Automatic analyzer

Patent metadata

Field	Value
Publication number	US-9383376-B2
Application number	US-200913133655-A
Country	US
Kind code	B2
Filing date	Nov 11, 2009
Priority date	Dec 9, 2008
Publication date	Jul 5, 2016
Grant date	Jul 5, 2016

Abstract

Abnormality causes are automatically identified during daily quality control, based on the focused consideration of complex uncertainty factors and, especially, of the causes of device-side abnormalities, the latter of which are often difficult to identify. The analyzer performance that affects measurement results can be estimated from analysis parameters and calibration results. Thus, uncertainty estimates are automatically calculated for each analysis item during quality control, and the estimates are compared with uncertainties obtained during actual QC sample measurement, thereby monitoring and evaluating the analyzer performance. Also, measurements are performed on QC samples of multiple concentrations that contain substances known to subject to particular influences such as those of the optical system, sample dispenser, and reagent dispenser, so that the causes of abnormalities can be identified. Uncertainty estimates calculated from the parameters set for the analysis items are compared with uncertainties obtained from the QC sample measurements.

First claim

The invention claimed is:

1. An automatic analyzer, comprising:
a plurality of analyzer components, including:
an optical system including a light source,
a reagent dispenser to dispense a reagent, and
a sample dispenser, including a sample probe, to dispense a plurality of quality control (QC) samples;

a detector that outputs sample measurement data;
a storage unit that stores the sample measurement data and uncertainty data for the plurality of analyzer components;
a calculator that calculates an estimated combined uncertainty for each of a plurality of analysis items based on the uncertainty data, and calculates a measured combined uncertainty for each of the plurality of analysis items based on QC sample measurement data;
a judgment unit that detects analyzer component abnormalities by:
comparing the measured combined uncertainty with the estimated combined uncertainty for each analysis item, and,

when the measured combined uncertainty exceeds the estimated combined uncertainty for a particular analysis item, identifying an abnormality associated with one of the plurality of analyzer components; and
a display unit to display the abnormality,
wherein, after the display unit displays the abnormality, the analyzer component associated with the identified abnormality is replaced, including:
replacing the light source when the identified abnormality is an optical system abnormality,
replacing the reagent when the identified abnormality is a reagent abnormality,
replacing the sample probe when the identified abnormality is a sample dispenser abnormality, or
replacing the QC sample when the identified abnormality is a QC sample abnormality.

2. The automatic analyzer of claim 1 , wherein the plurality of analyzer components further includes a rinser and a stirrer.

3. The automatic analyzer of claim 1 , wherein the calculator calculates a standard deviation and a coefficient of variation for the QC sample measurement data.

4. The automatic analyzer of claim 1 , wherein the plurality of QC samples, having a plurality of different concentration levels, are prepared and tested for each analysis item.

5. The automatic analyzer of claim 1 , wherein the calculation of the estimated combined uncertainty for each analysis item is also based on calibration data for the plurality of analyzer components and analysis item parameters.

6. The automatic analyzer of claim 1 , wherein the storage unit stores performance data for the plurality of analyzer components and analysis item parameters obtained from calibration measurements.

7. The automatic analyzer of claim 1 , wherein the storage unit stores the calculated data.

8. The automatic analyzer of claim 1 , wherein the uncertainty data are input to the computer.

9. The automatic analyzer of claim 1 , wherein the judgment unit evaluates analysis items known to be subject to an influence of a particular analyzer component to examine whether the particular analyzer component is abnormal.

Assignees

• Kamihara Kumiko
• Mimura Tomonori
• Hitachi High Tech Corp

Inventors

• Kamihara Kumiko
• Mimura Tomonori

Classifications

• G06F17/18

  for evaluating statistical data {, e.g. average values, frequency distributions, probability functions, regression analysis (forecasting specially adapted for a specific administrative, business or logistic context G06Q10/04)} · CPC title

• G01N35/00693 Primary

  Calibration · CPC title

• G01N35/00603

  Reinspection of samples · CPC title