Light detection device having a semiconductor light detection element and a mounting substrate with quenching circuits

US9368528B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9368528-B2
Application numberUS-201214350647-A
CountryUS
Kind codeB2
Filing dateAug 2, 2012
Priority dateOct 21, 2011
Publication dateJun 14, 2016
Grant dateJun 14, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A light detection device 1 has a semiconductor light detection element having a semiconductor substrate, and a mounting substrate arranged as opposed to the semiconductor light detection element. The semiconductor light detection element includes a plurality of avalanche photodiodes operating in Geiger mode and formed in the semiconductor substrate, and electrodes electrically connected to the respective avalanche photodiodes and arranged on a second principal surface side of the semiconductor substrate. The mounting substrate includes a plurality of electrodes arranged corresponding to the respective electrodes on a third principal surface side, and quenching resistors electrically connected to the respective electrodes and arranged on the third principal surface side. The electrodes and the electrodes are connected through bump electrodes.

First claim

Opening claim text (preview).

The invention claimed is: 1. A light detection device comprising: a semiconductor light detection element having a semiconductor substrate including first and second principal surfaces opposed to each other; and a mounting substrate arranged as opposed to the semiconductor light detection element and having a third principal surface opposed to the second principal surface of the semiconductor substrate, wherein the semiconductor light detection element includes a plurality of avalanche photodiodes operating in Geiger mode and formed in the semiconductor substrate, and first electrodes electrically connected to the respective avalanche photodiodes and arranged on the second principal surface side of the semiconductor substrate, wherein the mounting substrate includes a plurality of second electrodes arranged corresponding to the respective first electrodes on the third principal surface side, and quenching circuits electrically connected to the respective second electrodes and arranged on the third principal surface side, and wherein the first electrodes and the second electrodes corresponding to the first electrodes are connected through bump electrodes. 2. The light detection device according to claim 1 , wherein each of the avalanche photodiodes has: the semiconductor substrate of a first conductivity type; a first semiconductor region of a second conductivity type formed on the first principal surface side of the semiconductor substrate; a second semiconductor region of the second conductivity type formed in the first semiconductor region and having a higher impurity concentration than the first semiconductor region; and a third electrode arranged on the first principal surface side of the semiconductor substrate and electrically connected to the second semiconductor region, and wherein in the semiconductor substrate, a through-hole electrode penetrating from the first principal surface side to the second principal surface side and electrically connecting the corresponding third electrode and first electrode is formed for each avalanche photodiode. 3. The light detection device according to claim 1 , wherein each of the avalanche photodiodes has: the semiconductor substrate of a first conductivity type; a first semiconductor region of a second conductivity type formed on the second principal surface side of the semiconductor substrate; and a second semiconductor region of the first conductivity type forming a PN junction with the first semiconductor region and having a higher impurity concentration than the semiconductor substrate, and wherein the first semiconductor region and the first electrode are electrically connected. 4. The light detection device according to claim 1 , wherein the mounting substrate further includes a common electrode to which the quenching circuits are connected in parallel. 5. The light detection device according to claim 1 , wherein the quenching circuits are passive quenching circuits or active quenching circuits.

Assignees

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Classifications

  • Interconnections · CPC title

  • Containers or encapsulations · CPC title

  • X-ray, gamma-ray or corpuscular radiation imagers · CPC title

  • having multiple elements covered by H10F30/00 in a repetitive configuration, e.g. radiation detectors comprising photodiode arrays · CPC title

  • the potential barrier working in avalanche mode, e.g. avalanche photodiodes · CPC title

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What does patent US9368528B2 cover?
A light detection device 1 has a semiconductor light detection element having a semiconductor substrate, and a mounting substrate arranged as opposed to the semiconductor light detection element. The semiconductor light detection element includes a plurality of avalanche photodiodes operating in Geiger mode and formed in the semiconductor substrate, and electrodes electrically connected to th…
Who is the assignee on this patent?
Nagano Terumasa, HOSOKAWA Noburo, Suzuki Tomofumi, and 2 more
What technology area does this patent fall under?
Primary CPC classification H10F39/18. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jun 14 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).