Temperature compensation method for high-density floating-gate memory
US-2015008496-A1 · Jan 8, 2015 · US
US9362001B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9362001-B2 |
| Application number | US-201514798478-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 14, 2015 |
| Priority date | Oct 14, 2014 |
| Publication date | Jun 7, 2016 |
| Grant date | Jun 7, 2016 |
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A memory cell includes a programming selection transistor, a following gate transistor, an antifuse element, and a reading circuit. A charging current formed by the antifuse element may trigger the reading circuit to form a stable read current during a reading operation of the memory cell so that the time for reading data from the memory cell can be shortened. A discharging process may be operated in the beginning of the reading operation of the memory cell so that the window of time for reading data from the memory cell can be widened.
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What is claimed is: 1. A memory cell comprising: a programming selection transistor having a first terminal, a second terminal configured to receive a bit line program signal, and a control terminal configured to receive a word line program signal; a following gate transistor having a first terminal, a second terminal coupled to the first terminal of the programming selection transistor, and a control terminal configured to receive a following control signal; an antifuse eleme…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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