Systems and methods for processing packaged radio-frequency modules identified as being potentially defective

Patent metadata

Field	Value
Publication number	US-9355444-B2
Application number	US-201314038857-A
Country	US
Kind code	B2
Filing date	Sep 27, 2013
Priority date	Sep 28, 2012
Publication date	May 31, 2016
Grant date	May 31, 2016

Abstract

Systems and methods for processing potentially defective individual packaged modules are presented. A Printed Circuit Board (PCB) that includes a set of individual module substrates can be received and an image of a first side of the PCB can be captured by an image capture module which can include one or more cameras. Based on the captured image, it can be determined whether the set of individual module substrates includes previously identified (e.g., inked) individual module substrates that correspond to potentially defective individual module substrates. In response to determining that the set of individual module substrates includes inked individual module substrates, a map of the inked individual module substrates can be created. Based on the map, locations corresponding to the inked individual module substrates can be marked with a laser on a second side of the PCB.

First claim

What is claimed is:

1. A method of identifying potentially defective individual packaged modules, the method comprising:
receiving a Printed Circuit Board (PCB) including a set of individual module substrates;
capturing an image of a first side of the PCB;
determining, using the image, whether the set of individual module substrates includes inked individual module substrates, the inked individual module substrates including ink markings on the first side of the PCB and the ink markings identifying the inked individual module substrates as potentially defective; and
in response to determining that the set of individual module substrates includes inked individual module substrates, creating a map of the inked individual module substrates and marking, with a laser, locations on a second side of the PCB corresponding to inked individual module substrates, the locations identified via the map, the second side of the PCB substantially parallel to the first side of the PCB.

2. The method of claim 1 wherein said marking with the laser reduces the introduction of impurities during a process of forming an overmold over the PCB.

3. The method of claim 1 further comprising reorienting the PCB so that the second side of the PCB faces a head of the laser.

4. The method of claim 1 further comprising identifying a PCB model of the PCB.

5. The method of claim 4 wherein identifying the PCB model includes accessing a machine-readable code on the PCB.

6. The method of claim 5 wherein the machine-readable code includes information identifying the PCB model of the PCB.

7. The method of claim 4 further comprising loading a PCB recipe associated with the PCB model.

8. The method of claim 7 wherein determining whether the set of individual module substrates includes inked individual module substrates includes comparing the image to the PCB recipe.

9. The method of claim 1 further comprising counting the number of inked individual module substrates in the set of individual module substrates thereby enabling tracking of yield for a PCB model of the PCB.

10. The method of claim 1 wherein determining whether the set of individual module substrates includes inked individual module substrates includes presenting to a user an individual module substrate with an indeterminate marking.

11. The method of claim 10 further comprising receiving confirmation from the user whether the individual module substrate with the indeterminate marking is an inked individual module substrate in response to presenting the individual module substrate with the indeterminate marking to the user.

12. A system for identifying potentially defective individual packaged modules, the system comprising:
a Printed Circuit Board (PCB) loader configured to load a PCB, the PCB including a set of individual module substrates;
an image capture device configured to capture an image of a first side of the PCB;
a processor configured to use the image to identify inked individual module substrates in the set of individual module substrates, the inked individual module substrates corresponding to potentially defective individual module substrates, the inked individual module substrates including ink markings on the first side of the PCB, and the ink markings indicating that the inked individual module substrates as potentially defective;
a mapping system configured to create a map of the inked individual module substrates; and
a laser system configured to mark locations on the PCB corresponding to inked individual module substrates, the locations identified via the map.

13. The system of claim 12 further comprising a machine-readable code scanner configured to identify a PCB model of the PCB by accessing a machine-readable code on the PCB.

14. The system of claim 13 wherein the machine-readable code includes information identifying the PCB model of the PCB.

15. The system of claim 12 further comprising a PCB recipe loader configured to load a PCB recipe from a PCB recipe store, the PCB recipe associated with a PCB model of the PCB.

16. The system of claim 15 wherein the processor is further configured to compare the image to the PCB recipe to identify the inked individual module substrates.

17. The system of claim 12 wherein the processor is further configured to count the number of inked individual module substrates in the set of individual module substrates thereby enabling tracking of yield for a PCB model of the PCB.

18. The system of claim 12 further comprising a singulator configured to singulate the PCB into a set of individual packaged modules.

19. The system of claim 18 wherein the singulator is further configured to separate a potentially defective individual packaged module from the set of individual packaged modules based on whether the potentially defective individual packaged module includes a laser marking.

20. A system for manufacturing packaged modules, the system comprising:
a means for providing a panel having a set of module substrate units;
a means for obtaining an image of a first side of the panel to identify marked units, each marked unit having a first mark identifying the marked unit as a potentially defective substrate unit of the set of module substrate units; and
a means for forming a second mark on a second side of the panel at a location corresponding to each marked unit, the second mark configured to introduce less impurities than the first mark.

Assignees

• Skyworks Solutions Inc

Inventors

• Nava Carlos Fabian
• Almonte Viviano

Classifications

• G06T7/001 Primary

  using an image reference approach · CPC title

• G06T7/0004

  Industrial image inspection · CPC title

• H05K13/00

  Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components · CPC title

• Y10T29/532

  Conductor · CPC title

• G06T2207/10056

  Microscopic image · CPC title