FePt-based sputtering target

Patent metadata

Field	Value
Publication number	US-9358612-B2
Application number	US-201414330775-A
Country	US
Kind code	B2
Filing date	Jul 14, 2014
Priority date	Jan 13, 2012
Publication date	Jun 7, 2016
Grant date	Jun 7, 2016

Abstract

An FePt-based sputtering target contains Fe, Pt, and a metal oxide, and further contains one or more kinds of metal elements other than Fe and Pt, wherein the FePt-based sputtering target has a structure in which an FePt-based alloy phase and a metal oxide phase containing unavoidable impurities are mutually dispersed, the FePt-based alloy phase containing Pt in an amount of 40 at % or more and less than 60 at % and the one or more kinds of metal elements in an amount of more than 0 at % and 20 at % or less with the balance being Fe and unavoidable impurities and with the total amount of Pt and the one or more kinds of metal elements being 60 at % or less, and wherein the metal oxide is contained in an amount of 20 vol % or more and 40 vol % or less based on the total amount of the target.

First claim

The invention claimed is:

1. An FePt-based sputtering target comprising Fe, Pt, a metal oxide, and further comprising one or more kinds of metal elements other than Fe and Pt,
wherein the FePt-based sputtering target has a structure in which an FePt-based alloy phase and a metal oxide phase containing unavoidable impurities are mutually dispersed, the FePt-based alloy phase containing Pt in an amount of 40 at % or more and less than 60 at % and the one or more kinds of metal elements other than Fe and Pt in an amount of more than 0 at % and 20 at % or less with the balance being Fe and unavoidable impurities and with a total amount of Pt and the one or more kinds of metal elements being 60 at % or less,
the metal oxide is contained in an amount of 20 vol % or more and 40 vol % or less based on a total amount of the target, and
the metal oxide phase has an average size of 0.4 μm or less as determined by an intercept method.

2. An FePt-based sputtering target comprising Fe, Pt, C, a metal oxide, and further comprising one or more kinds of metal elements other than Fe and Pt,
wherein the FePt-based sputtering target has a structure in which an FePt-based alloy phase, a C phase containing unavoidable impurities, and a metal oxide phase containing unavoidable impurities are mutually dispersed, the FePt-based alloy phase containing Pt in an amount of 40 at % or more and less than 60 at % and the one or more kinds of metal elements other than Fe and Pt in an amount of more than 0 at % and 20 at % or less with the balance being Fe and unavoidable impurities and with a total amount of Pt and the one or more kinds of metal elements being 60 at % or less,
C is contained in an amount of more than 0 vol % and 20 vol % or less based on a total amount of the target, the metal oxide is contained in an amount of 10 vol % or more and less than 40 vol % based on the total amount of the target, and a total content of C and the metal oxide is 20 vol % or more and 40 vol % or less based on the total amount of the target, and
a phase consisting of the C phase and the metal oxide phase has an average size of 0.4 μm or less as determined by an intercept method.

3. The FePt-based sputtering target according to claim 1 ,
wherein the one or more kinds of metal elements other than Fe and Pt are one or more kinds of Cu, Ag, Mn, Ni, Co, Pd, Cr, V, and B.

4. The FePt-based sputtering target according to claim 2 ,
wherein the one or more kinds of metal elements other than Fe and Pt are one or more kinds of Cu, Ag, Mn, Ni, Co, Pd, Cr, V, and B.

5. The FePt-based sputtering target according to claim 1 ,
wherein the one or more kinds of metal elements other than Fe and Pt include Cu.

6. The FePt-based sputtering target according to claim 2 ,
wherein the one or more kinds of metal elements other than Fe and Pt include Cu.

7. The FePt-based sputtering target according to claim 1 ,
wherein the one or more kinds of metal elements other than Fe and Pt are only Cu.

8. The FePt-based sputtering target according to claim 2 ,
wherein the one or more kinds of metal elements other than Fe and Pt are only Cu.

9. The FePt-based sputtering target according to claim 1 ,
wherein the metal oxide contains at least one of SiO 2 , TiO 2 , Ti 2 O 3 , Ta 2 O 5 , Cr 2 O 3 , CoO, Co 3 O 4 , B 2 O 3 , Fe 2 O 3 , CuO, Cu 2 O, Y 2 O 3 , MgO, Al 2 O 3 , ZrO 2 , Nb 2 O 5 , MoO 3 , CeO 2 , Sm 2 O 3 , Gd 2 O 3 , WO 2 , WO 3 , HfO 2 , and NiO 2 .

10. The FePt-based sputtering target according to claim 2 ,
wherein the metal oxide contains at least one of SiO 2 , TiO 2 , Ti 2 O 3 , Ta 2 O 5 , Cr 2 O 3 , CoO, Co 3 O 4 , B 2 O 3 , Fe 2 O 3 , CuO, Cu 2 O, Y 2 O 3 , MgO, Al 2 O 3 , ZrO 2 , Nb 2 O 5 , MoO 3 , CeO 2 , Sm 2 O 3 , Gd 2 O 3 , WO 2 , WO 3 , HfO 2 , and NiO 2 .

11. The FePt-based sputtering target according to claim 1 ,
wherein the FePt-based sputtering target has a relative density of 90% or higher.

12. The FePt-based sputtering target according to claim 2 ,
wherein the FePt-based sputtering target has a relative density of 90% or higher.

13. The FePt-based sputtering target according to claim 1 ,
wherein the FePt-based sputtering target is used for a magnetic recording medium.

14. The FePt-based sputtering target according to claim 2 ,
wherein the FePt-based sputtering target is used for a magnetic recording medium.

15. The FePt-based sputtering target according to claim 1 ,
wherein the metal oxide is contained in an amount more than 30 vol % and 40 vol % or less based on a total amount of the target.

16. The FePt-based sputtering target according to claim 2 ,
wherein the metal oxide is contained in an amount more than 30 vol % and 40 vol % or less based on a total amount of the target.

17. The FePt-based sputtering target according to claim 1 ,
wherein the metal oxide contains one or more metal oxides selected from the group consisting of CoO, Co 3 O 4 , Fe 2 O 3 , CuO, Cu 2 O, Y 2 O 3 , MoO 3 , CeO 2 , Sm 2 O 3 , and Gd 2 O 3 .

18. The FePt-based sputtering target according to claim 2 ,
wherein the metal oxide contains one or more metal oxides selected from the group consisting of CoO, Co 3 O 4 , Fe 2 O 3 , CuO, Cu 2 O, Y 2 O 3 , MoO 3 , CeO 2 , Sm 2 O 3 , and Gd 2 O 3 .

Assignees

• Tanaka Precious Metal Ind

Inventors

• Miyashita Takanobu
• Goto Yasuyuki
• Yamamoto Takamichi
• Kushibiki Ryousuke
• Aono Masahiro
• Nishiura Masahiro

Classifications

• C22C5/04 Primary

  Alloys based on a platinum group metal · CPC title

• C22C1/10

  Alloys containing non-metals (C22C1/05, C22C1/08 take precedence) · CPC title

• C22C1/0466

  Alloys based on noble metals · CPC title

• C22C1/05

  Mixtures of metal powder with non-metallic powder (C22C1/08 takes precedence) · CPC title

• C22C38/002

  containing In, Mg, or other elements not provided for in one single group C22C38/001 - C22C38/60 · CPC title