Large field of view grating interferometers for X-ray phase contrast imaging and CT at high energy

Patent metadata

Field	Value
Publication number	US-9329141-B2
Application number	US-201414176655-A
Country	US
Kind code	B2
Filing date	Feb 10, 2014
Priority date	Feb 12, 2013
Publication date	May 3, 2016
Grant date	May 3, 2016

Abstract

A device and method of the present disclosure provides large field-of-view Talbot-Lau phase contrast CT systems up to very high X-ray energy. The device includes microperiodic gratings tilted at glancing incidence and tiled on a single substrate to provide the large field-of-view phase contrast CT system. The present disclosure is a simple, economical, and accurate method for combining multiple GAIs into a larger FOV system, capable of performing phase-contrast tomography (PC-CT) on large objects. The device and method can be applied to medical X-ray imaging, industrial non-destructive testing, and security screening.

First claim

What is claimed is:

1. An interferometer device operable to condition incident X-rays in a high energy X-ray system comprising:
a substrate;
multiple tiled micro-periodic gratings arranged in a fan shape on the substrate, wherein the gratings comprise absorbing bars and the absorbing bars are tilted at a glancing angle along the direction of the incident X-rays, and wherein the absorbing bars are aligned parallel with the incident X-rays, over a width equal or less than their beam collimation or vignetting width.

2. The interferometer device of claim 1 , wherein the device is configured for use with a large field-of-view (FOV) interferometric system.

3. The interferometer device of claim 1 , wherein the substrate comprises a single substrate.

4. The interferometer of claim 1 , wherein the gratings are tiled in a fan shape in the horizontal direction and stacked in a vertical direction to make a large horizontal and vertical field-of-view (FOV) differential phase-contrast tomography (DPC-CT) system.

5. The interferometer of claim 1 , wherein the absorbing bars of the gratings are inclined at an angle of approximately 5° to approximately 30° along a propagation direction of the incident X-rays, and fanned on their substrate over an angle between approximately 5° and 15°, to make a large FOV X-ray interferometer for 50-150 kVp energy.

Assignees

• Univ Johns Hopkins

Inventors

• Stutman Dan
• Finkenthal Michael

Classifications

• G01N23/046 Primary

  using tomography, e.g. computed tomography [CT] · CPC title

• A61B6/484

  involving phase contrast X-ray imaging · CPC title

• G01N23/20075

  by measuring interferences of X-rays, e.g. Borrmann effect · CPC title

• G01N23/207

  Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions · CPC title

• G01N2223/419

  computed tomograph · CPC title