch matrix, or the impedance circuitry evaluates the performance of the subset the plurality of transducing elements using the first and second respective electrical complex impedances.

17. The testing device recited in claim 8 , wherein at least one of the direct digital synthesizer, the switch matrix, or the impedance circuitry evaluates the performance of the subset of the plurality of transducing elements based on a measure of real part and an imaginary part associated with the first respective electrical complex impedance.

Assignees

• Gen Electric

Inventors

• Ginther James
• Timms John
• Moore G Wayne
• Gessert James

Classifications

• G01N2291/018

  Impedance · CPC title

• G01N29/2437

  Piezoelectric probes · CPC title

• H04R29/005

  Microphone arrays · CPC title

• G01R27/02

  Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant (by measuring phase angle only G01R25/00) · CPC title

• H04R2420/09

  Applications of special connectors, e.g. USB, XLR, in loudspeakers, microphones or headphones · CPC title