Arrangement for use in a projection exposure tool for microlithography having a reflective optical element

US9354529B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9354529-B2
Application numberUS-201213561502-A
CountryUS
Kind codeB2
Filing dateJul 30, 2012
Priority dateJan 29, 2010
Publication dateMay 31, 2016
Grant dateMay 31, 2016

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Abstract

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An arrangement for use in a projection exposure tool ( 100 ) for microlithography comprises a reflective optical element ( 10; 110 ) and a radiation detector ( 30; 32; 130 ). The reflective optical element ( 10; 110 ) comprises a carrier element ( 12 ) guaranteeing the mechanical strength of the optical element ( 10; 110 ) and a reflective coating ( 18 ) disposed on the carrier element ( 12 ) for reflecting a use radiation ( 20 a ). The carrier element ( 12 ) is made of a material which upon interaction with the use radiation ( 20 a ) emits a secondary radiation ( 24 ) the wavelength of which differs from the wavelength of the use radiation ( 20 a ), and the radiation detector ( 30; 32; 130 ) is configured to detect the secondary radiation ( 24 ).

First claim

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What is claimed is: 1. An arrangement for use in a projection exposure tool for microlithography, the arrangement comprising: a reflective optical element including a carrier for imparting mechanical strength to said optical element; said reflective optical element further including a reflective coating disposed on said carrier for reflecting use radiation having a first wavelength; more than 50% by volume of said carrier comprising a material which, upon interaction with said…

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What does patent US9354529B2 cover?
An arrangement for use in a projection exposure tool ( 100 ) for microlithography comprises a reflective optical element ( 10; 110 ) and a radiation detector ( 30; 32; 130 ). The reflective optical element ( 10; 110 ) comprises a carrier element ( 12 ) guaranteeing the mechanical strength of the optical element ( 10; 110 ) and a reflective coating ( 18 ) disposed on the carrier element ( 12 ) f…
Who is the assignee on this patent?
Ehm Dirk Heinrich, Van Kampen Maarten, Schmidt Stefan-Wolfgang, and 4 more
What technology area does this patent fall under?
Primary CPC classification G03F7/70891. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue May 31 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).