Elastic wave device
US-9184367-B2 · Nov 10, 2015 · US
US9368712B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9368712-B2 |
| Application number | US-201213674114-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 12, 2012 |
| Priority date | May 19, 2010 |
| Publication date | Jun 14, 2016 |
| Grant date | Jun 14, 2016 |
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A surface acoustic wave device includes a piezoelectric substrate including a groove located in a surface thereof, an IDT electrode, and a dielectric film. The IDT electrode includes a first electrode layer located in the groove and a second electrode layer located outside the groove. The dielectric film is arranged on the piezoelectric substrate so as to cover the IDT electrode. The second electrode layer is tapered toward a side opposite to the piezoelectric substrate.
Opening claim text (preview).
What is claimed is: 1. A surface acoustic wave device comprising: a piezoelectric substrate including a groove located in a surface thereof; an IDT electrode including a first electrode layer located in the groove and a second electrode layer located outside the groove; and a dielectric film arranged on the piezoelectric substrate so as to cover the IDT electrode; wherein the second electrode layer is tapered toward a side opposite to the piezoelectric substrate, and a cross-sectional shape of the second electrode layer is trapezoidal, and a ratio T/R of a length T of an upper base to a length R of a lower base in a cross section of the second electrode layer is within a range of about 0.86 to about 0.98. 2. The surface acoustic wave device according to claim 1 , wherein the first electrode layer is tapered toward the piezoelectric substrate side. 3. The surface acoustic wave device according to claim 1 , wherein a ratio HT/R of a height HT to the length R of the lower base in the cross section of the second electrode layer is within a range of about 0.1 to about 0.25. 4. The surface acoustic wave device according to claim 2 , wherein a ratio HT/R of a height HT to the length R of the lower base in the cross section of the second electrode layer is within a range of about 0.1 to about 0.25. 5. The surface acoustic wave device according to claim 1 , wherein the dielectric film is made of silicon oxide or silicon nitride.
Electricity · mapped topic
Multilayer finger or busbar electrode · CPC title
with electrical input and electrical output, e.g. functioning as transformers · CPC title
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