Standard light source having restriction portion for diffuse reflection and measurement method

US9377352B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9377352-B2
Application numberUS-201414161690-A
CountryUS
Kind codeB2
Filing dateJan 23, 2014
Priority dateFeb 14, 2013
Publication dateJun 28, 2016
Grant dateJun 28, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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Abstract

Official abstract text for this publication.

A novel standard light source with a more simplified construction, which is suitable for measurement of total luminous flux of a light source different in luminous intensity distribution characteristics from a conventional standard light source, and a measurement method with the use of that standard light source are provided. A standard light source includes a light emitting portion, a power feed portion electrically connected to the light emitting portion, and a restriction portion provided between the light emitting portion and the power feed portion, for restricting propagation of light radiated from the light emitting portion toward the power feed portion. A surface of the restriction portion on which light from the light emitting portion is incident is constructed for diffuse reflection.

First claim

Opening claim text (preview).

What is claimed is: 1. A standard light source, comprising a light bulb comprising a single light emitting portion having 4π distribution of luminous intensity; a power feed portion electrically connected to the light emitting portion; and a restriction portion provided between the light emitting portion and the power feed portion, for restricting propagation of light radiated from the light emitting portion toward the power feed portion, the restriction portion being configured to make the standard light source have substantially 2π distribution of luminous intensity as a whole, a surface of the restriction portion on which light from the light emitting portion is incident being constructed for diffuse reflection. 2. The Standard light source according to claim 1 , wherein a cross-sectional area of the restriction portion in a direction perpendicular to an optical axis passing through the light emitting portion and the power feed portion is designed in accordance with distribution of luminous intensity of the light emitting portion. 3. The standard light source according to claim 1 , wherein the restriction portion has a flat surface on which light from the light emitting portion is incident. 4. The standard light source according to claim 1 , wherein the restriction portion has a concave surface on which light from the light emitting portion is incident. 5. The standard light source according to claim 1 , further comprising a hood covering a surface of the restriction portion and a space including the light emitting portion. 6. A measurement method, comprising the steps of: preparing a calibrated standard light source, attaching the calibrated standard light source to a measurement apparatus and measuring optical characteristics of the calibrated standard light source when the calibrated standard light source is turned on; attaching a target light source which is a measurement target to the measurement apparatus and measuring optical characteristics of the target light source when the target light source is turned on; and determining optical characteristics for the target light source based on the measured optical characteristics of the calibrated standard light source, the measured optical characteristics of the target light source, and optical characteristics for the calibrated standard light source, the calibrated standard light source including a light bulb comprising a single light emitting portion having 4π distribution of luminous intensity, a power feed portion electrically connected to the light emitting portion, and a restriction portion provided between the light emitting portion and the power feed portion, for restricting propagation of light radiated from the light emitting portion toward the power feed portion, the restriction portion being configured to make the calibrated standard light source have substantially 2π distribution of luminous intensity as a whole, and a surface of the restriction portion on which light from the light emitting portion is incident being constructed for diffuse reflection. 7. The standard light source according to claim 1 , wherein the light emitting portion comprises a filament light source. 8. The standard light source according to claim 1 , wherein the light emitting portion comprises an incandescent lamp. 9. The standard light source according to claim 1 , wherein the light emitting portion comprises a halogen lamp. 10. The standard light source according to claim 1 , wherein the light emitting portion comprises a xenon arc lamp. 11. The standard light source according to claim 1 , wherein the light emitting portion comprises a discharge lamp. 12. The standard light source according to claim 1 , further comprising a protection dome attached to the restriction portion and extending over the light bulb comprising the single light emitting portion.

Assignees

Inventors

Classifications

  • using electric radiation detectors (optical or mechanical part G01J1/04; by comparison with a reference light or electric value G01J1/10) · CPC title

  • G01J1/08Primary

    Arrangements of light sources specially adapted for photometry {standard sources, also using luminescent or radioactive material} · CPC title

  • Baffles · CPC title

  • for testing LED's · CPC title

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What does patent US9377352B2 cover?
A novel standard light source with a more simplified construction, which is suitable for measurement of total luminous flux of a light source different in luminous intensity distribution characteristics from a conventional standard light source, and a measurement method with the use of that standard light source are provided. A standard light source includes a light emitting portion, a power fe…
Who is the assignee on this patent?
Otsuka Denshi Kk
What technology area does this patent fall under?
Primary CPC classification G01J1/08. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 28 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).