Fixture for test circuit board reliability testing

Patent metadata

Field	Value
Publication number	US-9354138-B2
Application number	US-201313933882-A
Country	US
Kind code	B2
Filing date	Jul 2, 2013
Priority date	Jul 2, 2013
Publication date	May 31, 2016
Grant date	May 31, 2016

Abstract

A fixture for securing at least one test printed circuit board assembly (PCBA) including a PCB having semiconductor devices mounted thereon during vibration or mechanical shock testing. A top plate includes top features including a continuous top outer ring, at least one inner top aperture within the top outer ring, and a plurality of outer top apertures positioned beyond the top outer ring including a top probe access aperture and a threaded aperture. A bottom plate includes bottom features including a bottom continuous outer ring, at least one inner bottom aperture, and plurality of outer bottom apertures including a bottom probe access aperture and table mounting aperture. The threaded apertures accept a fastener that clamps the top plate to the bottom plate for the outer rings to secure a full periphery of the PCB between the top plate and bottom plate.

First claim

The invention claimed is:

1. A fixture for securing a plurality of test printed circuit board assemblies (PCBAs) each PCBA including a printed circuit board (PCB) having semiconductor devices mounted thereon during vibration or mechanical shock testing, comprising:
a top plate including top features including a continuous top outer ring, at least one inner top aperture within said top outer ring, and a plurality of outer top apertures positioned beyond said top outer ring including a top probe access aperture, and a threaded aperture, and
a bottom plate including bottom features including a continuous bottom outer ring, at least one inner bottom aperture, and a plurality of outer bottom apertures including a bottom probe access aperture and table mounting aperture,
wherein said threaded aperture accepts a fastener that clamps said top plate to said bottom plate for said top and said bottom outer rings to secure a full periphery of said PCBAs between said top plate and said bottom plate.

2. The fixture of claim 1 , wherein said top outer ring and inner top aperture match said bottom outer ring and inner bottom aperture in both size and position upon alignment to one another.

3. The fixture of claim 1 , wherein said at least one inner top aperture includes a plurality of inner top apertures.

4. The fixture of claim 3 , wherein said plurality of inner top apertures include two (2) or more top apertures which due to symmetry provide vibration movement theoretically identical to one another.

5. A test system for vibration or mechanical shock testing a plurality of test printed circuit board assemblies (PCBAs) each PCBA including a printed circuit board (PCB) having semiconductor devices mounted thereon, comprising:
an enclosure having a vibration table therein and an inlet for flowing a gas into said enclosure and an outlet for flowing said gas out from said enclosure;
a vibration motor and controller mechanically coupled to said vibration table for vibrating or applying shock to said vibration table;
a fixture securing said plurality of test PCBAs, said fixture comprising:
a top plate including top features including a continuous top outer ring, at least one inner top aperture within said top outer ring, and a plurality of outer top apertures positioned beyond said top outer ring including a top probe access aperture, and a threaded aperture, and
a bottom plate including bottom features including a bottom continuous outer ring, at least one inner bottom aperture, and a plurality of outer bottom apertures including a bottom probe access aperture and table mounting aperture,
wherein said threaded aperture accepts a fastener that clamps said top plate to said bottom plate for said top and said bottom outer rings to secure a full periphery of said plurality of test PCBAs between said top plate and said bottom plate,
and at least one fastener securing said fixture to said vibration table by said table mounting aperture.

6. The test system of claim 5 , wherein said enclosure is a thermally insulated enclosure.

7. The test system of claim 5 , wherein said top outer ring and inner top aperture match said bottom outer ring and inner bottom aperture in both size and position upon alignment to one another.

8. The test system of claim 5 , wherein said at least one inner top aperture includes a plurality of inner top apertures.

9. The test system of claim 8 , wherein said plurality of inner top apertures each include two (2) or more top apertures which due to symmetry provide vibration movement theoretically identical to one another.

10. The test system of claim 5 , further comprising a daisy chain test structure including solder balls formed between ones of said plurality of semiconductor devices and said PCB, and further comprising electrical monitoring equipment connected across said daisy chain test structure.

11. A fixture for securing a plurality of test printed circuit board assemblies (PCBAs) each PCBA including a printed circuit board (PCB) having semiconductor devices mounted thereon during vibration or mechanical shock testing, comprising:
a top plate including top features including a continuous top outer ring, at least one inner top aperture within said top outer ring, and a plurality of outer top apertures positioned beyond said top outer ring including a top probe access aperture, and a threaded aperture, and
a bottom plate including bottom features including a continuous bottom outer ring, at least one inner bottom aperture, and a plurality of outer bottom apertures including a bottom probe access aperture and table mounting aperture,
wherein said threaded aperture accepts a fastener that clamps said top plate to said bottom plate for said top and said bottom outer rings to secure a full periphery of said plurality of test PCBAs between said top plate and said bottom plate,
wherein said at least one inner top aperture includes a plurality of inner top apertures, and
wherein said top outer ring and inner top aperture match said bottom outer ring and inner bottom aperture in both size and position upon alignment to one another.

12. The fixture of claim 11 , wherein said plurality of inner top apertures include two (2) or more top apertures which due to symmetry provide vibration movement theoretically identical to one another.

Assignees

• Texas Instruments Inc

Inventors

• Murphy Anthony B
• Zhang Guangneng
• Murtuza Masood

Classifications

• G01M7/027 Primary

  Specimen mounting arrangements, e.g. table head adapters · CPC title