Imaging system
US-12169175-B2 · Dec 17, 2024 · US
US9366628B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9366628-B2 |
| Application number | US-201414586337-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 30, 2014 |
| Priority date | Jul 13, 2011 |
| Publication date | Jun 14, 2016 |
| Grant date | Jun 14, 2016 |
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Systems and methods for standardizing one or more fluorescence scanning instruments to a reference system by separating the effects of drift and normalization. In an embodiment, a drift image comprising an image of a drift reference slide is captured by a system to be standardized. A drift measurement is calculated using the drift image. A first normalization image comprising an image of a normalization slide is also captured by the system to be standardized. A reference normalization image, also comprising an image of the normalization slide, is captured by a reference system. The first normalization image is compared to the reference normalization image to determine a gamma value and offset value for the system to be standardized.
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The invention claimed is: 1. A method for standardizing a fluorescence microscopy imaging system, the method comprising: by a first imaging system to be standardized, capturing a first normalization image comprising an image of a normalization slide; by a reference imaging system, capturing a reference normalization image comprising an image of the normalization slide; comparing the first normalization image to the reference normalization image; and determining a gamma value and offset value for the first imaging system based on the comparison. 2. The method of claim 1 , wherein capturing a first normalization image, comparing the first normalization image to the reference normalization image, and determining a gamma value and offset value for the first imaging system are all performed for each of a plurality of normalization slides. 3. The method of claim 1 , wherein the first normalization image and the reference normalization image comprise images of an identical region of the normalization slide. 4. The method of claim 1 , further comprising, for the reference imaging system, setting a gamma value to one and an offset value to zero. 5. The method of claim 1 , further comprising storing the reference normalization image. 6. The method of claim 1 , further comprising by the first imaging system to be standardized, capturing a drift image comprising an image of a drift reference slide; and calculating a drift measurement using the drift image. 7. The method of claim 6 , wherein calculating the drift measurement comprises calculating a ratio of average pixel intensity in the drift image to an exposure of the drift image. 8. The method of claim 6 , further comprising: by the first imaging system, capturing a digital image of a sample, wherein the digital image comprises a plurality of pixels, each pixel associated with a pixel intensity value; and altering one or more of the pixel intensity values based on the drift measurement, the gamma value, and the offset value. 9. The method of claim 8 , further comprising storing the digital image without alteration of the pixel intensity values. 10. The method of claim 9 , further comprising applying image processing to the digital image, wherein the alteration of one or more pixel intensity values is performed at a time that the application of the image processing is performed. 11. The method of claim 9 , further comprising displaying the digital image, wherein the alteration of one or more pixel intensity values is performed at a time that the digital image is displayed. 12. The method of claim 6 , further comprising by the reference imaging system, capturing a reference drift image comprising an image of a reference drift slide, and calculating a reference drift measurement using the reference drift image. 13. The method of claim 12 , further comprising storing the reference drift measurement. 14. A system for standardizing a fluorescence microscopy imaging system, the system comprising: at least one hardware processor; and at least one executable module that, when executed by the at least one hardware processor, receives a first normalization image comprising an image of a normalization slide captured by the first imaging system, receives a reference normalization image comprising an image of the normalization slide captured by a reference imaging system, compares the first normalization image to the reference normalization image, and determines a gamma value and offset value for the first imaging system based on the comparison. 15. The system of claim 14 , wherein the first normalization image and the reference normalization image comprise images of an identical region of the normalization slide. 16. The system of claim 14 , wherein at least one executable module, when executed by the at least one hardware processor, receives a drift image comprising an image of a drift reference slide captured by a first imaging system, and calculates a drift measurement using the drift image. 17. The system of claim 16 , wherein calculating the drift measurement comprises calculating a ratio of average pixel intensity in the drift image to an exposure of the drift image. 18. The system of claim 16 , wherein the at least one executable module further: receives a digital image of a sample captured by the first imaging system, wherein the digital image comprises a plurality of pixels, each pixel associated with a pixel intensity value; and alters one or more of the pixel intensity values based on the drift measurement, the gamma value, and the offset value. 19. A non-transitory computer-readable medium having instructions stored thereon, wherein the instructions, when executed by a processor, cause the processor to: receive a first normalization image comprising an image of a normalization slide captured by a first imaging system; receive a reference normalization image comprising an image of the normalization slide captured by a reference imaging system; compare the first normalization image to the reference normalization image; and determine a gamma value and offset value for the first imaging system based on the comparison. 20. The non-transitory computer-readable medium of claim 19 , wherein the first normalization image and the reference normalization image comprise images of an identical region of the normalization slide. 21. The non-transitory computer-readable medium of claim 19 , wherein the instructions, when executed by the processor, cause the processor to: receive a drift image comprising an image of a drift reference slide captured by a first imaging system; and calculate a drift measurement using the drift image. 22. The non-transitory computer-readable medium of claim 21 , wherein calculating the drift measurement comprises calculating a ratio of average pixel intensity in the drift image to an exposure of the drift image. 23. The non-transitory computer-readable medium of claim 21 , wherein the instructions further cause the processor to: receive a digital image of a sample captured by the first imaging system, wherein the digital image comprises a plurality of pixels, each pixel associated with a pixel intensity value; and alter one or more of the pixel intensity values based on the drift measurement, the gamma value, and the offset value.
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