Fabricating parts from photopolymer resin

Patent metadata

Field	Value
Publication number	US-9367049-B2
Application number	US-201113810494-A
Country	US
Kind code	B2
Filing date	Jul 15, 2011
Priority date	Jul 16, 2010
Publication date	Jun 14, 2016
Grant date	Jun 14, 2016

Abstract

Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for fabricating parts from photopolymer resin. In one aspect, a method includes iteratively determining a deviation measurement based on a simulated cured geometry and adjusted target geometry data until the deviation measurement is at or less than a threshold. The simulated cured geometry is determined, based in part, on an inhibition model.

First claim

What is claimed is:

1. A method performed by a data processing apparatus comprising:
accessing, in a database communicably coupled to the data processing apparatus, by the data processing apparatus, target geometry data that defines a target geometry of an apparatus to be generated by a projection lithography system, from a photopolymer resin, wherein the projection lithography system is in communication with the data processing apparatus;
setting an adjusted target geometry equal to the target geometry;
iteratively determining a deviation measurement, the deviation measurement based on a difference between the adjusted target geometry and a simulated cured geometry, the deviation measurement determined until the deviation measurement is less than or equal to a convergence threshold, each iteration comprising:
generating, based on the adjusted target geometry, image data that defines at least one bitmap and corresponding exposure time for use by the projection lithography system to control irradiation of the photopolymer resin in a resin chamber of the projection lithography system;
simulating, based on the image data and an oxygen inhibition model of the photopolymer resin, the apparatus to be generated to determine the simulated cured geometry;
calculating the difference between the adjusted target geometry and the simulated cured geometry to determine the deviation measurement;
comparing the deviation measurement to the convergence threshold; and
responsive to determining that the deviation measurement is greater than the convergence threshold, adjusting the adjusted target geometry by an adjustment factor; and

responsive to determining that the deviation measurement is less than or equal to a convergence threshold, providing the image data to the projection lithography system for use in controlling the irradiation of the photopolymer resin in the resin chamber when generating the apparatus.

2. The method of claim 1 , wherein the simulated cured geometry is further based on rates of initiation, propagation, and termination of the photopolymer resin, and inhibition mechanisms of the photopolymer resin.

3. The method of claim 2 , wherein, prior to accessing the target geometry, the method further comprises:
determining an incident intensity of an irradiation source of the projection lithography system; and
setting a rate constant for initiator decomposition as a function of depth in the photopolymer resin based, based at least in part, on the incident intensity;
wherein the rate constant for initiator decomposition is determinative of a differential change in concentration of an initiator in the photopolymer resin with respect to time, and
wherein the rate constant is used as a variable for a set of differential equations used to model oxygen diffusion during a curing process.

4. The method of claim 1 , wherein, prior to accessing the target geometry, the method further comprises:
determining an incident intensity of an irradiation source at the resin chamber of the projection lithography system; and
setting a rate constant for initiator decomposition as a function of depth in the photopolymer resin based, at least in part, on the incident intensity;
wherein the rate constant for initiator decomposition is determinative of a differential change in concentration of an initiator in the photopolymer resin with respect to time, and
wherein the rate constant is used as a variable for a set of differential equations used to model oxygen diffusion during a curing process.

5. The method of claim 1 , wherein determining the simulated cured geometry further comprises determining the simulated cured geometry based, in part, on an optical self focusing model that models the intensity of irradiation energy emerging out of the simulated cured geometry at instantaneous heights z.

6. The method of claim 5 , wherein determining the simulated cured geometry based, in part, on an optical self focusing model comprises:
determining, for each of plurality of time increments, each of which are a sub-portion of a total exposure time, and for each of a plurality of locations on a surface of the simulated cured geometry:
determining an instantaneous height z of the surface of the simulated cured geometry at the location and at a time corresponding to the time increment;
determining an intensity of irradiation energy emerging out of the surface of the simulated cured geometry at the location and a corresponding ray path;
estimating, based on the intensity, the height z, and the ray path, a change in the instantaneous height z of the surface at the location, the change in the instantaneous height z corresponding to the instantaneous height z for a next time increment.

7. The method of claim 1 , further comprising:
determining, by the data processing apparatus, the simulated cured geometry based on volumetric shrinkage of the cure photopolymer resin.

8. The method of claim 1 , further comprising:
determining, by the data processing apparatus, the simulated cured geometry based on chemical erosion attributed to developer solution.

9. The method of claim 1 , wherein generating image data that defines at least one bitmap and corresponding exposure time for use by the projection lithography system to control irradiation of the photopolymer resin in a resin chamber of the projection lithography system comprises:
discretizing, into a plurality of voxels, the target geometry data that defines the target geometry of the apparatus to be generated; and
determining an amount of irradiation energy required at a base of each voxel in the plurality of voxels.

10. The method of claim 9 , wherein generating image data that defines at least one image for use by the projection lithography system to control irradiation of the photopolymer resin in a resin chamber of the projection lithography system further comprises:
mapping each bit in a particular bitmap to a corresponding voxel in the plurality of voxels, wherein each bit in a particular bitmap defines a corresponding irradiation energy value that specifies to the projection lithography system the irradiation energy required at the base of the voxel at the corresponding exposure time.

11. The method of claim 1 , wherein the image data is first image data and the deviation measurement is a first deviation measurement, further comprising:
receiving, by the data processing apparatus, actual geometry data that defines an actual geometry of an apparatus generated by the projection lithography system using the first image data;
setting the adjusted target geometry equal to the actual geometry;
iteratively determining a second deviation measurement, the second deviation measurement based on a difference between the adjusted target geometry and a simulated cured geometry, the second deviation measurement determined until the second deviation measurement is less than or equal to the convergence threshold, each iteration comprising:
generating, based on the adjusted target geometry, second image data that defines at least one image that is used to control irradiation of the photopolymer resin in the resin chamber of the projection lithography system;
determining, based on the second image data and the oxygen inhibition model of the photopolymer resin, the simulated cured geometry;
calculating the difference between the adjusted target geometry and the simulated cured geometry data to determine the second deviation measurement;
comparing the second deviation measurement to the convergence threshold; and
responsive to determining that the second deviation measurement is greater than the convergence threshold, adjusting the adjusted target geometry by an adju

Assignees

• Jariwala Amit S
• Rosen David W
• Ding Fei
• Georgia Tech Res Inst

Inventors

• Jariwala Amit S
• Rosen David W
• Ding Fei

Classifications

• B29C67/0066

  Operations & Transport · mapped topic

• G05B11/01 Primary

  electric · CPC title

• B29C67/0088

  Operations & Transport · mapped topic

• B29C64/135

  the energy source being concentrated, e.g. scanning lasers or focused light sources · CPC title

• B29C64/386 Primary

  Data acquisition or data processing for additive manufacturing · CPC title