Method of detecting electrons, an electron-detector and an inspection system

Patent metadata

Field	Value
Publication number	US-9336982-B2
Application number	US-201414498290-A
Country	US
Kind code	B2
Filing date	Sep 26, 2014
Priority date	Sep 26, 2013
Publication date	May 10, 2016
Grant date	May 10, 2016

Abstract

An electron-detector comprises a scintillator plate 207 , electron optics 204 for directing a plurality of electron beams 9 onto the scintillator plate so that the electron beams are incident onto the scintillator plate at locations of incidence disposed at a distance from each other, a light detector 237 comprising a plurality of light receiving areas 235 disposed at a distance from each other, and light optics for generating a first light-optical image of at least a portion of the scintillator plate at a region 243 where the light receiving areas of the light detector are disposed so that, by the imaging, each of the locations of incidence is associated with a light receiving area; and wherein the electron optics comprise an electron beam deflector 255 for displacing the locations of incidence of the electron beams on the scintillator plate in a direction orthogonal to a normal 249 of a surface 208 of the scintillator plate.

First claim

What is claimed is:

1. A method of detecting a plurality of electron beams, the method comprising:
directing a plurality of electron beams onto a scintillator plate using electron optics so that the electron beams are incident onto the scintillator plate at a plurality of locations of incidence disposed at a distance from each other;
imaging the locations of incidence onto a plurality of light receiving areas of a light detector using light optics so that, by the imaging, each of the locations of incidence is associated with one of the light receiving areas;
detecting light incident onto the light receiving areas of the light detector; and
displacing the locations of incidence, where the electron beams are incident onto the scintillator plate, in a direction orthogonal to a normal of a surface of the scintillator plate.

2. The method according to claim 1 , wherein the displacing of the locations of incidence, where the electron beams are incident onto the scintillator plate, comprises moving the scintillator plate relative to components of the electron optics.

3. The method according to claim 1 , wherein the displacing of the locations of incidence, where the electron beams are incident onto the scintillator plate, comprises deflecting the plurality of electron beams by the electron optics.

4. The method according to claim 3 , further comprising:
displacing the light receiving areas of the light detector relative to the light optics so that light emerging from each of the displaced locations of incidence is incident onto the light receiving area associated with the respective location of incidence.

5. The method according to claim 3 , further comprising:
displacing at least one component of the light optics relative to the scintillator plate so that light emerging from each of the displaced locations of incidence is incident onto the light receiving area associated with the respective location of incidence.

6. The method according to claim 5 , wherein the at least one component of the light optics comprise at least one of a mirror disposed in a beam path of the light optics between the scintillator plate and the light receiving areas, and a lens disposed in a beam path of the light optics between the scintillator plate and the light receiving areas.

7. The method according to claim 1 , wherein the directing of the plurality of electron beams onto the scintillator plate comprises focusing the electron beams onto the scintillator plate using the electron optics.

8. The method according to claim 1 , further comprising:
directing a plurality of particle beams onto a plurality of locations on the object;
forming the plurality of electron beams from electrons emerging from the plurality of locations on the object.

9. An electron-detector comprising:
a scintillator plate having a scintillator material;
electron optics configured to direct a plurality of electron beams onto the scintillator plate so that the plurality of electron beams is incident onto the scintillator plate at a plurality of locations of incidence disposed at a distance from each other; a light detector comprising a plurality of light receiving areas disposed at a distance from each other; and
light optics configured to generate, in a region where the light receiving areas of the light detector are disposed, a first light-optical image of at least a portion of the scintillator plate so that, by the imaging, each of the locations of incidence is associated with one of the light receiving areas; and
wherein the electron optics comprise an electron beam deflector configured to displace the locations of incidence of the electron beams on the scintillator plate in a direction orthogonal to a normal of a surface of the scintillator plate.

10. The electron-detector according to claim 9 , further comprising an actuator configured to displace a component of the light optics relative to the scintillator plate.

11. The electron-detector according to claim 10 , wherein the displaceable component of the light optics comprises at least one of a light beam deflector and a lens, the component being displaceable in order to vary a location of the first light-optical image of the scintillator plate in the region of the light receiving areas of the light detector.

12. The electron-detector according to claim 9 , further comprising an actuator configured to displace the light receiving areas relative to the light optics.

13. The electron-detector according to claim 10 , further comprising a controller configured to control the electron beam deflector and the actuator so that light emerging from each of the displaced locations of incidence is incident onto the light receiving area associated with the respective location of incidence.

14. The electron-detector according to claim 13 , wherein the controller is further configured to control the electron beam deflector so that each of the locations of incidence of the electron beams on the scintillator plate is scanned along a predetermined path over the scintillator plate.

15. The electron-detector according to claim 13 , further comprising a light-optical camera wherein the light optics are further configured so that a second light-optical image of the portion of the scintillator plate is detectable by the light-optical camera.

16. The electron-detector according to claim 15 , wherein the controller is further configured to control the actuator in dependence of an image detected by the light-optical camera.

17. The electron-detector according to claim 15 , wherein the light optics further comprise a light-optical beam splitter disposed in a beam path between the scintillator plate and the region where the light receiving areas of the light detector are disposed and in a beam path between the scintillator plate and the light-optical camera.

18. The electron-detector according to claim 9 , wherein the electron beam deflector is configured to displace the location of incidence of each of the electron beams on the scintillator plate by an amount greater than 0.1 times a minimum distance between adjacent locations of incidence of a majority of electron beams on the scintillator plate.

19. An electron-detector comprising:
a scintillator plate having a scintillator material;
electron optics configured to direct a plurality of electron beams onto the scintillator plate so that the plurality of electron beams is incident onto the scintillator plate at a plurality of locations of incidence disposed at a distance from each other; a light detector comprising a plurality of light receiving areas disposed at a distance from each other;
light optics configured to generate, in a region where the light receiving areas of the light detector are disposed, a first light-optical image of at least a portion of the scintillator plate so that, by the imaging, each of the locations of incidence is associated with one of the light receiving areas; and
an actuator configured to displace the scintillator plate relative to the light optics in a direction orthogonal to a normal of a surface of the scintillator plate.

20. The electron-detector according to claim 19 , further comprising a controller configured to control the actuator so that the scintillator plate is moved relative to the light optics during an time of operation of one hour, 10 hours or 24 hours by more than 0.01 mm, more than 0.1 mm or more than 0.2 mm.

21. The electron-detector according to claim 19 , wherein the electron optics are further configured to focus ea

Assignees

• Zeiss Carl Microscopy Gmbh

Inventors

• Zeidler Dirk
• Jacobi Jörg

Classifications

• H01J37/244 Primary

  Detectors; Associated components or circuits therefor · CPC title

• H01J2237/15

  Means for deflecting or directing discharge · CPC title

• H01J2237/24507

  Intensity, dose or other characteristics of particle beams or electromagnetic radiation · CPC title

• H01J37/226

  Optical arrangements for illuminating the object; optical arrangements for collecting light from the object · CPC title

• H01J37/285

  Emission microscopes, e.g. field-emission microscopes · CPC title