Synthesis of silicon nanocrystals by laser pyrolysis
US-9205399-B2 · Dec 8, 2015 · US
US9352969B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9352969-B2 |
| Application number | US-201214004018-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 9, 2012 |
| Priority date | Mar 9, 2011 |
| Publication date | May 31, 2016 |
| Grant date | May 31, 2016 |
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A process for manufacturing silicon-based nanoparticles by electrochemical etching of a substrate, wherein the substrate is a metallurgical-grade or upgraded metallurgical-grade silicon, the substrate including an impurity content greater than 0.01%.
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The invention claimed is: 1. A process for manufacturing hydrogen via silicon-based nanopowders, comprising: providing a substrate made of metallurgical-grade silicon or upgraded metallurgical-grade silicon having an impurity content greater than 10 ppm by weight, electrochemically etching said substrates to form silicon-based nanopowders having a hydrogen release energy lower than the hydrogen release energy of a silicon nanopowder obtained from electronic- or solar-grade silicon, and producing hydrogen via the silicon-based nanopowders. 2. The process according to claim 1 , wherein the substrate comprises a boron content greater than or equal to 5 ppm by weight. 3. The process according to claim 1 , wherein the substrate comprises a boron content greater than 50 ppm by weight. 4. The process according to claim 1 , wherein the impurity content comprises an aluminum content, iron content, calcium content, phosphorus content, and boron content. 5. The process according to claim 4 , wherein the aluminum content, iron content, calcium content, phosphorus content, and boron content each range between 1 and 10,000 ppm by weight. 6. The process according to claim 1 , wherein the substrate further comprises copper, titanium, nickel, chromium, and tungsten. 7. The process according to claim 1 , wherein the substrate further comprises structural defects with a density greater than 10 4 defects/cm 2 . 8. The process according to claim 1 , wherein the electrochemical etching is performed by pulsed electric current. 9. The process according to claim 1 , wherein the electrochemical etching is performed by an electric current comprised between 1 mA/cm 2 and 1 A/cm 2 . 10. The process according to claim 9 , wherein the electrochemical etching is performed by an electric current comprised between 1 mA/cm 2 and 500 mA/cm 2 . 11. The process according to claim 10 , wherein the electrochemical etching is performed by an electric current comprised between 1 mA/cm 2 and 250 mA/cm 2 . 12. The process according to claim 1 , further comprising: forming an aluminum layer on a backside of the substrate, annealing the substrate comprising the aluminum layer for doping the substrate. 13. The process according to claim 12 , wherein a thickness of the aluminum layer ranges between 10 nm and 10 μm. 14. The process according to claim 12 , further comprising removing the aluminum layer after annealing the substrate. 15. The process according to claim 1 , further comprising: illuminating a front side of the substrate opposite a backside of the substrate by means of a source of white light generating a luminous radiation for doping the substrate.
Preparation (chemical coating from the vapour phase C23C16/00) · CPC title
of semiconducting materials · CPC title
Manufacture or treatment of nanostructures · CPC title
by reaction of water vapour with metals · CPC title
Nanotechnology for materials or surface science, e.g. nanocomposites · CPC title
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