Contact structure unit

Patent metadata

Field	Value
Publication number	US-9373900-B2
Application number	US-201214233484-A
Country	US
Kind code	B2
Filing date	Jul 17, 2012
Priority date	Jul 19, 2011
Publication date	Jun 21, 2016
Grant date	Jun 21, 2016

Abstract

A contact structure unit that achieves electrical continuity between a substrate, which includes a plurality of electrodes, and a contact object includes a first-type contact-carrying member including a contact portion which makes contact with the contact object; includes a plurality of second-type contact-carrying members each of which includes a leading end portion formed at one end portion and making contact with the electrodes and each of which makes contact with the first-type contact-carrying member at the other end portion; and includes a plurality of coil springs each of which is disposed between the contact portion and the leading end portions and each of which biases the contact portion and the leading end portions.

First claim

The invention claimed is:

1. A contact structure unit that achieves electrical continuity between a substrate, which includes a plurality of electrodes, and a contact object that outputs signals for inspection to the substrate, the contact structure unit comprising:
a first-type contact-carrying member that includes a flange portion at one end and a first-type contact portion opposite the flange portion, for making contact with the contact object;
a plurality of second-type contact-carrying members, each second-type contact-carrying member including:
a first end portion as a second-type contact portion configured to make contact with one of the electrodes different from another electrode at another first end portion as a second-type contact portion of another second-type contact-carrying member,
wherein each of the second-type contact-carrying member includes
an electrically-conductive first plunger that has a tapering leading end and that has a leading end portion making contact with the first-type contact-carrying member; and
an electrically-conductive second plunger that includes the second-type contact portion; and

a second end portion configured to make contact with the flange portion of the first-type contact-carrying member; and

a plurality of coil springs each of which links the first plunger and the second plunger and is disposed between the first-type contact portion and each of the second-type contact portions so as to bias the first contact portion and each of the second-type contact portions.

2. The contact structure unit according to claim 1 , wherein the leading end portion includes a plurality of claws.

3. The contact structure unit according to claim 1 , wherein the first-type contact portion includes a plurality of claws.

4. The contact structure unit according to claim 2 , wherein the first-type contact portion includes a plurality of claws.

Assignees

• Yamada Yoshio
• Ito Osamu
• Nhk Spring Co Ltd

Inventors

• Yamada Yoshio
• Ito Osamu

Classifications

• G01R1/07314

  the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support (on an elastic support, e.g. a film, G01R1/0735) · CPC title

• G01R1/06733

  Geometry aspects (G01R1/06727 takes precedence) · CPC title

• G01R1/06722 Primary

  Spring-loaded · CPC title

• H01R4/4863 Primary

  Coil spring · CPC title