Dual capacitor sense amplifier and methods therefor
US-9224466-B1 · Dec 29, 2015 · US
US9330759B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9330759-B2 |
| Application number | US-201514702817-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 4, 2015 |
| Priority date | Jan 5, 2011 |
| Publication date | May 3, 2016 |
| Grant date | May 3, 2016 |
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A signal processing circuit whose power consumption can be suppressed is provided. In a period during which a power supply voltage is not supplied to a storage element, data stored in a first storage circuit corresponding to a nonvolatile memory can be held by a first capacitor provided in a second storage circuit. With the use of a transistor in which a channel is formed in an oxide semiconductor layer, a signal held in the first capacitor is held for a long time. The storage element can accordingly hold the stored content (data) also in a period during which the supply of the power supply voltage is stopped. A signal held by the first capacitor can be converted into the one corresponding to the state (the on state or off state) of the second transistor and read from the second storage circuit. Consequently, an original signal can be accurately read.
Opening claim text (preview).
What is claimed is: 1. A signal processing circuit comprising: a register, the register comprising: a first storage circuit; and a second storage circuit, the second storage circuit comprising: a capacitor comprising a pair of electrodes; a first transistor; and a second transistor, wherein the first storage circuit is a volatile storage circuit, wherein the first transistor comprises a channel formation region comprising an oxide semiconductor material, wherein the second transistor comprises a channel formation region comprising a silicon, wherein one of a source and a drain of the first transistor is electrically connected to one of the pair of electrodes and a gate of the second transistor, wherein the other of the source and the drain of the first transistor is electrically connected to the first storage circuit, and wherein one of a source and a drain of the second transistor is electrically connected to the first storage circuit. 2. A signal processing circuit comprising: a register, the register comprising: a first storage circuit; and a second storage circuit, the second storage circuit comprising: a capacitor comprising a pair of electrodes; a first transistor; a second transistor; and a switch comprising a first terminal and a second terminal, wherein the first storage circuit is a volatile storage circuit, wherein the first transistor comprises a channel formation region comprising an oxide semiconductor material, wherein the second transistor comprises a channel formation region comprising a silicon, wherein one of a source and a drain of the first transistor is electrically connected to one of the pair of electrodes and a gate of the second transistor, wherein the other of the source and the drain of the first transistor is electrically connected to the first storage circuit, wherein one of a source and a drain of the second transistor is electrically connected to the first terminal of the switch, and wherein the second terminal of the switch is electrically connected to the first storage circuit. 3. A signal processing circuit comprising: a register, the register comprising: a first storage circuit; and a second storage circuit, the second storage circuit comprising: a capacitor comprising a pair of electrodes; a first transistor; a second transistor; and a third transistor, wherein the first storage circuit is a volatile storage circuit, wherein the first transistor comprises a channel formation region comprising an oxide semiconductor material, wherein one of a source and a drain of the first transistor is electrically connected to one of the pair of electrodes and a gate of the second transistor, wherein the other of the source and the drain of the first transistor is electrically connected to the first storage circuit, wherein one of a source and a drain of the second transistor is electrically connected to one of a source and a drain of the third transistor, and wherein the other of the source and the drain of the third transistor is electrically connected to the first storage circuit. 4. The signal processing circuit according to claim 1 , wherein the oxide semiconductor material is an In—Ga—Zn-based oxide. 5. The signal processing circuit according to claim 1 , wherein the oxide semiconductor material is an In—Sn—Zn-based oxide. 6. The signal processing circuit according to claim 1 , wherein the first storage circuit is configured to hold data only in a period during which a power supply voltage supplied. 7. The signal processing circuit according to claim 1 , wherein the other of the source and the drain of the first transistor is electrically connected to an output terminal of the first storage circuit. 8. The signal processing circuit according to claim 1 , wherein the one of the source and the drain of the second transistor is electrically connected to an input terminal of the first storage circuit. 9. The signal processing circuit according to claim 2 , wherein the oxide semiconductor material is an In—Ga—Zn-based oxide. 10. The signal processing circuit according to claim 2 , wherein the oxide semiconductor material is an In—Sn—Zn-based oxide. 11. The signal processing circuit according to claim 2 , wherein the first storage circuit is configured to hold data only in a period during which a power supply voltage supplied. 12. The signal processing circuit according to claim 2 , wherein the other of the source and the drain of the first transistor is electrically connected to an output terminal of the first storage circuit. 13. The signal processing circuit according to claim 2 , wherein the second terminal of the switch is electrically connected to an input terminal of the first storage circuit. 14. The signal processing circuit according to claim 3 , wherein the oxide semiconductor material is an In—Ga—Zn-based oxide. 15. The signal processing circuit according to claim 3 , wherein the oxide semiconductor material is an In—Sn—Zn-based oxide. 16. The signal processing circuit according to claim 3 , wherein the first storage circuit is configured to hold data only in a period during which a power supply voltage supplied. 17. The signal processing circuit according to claim 3 , wherein the other of the source and the drain of the first transistor is electrically connected to an output terminal of the first storage circuit. 18. The signal processing circuit according to claim 3 , wherein the other of the source and the drain of the third transistor is electrically connected to an input terminal of the first storage circuit. 19. The signal processing circuit according to claim 1 , wherein the first storage circuit is electrically connected to the gate of the second transistor and the one of the pair of electrodes through the first transistor.
Vias, e.g. via plugs · CPC title
with field-effect transistors, e.g. MOS-FET · CPC title
using capacitors (G11C11/22 takes precedence; using a combination of semiconductor devices and capacitors G11C11/34, e.g. G11C11/40) · CPC title
in which the volatile element is a DRAM cell · CPC title
Power saving in memory, e.g. RAM, cache · CPC title
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