Method for imaging mass analysis using physical vapor deposition of platinum nanoparticles

Patent metadata

Field	Value
Publication number	US-9355826-B2
Application number	US-201314379228-A
Country	US
Kind code	B2
Filing date	Feb 13, 2013
Priority date	Feb 17, 2012
Publication date	May 31, 2016
Grant date	May 31, 2016

Abstract

The present invention provides an improved method for imaging mass spectrometry using an ionization-assisting matrix of a test sample, wherein the ionization efficiency is high, migration and visual information reduction are inhibited, no interference peaks originating from the matrix occur, and the analysis can be performed at high spatial resolution.
Specifically, the present invention provides a method for imaging mass spectrometry using a sample prepared by physical vapor depositing platinum nanoparticles on the surface of a test sample to be subjected to imaging mass spectrometry.

First claim

The invention claimed is:

1. A method for imaging mass spectrometry using a sample prepared by physical vapor depositing platinum nanoparticles on a surface of a test sample in such a manner as to bind the platinum nanoparticle to the test sample; the platinum nanoparticles and test sample being subjected to imaging mass spectrometry so as to improve imaging of said test sample.

2. The method according to claim 1 , wherein the platinum nanoparticles have an average particle size of 2 to 20 nm.

3. The method according to claim 1 , wherein a platinum nanoparticle layer formed by the physical vapor deposition has a thickness of 2 to 50 nm.

4. The method according to claim 1 , wherein the physical vapor deposition is based on magnetron sputtering.

5. The method according claim 1 using a matrix assisted laser desorption/ionization (MALDI) imaging mass spectrometer.

6. A method for preparing a sample for imaging mass spectrometry, comprising physical vapor depositing platinum nanoparticles so as to bind the platinum nanoparticles on a surface of a test sample to be subjected to imaging mass spectrometry so as to improve imaging of said test sample.

7. The method according to claim 6 , wherein the platinum nanoparticles have an average particle size of 2 to 20 nm.

8. The method according to claim 6 , wherein a platinum nanoparticle layer formed by the physical vapor deposition has a thickness of 2 to 50 nm.

9. The method according to claim 6 , wherein the physical vapor deposition is based on magnetron sputtering.

Assignees

• School Corp Kansai Univ
• Nissan Chemical Ind Ltd

Inventors

• Arakawa Ryuichi
• Kawasaki Hideya
• Ozawa Tomoyuki

Classifications

• G01N1/28

  Preparing specimens for investigation {including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q}(mounting specimens on microscopic slides G02B21/34; means for supporting the objects or the materials to be analysed in electron microscopes H01J37/20 {; laboratory gas handling apparatus B01L5/00}) · CPC title

• A01N25/00

  Biocides, pest repellants or attractants, or plant growth regulators, characterised by their forms, or by their non-active ingredients or by their methods of application {, e.g. seed treatment or sequential application}; Substances for reducing the noxious effect of the active ingredients to organisms other than pests · CPC title

• B82Y30/00

  Nanotechnology for materials or surface science, e.g. nanocomposites · CPC title

• G01N1/2853

  Shadowing samples · CPC title

• B82Y40/00

  Manufacture or treatment of nanostructures · CPC title