Negative voltage measurement

Patent metadata

Field	Value
Publication number	US-9329208-B2
Application number	US-201314012884-A
Country	US
Kind code	B2
Filing date	Aug 28, 2013
Priority date	Aug 28, 2013
Publication date	May 3, 2016
Grant date	May 3, 2016

Abstract

A method of measuring a negative voltage using a device including a first transistor and a second transistor is provided. The first transistor is coupled to the second transistor and the negative voltage is supplied to a gate of the second transistor. A plurality of voltages are provided to a source input of the device. For each voltage of the plurality of voltages, whether a first voltage across the first transistor is equivalent to a second voltage across the second transistor is determined, and, when the first voltage across the first transistor is equivalent to the second voltage across the second transistor, the negative voltage is determined by measuring a magnitude of a positive voltage of the device.

First claim

What is claimed is:

1. A method of measuring a negative voltage using a device including a first transistor and a second transistor, the first transistor being coupled to the second transistor and the negative voltage being supplied to a gate of the second transistor, the method comprising:
setting a voltage of a source of the first transistor to a first supply voltage;
when the voltage of the source of the first transistor is set to the first supply voltage and a current through the first transistor is equivalent to a current through the second transistor, comparing a first source-drain voltage of the first transistor to a second source-drain voltage of the second transistor; and
when the voltage of the source of the first transistor is set to the first supply voltage and the first source-drain voltage of the first transistor is equivalent to the second source-drain voltage of the second transistor and the current through the first transistor is equivalent to the current through the second transistor, determining a magnitude of the negative voltage by determining a positive voltage of a node of the device.

2. The method of claim 1 , wherein determining the voltage of the node of the device includes measuring a voltage of a drain of the first transistor.

3. The method of claim 1 , wherein determining the voltage of the node of the device includes measuring a voltage of a source of the second transistor.

4. The method of claim 3 , wherein determining the voltage of the node of the device includes subtracting the voltage of the source of the second transistor from the first supply voltage.

5. The method of claim 1 , wherein a gate of the first transistor is coupled to a ground voltage terminal.

6. The method of claim 1 , including, when the voltage of the source of the first transistor is set to the first supply voltage and the first source-drain voltage of the first transistor is not equivalent to the second source-drain voltage of the second transistor:
setting the voltage of the source of the first transistor to a second supply voltage, the second supply voltage being different from the first supply voltage; and
when the voltage of the source of the first transistor is set to the second supply voltage, comparing a first source-drain voltage of the first transistor to a second source-drain voltage of the second transistor.

7. The method of claim 6 , including sweeping the voltage of the source of the first transistor through a range of voltage values.

8. The method of claim 1 , wherein the first source-drain voltage of the first transistor is equivalent to the second source-drain voltage of the second transistor when a difference between the first source-drain voltage of the first transistor and the second source-drain voltage of the second transistor is within a predetermined threshold.

9. A method of measuring a negative voltage using a device including a first transistor and a second transistor, the first transistor being coupled to the second transistor and the negative voltage being supplied to a gate of the second transistor, the method comprising:
providing a plurality of different voltages to an input of the device;
for each voltage of the plurality of different voltages, determining whether a first voltage across the first transistor is equivalent to a second voltage across the second transistor; and
when the first voltage across the first transistor is equivalent to the second voltage across the second transistor, determining a magnitude of the negative voltage by measuring a magnitude of a positive voltage of the device.

10. The method of claim 9 , wherein a gate of the first transistor is coupled to a ground voltage terminal.

11. The method of claim 9 , wherein the input is connected to a source of the first transistor.

12. A device, comprising:
a resistance;
a first transistor, the first transistor including:
a gate connected to a ground voltage terminal,
a source configured to connect to a variable voltage source, and
a drain connected to a first terminal of the resistance;

a second transistor, the second transistor including:
a gate configured to connect to a negative voltage,
a source connected to a second terminal of the resistance, and
a drain connected to the ground voltage terminal; and

wherein, when the ground voltage terminal is connected to a ground voltage and a first source-drain voltage of the first transistor is equivalent to a second source-drain voltage of the second transistor, a magnitude of a voltage of the drain of the first transistor is equivalent to a magnitude of the negative voltage.

13. The device of claim 12 , wherein the resistance includes a resistor.

14. The device of claim 13 , wherein a resistance of the resistor is 100 kilo ohms.

15. The device of claim 12 , wherein the resistance includes a third transistor, wherein a gate of the third transistor is configured to connect to a constant voltage.

16. The device of claim 12 , wherein the first transistor and the second transistor are p-type metal oxide semiconductor (PMOS) field effect transistors (FETs).

17. The device of claim 12 , including a differential amplifier, the differential amplifier including:
a first input connected to the source of the first transistor; and
a second input connected to the drain of the first transistor.

18. The device of claim 17 , including a comparator, the comparator including:
a first input connected to an output of the differential amplifier; and
a second input connected to the source of the second transistor.

19. The device of claim 12 , wherein the negative voltage is between −9 volts and −7 volts.

20. The device of claim 12 , including:
a fourth transistor, a source of the fourth transistor being connected to the source of the second transistor and a gate of the fourth transistor set to a second negative voltage; and
an input configured to enable selective measurement of either the negative voltage of the second negative voltage.

Assignees

• Pigott John
• Freescale Semiconductor Inc

Inventors

• Pigott John

Classifications

• G01R19/0092

  Measuring current only · CPC title

• G01R19/0084 Primary

  Measuring voltage only · CPC title

• G01R19/0023

  Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers (electrostatic instruments G01R5/28; measuring electrostatic potential G01R15/165; measuring electrostatic fields G01R29/12; amplifiers per se H03F) · CPC title