Sample plate for MALDI-TOF mass spectrometer and method of manufacturing the sample plate and mass spectrometry method using the sample plate

US9355829B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9355829-B2
Application numberUS-201514800665-A
CountryUS
Kind codeB2
Filing dateJul 15, 2015
Priority dateJul 16, 2014
Publication dateMay 31, 2016
Grant dateMay 31, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The present invention relates to a sample plate to be used for a MALDI-TOF (Matrix Assisted Laser Desorption Ionization Time of Flight) mass spectrometer, and more particularly, to a sample plate for a MALDI-TOF mass spectrometer, which is particularly useful for molecular weight measurement of a high-volatile material, a method of manufacturing the sample plate and a mass spectrometry method using the sample plate. Object of the present invention to provide a method capable of performing a mass spectrometry for a high-volatile material by using a MALDI-TOF mass spectrometer so as to overcome the limits of the gas chromatography method of the related art. According to the present invention, there is provided a sample plate including a target plate, an organic matrix formed on one surface of the target plate, a parylene thin film formed on the target plate having the organic matrix formed thereon and formed to cover the entire organic matrix, and a sample fixing layer formed on the parylene thin film. The sample fixing layer is made of at least one material selected from a group consisting of graphene and carbon nano tube (CNT).

First claim

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What is claim is: 1. A sample plate including: a target plate, an organic matrix formed on one surface of the target plate, a parylene thin film formed on the target plate having the organic matrix formed thereon and formed to cover the entire organic matrix, and a sample fixing layer formed on the parylene thin film, wherein the sample fixing layer is made of at least one material selected from a group consisting of graphene and carbon nano tube (CNT). 2. The sample plate of claim 1 , wherein the sample fixing layer is preferably made of graphene. 3. The sample plate of claim 1 , at least one material selected from the group consisting of graphene and carbon nano tube (CNT) may be mixed with a sample, which is an analysis target, and a mixture thereof may be formed on the parylene thin film, as the sample fixing layer. 4. The sample plate of claim 1 , the sample fixing layer may be formed on the parylene thin film without being mixed with a sample, which is an analysis target. 5. The sample plate of claim 4 , the sample plate may further include an analysis target formed on the parylene thin film. 6. The sample plate of claim 1 , the parylene thin film is formed to have a thickness of 10 nm to 100 nm. 7. The sample plate of claim 1 , the parylene thin film is a parylene-N thin film. 8. The sample plate of claim 1 , the sample plate is a sample plate for a MALDI-TOF (Matrix Assisted Laser Desorption Ionization Time of Flight) mass spectrometer. 9. A method of manufacturing a sample plate, the method including the steps of: forming an organic matrix on one surface of a target plate, forming a parylene thin film on the target plate having the organic matrix formed thereon so that it covers the entire organic matrix, and forming a sample fixing layer by using at least one material selected from a group consisting of graphene and carbon nano tube (CNT). 10. The method of claim 9 , the step of forming the sample fixing layer may include steps of mixing at least one material selected from the group consisting of graphene and carbon nano tube with a sample, which is an analysis target, and forming a sample fixing layer mixed with the sample on the parylene thin film. 11. The method of claim 10 , the step of forming the sample fixing layer, the sample fixing layer may be formed on the parylene thin film without being mixed with a sample, which is an analysis target. 12. The method of claim 11 , the method may further include a step of forming the sample on the sample fixing layer. 13. The method of claim 10 , the parylene thin film is preferably parylene-N thin film. 14. The method of claim 10 , the step of forming the parylene thin film may include a first step of evaporating parylene dimer, a second step of thermally decomposing the evaporated parylene dimer to form an intermediate product, and a third step of introducing the intermediate product into a vapor deposition chamber and forming the parylene thin film on the target plate having the organic matrix formed thereon. 15. The method of claim 10 , the sample plate is preferably a sample plate for a MALDI-TOF mass spectrometer. 16. A mass spectrometry method using a MALDI-TOF (Matrix Assisted Laser Desorption Ionization Time of Flight) mass spectrometer, the method including the steps of: providing a sample plate including a target plate, an organic matrix formed on one surface of the target plate, a parylene thin film formed on the target plate having the organic matrix formed thereon and formed to cover the entire organic matrix, and a sample fixing layer formed on the parylene thin film, the sample fixing layer being made of at least one material selected from a group consisting of graphene and carbon nano tube (CNT); forming a sample, which is an analysis target, on the sample fixing layer; positioning the sample plate having the sample mounted thereon at a predetermined position of the MALDI-TOF mass spectrometer; illuminating laser to the sample plate to desorb and ionize the sample, and performing mass spectrometry for the ionized sample. 17. The method of claim 16 , the material mixed with the sample fixing layer or sample is preferably graphene. 18. A mass spectrometry method using a MALDI-TOF (Matrix Assisted Laser Desorption Ionization Time of Flight) mass spectrometer, the method including the steps of: providing a sample plate including a target plate, an organic matrix formed on one surface of the target plate, and a parylene thin film formed on the target plate having the organic matrix formed thereon and formed to cover the entire organic matrix; mixing a sample, which is an analysis target, with at least one material selected from a group consisting of graphene and carbon nano tube (CNT); forming the sample on the sample plate; positioning the sample plate having the sample mounted thereon at a predetermined position of the MALDI-TOF mass spectrometer; illuminating laser to the sample plate to desorb and ionize the sample, and performing mass spectrometry for the ionized sample. 19. The method of claim 18 , the material mixed with a sample fixing layer or sample is preferably graphene.

Assignees

Inventors

Classifications

  • G01N1/28Primary

    Preparing specimens for investigation {including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q}(mounting specimens on microscopic slides G02B21/34; means for supporting the objects or the materials to be analysed in electron microscopes H01J37/20 {; laboratory gas handling apparatus B01L5/00}) · CPC title

  • Time-of-flight spectrometers (H01J49/36 takes precedence) · CPC title

  • Deposition of organic layers from vapour phase (vapour phase deposition in general C23C14/00, C23C16/00) · CPC title

  • for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates · CPC title

  • Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

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What does patent US9355829B2 cover?
The present invention relates to a sample plate to be used for a MALDI-TOF (Matrix Assisted Laser Desorption Ionization Time of Flight) mass spectrometer, and more particularly, to a sample plate for a MALDI-TOF mass spectrometer, which is particularly useful for molecular weight measurement of a high-volatile material, a method of manufacturing the sample plate and a mass spectrometry method u…
Who is the assignee on this patent?
Univ Yonsei Iacf
What technology area does this patent fall under?
Primary CPC classification G01N1/28. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue May 31 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).