Sputtering target and process for producing same
US-9034154-B2 · May 19, 2015 · US
US9334558B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9334558-B2 |
| Application number | US-201113880514-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 18, 2011 |
| Priority date | Oct 22, 2010 |
| Publication date | May 10, 2016 |
| Grant date | May 10, 2016 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A target for the deposition of mixed crystal layers with at least two different metals on a substrate by means of arc vapor deposition (arc PVD), wherein the target includes at least two different metals. To produce mixed crystal layers which are as free as possible of macroparticles (droplets) according to the invention at least the metal with the lowest melting point is present in the target in a ceramic compound, namely as a metal oxide, metal carbide, metal nitride, metal carbonitride, metal oxynitride, metal oxycarbide, metal oxycarbonitride, metal boride, metal boronitride, metal borocarbide, metal borocarbonitride, metal borooxynitride, metal borooxocarbide, metal borooxocarbonitride, metal oxoboronitride, metal silicate or mixture thereof, and at least one metal different from the metal with the lowest melting point is present in the target in elemental (metallic) form.
Opening claim text (preview).
The invention claimed is: 1. A target for the deposition of mixed crystal layers with at least two different metals on a substrate by means of arc vapor deposition (arc PVD), wherein the target includes at least two different metals, wherein at least the metal with the lowest melting point is present in the target in a ceramic compound, and wherein at least one metal different from the metal with the lowest melting point is present in the target in elemental (metallic) form. 2. A target according to claim 1 , wherein the at least two different metals in the target are selected from the group consisting of the elements scandium, yttrium, titanium, zirconium, hafnium, vanadium, niobium, tantalum, chromium, molybdenum, tungsten, manganese, iron, lithium, boron, aluminum, tin and silicon. 3. A target according to claim 2 , wherein the metals in the target are at least aluminum and chromium. 4. A target according to claim 3 , wherein the metals in the target are only aluminum and chromium. 5. A target according to claim 2 , wherein the ceramic compound is a metal oxide, metal carbide, metal nitride, metal carbonitride, metal oxynitride, metal oxycarbide, metal oxycarbonitride, metal boride, metal boronitride, metal borocarbide, metal borocarbonitride, metal borooxynitride, metal borooxocarbide, metal borooxocarbonitride, metal oxoboronitride, metal silicate or mixture thereof. 6. A target according to claim 1 , wherein the metal with the lowest melting point is present in the target as a metal oxide, metal carbide or metal nitride. 7. A target according to claim 1 , wherein the metal with the lowest melting point has a melting point of less than 1500° C. 8. A target according to claim 7 , wherein the metal with the lowest melting point has a melting point of less than 1000° C. 9. A target according to claim 8 , wherein the metal with the lowest melting point has a melting point of less than 700° C. 10. A target according to claim 1 , wherein ceramic compound in which the metal with the lowest melting point is present in the target has a melting point of at least 1200° C. and/or a melting point which is at least 400° C. higher than that of the pure metal with the lowest melting point. 11. A target according to claim 1 , wherein the metal present in the target in a ceramic compound with the lowest melting point is present in the target in an amount of between 2 and 99 atomic %. 12. A target according to claim 11 , wherein the metal present in the target in a ceramic compound with the lowest melting point is present in the target in an amount of between 5 and 90 atomic %. 13. A target according to claim 12 , wherein the metal present in the target in a ceramic compound with the lowest melting point is present in the target in an amount of between 10 and 80 atomic %. 14. A target according to claim 13 , wherein the metal present in the target in a ceramic compound with the lowest melting point is present in the target in an amount of between 30 and 60 atomic %. 15. A target according to claim 1 , wherein the at least one metal different from the metal with the lowest melting point is also present in the target, besides the elemental (metallic) form, in a proportion of up to 10 atomic % with respect to the respective metal, in a ceramic compound. 16. A target according to claim 15 , wherein the at least one metal different from the metal with the lowest melting point is also present in the target, besides the elemental (metallic) form, in a proportion of up to 20 atomic % with respect to the respective metal, in a ceramic compound. 17. A target according to claim 16 , wherein the at least one metal different from the metal with the lowest melting point is also present in the target, besides the elemental (metallic) form, in a proportion of up to 60 atomic % with respect to the respective metal, in a ceramic compound. 18. A target according to claim 17 , wherein the at least one metal different from the metal with the lowest melting point is also present in the target, besides the elemental (metallic) form, in a proportion of up to 70 atomic % with respect to the respective metal, in a ceramic compound. 19. A target according to claim 15 , wherein the ceramic compound is a metal oxide, metal carbide, metal nitride, metal carbonitride, metal oxynitride, metal oxycarbide, metal oxycarbonitride, metal boride, metal boronitride, metal borocarbide, metal borocarbonitride, metal borooxynitride, metal borooxocarbide, metal borooxocarbonitride, metal oxoboronitride, metal silicate or mixture thereof. 20. A target according to claim 1 produced by hot isostatic pressing. 21. A method of depositing mixed crystal layers with at least two different metals on a substrate by means of arc vapor deposition (arc PVD), wherein at least one target according to claim 1 is used. 22. A cutting tool comprising a substrate and a single-layer or multi-layer coating applied thereto, wherein at least one layer of the multi-layer coating is a mixed crystal layer produced with the method according to claim 21 . 23. A target according to claim 1 , wherein the ceramic compound is a metal oxide, metal carbide, metal nitride, metal carbonitride, metal oxynitride, metal oxycarbide, metal oxycarbonitride, metal boride, metal boronitride, metal borocarbide, metal borocarbonitride, metal borooxynitride, metal borooxocarbide, metal borooxocarbonitride, metal oxoboronitride, metal silicate or mixture thereof.
Composites · CPC title
Fine ceramics · CPC title
based on carbides {or oxycarbides (containing free metal binder C22C29/00)} · CPC title
based on borides, nitrides, {i.e. nitrides, oxynitrides, carbonitrides or oxycarbonitrides} or silicides {(containing free binder metal C22C29/00)} · CPC title
Aluminium · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.